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Results: 1-8 |
Results: 8
COMPARING PEAK ASYMMETRIES IN EXAFS USING RMC AND CUMULANT EXPANSION DATA-ANALYSIS
Authors: VANDORSSEN GE WILLIAMS BT GURMAN SJ BRIDGES F
Citation: Ge. Vandorssen et al., COMPARING PEAK ASYMMETRIES IN EXAFS USING RMC AND CUMULANT EXPANSION DATA-ANALYSIS, Journal de physique. IV, 7(C2), 1997, pp. 241-242
GRAZING-INCIDENCE REFLECTIVITY AND TOTAL ELECTRON YIELD EFFECTS IN SOFT-X-RAY ABSORPTION-SPECTROSCOPY
Authors: ALDERS D HIBMA T SAWATZKY GA CHEUNG KC VANDORSSEN GE ROPER MD PADMORE HA VANDERLAAN G VOGEL J SACCHI M
Citation: D. Alders et al., GRAZING-INCIDENCE REFLECTIVITY AND TOTAL ELECTRON YIELD EFFECTS IN SOFT-X-RAY ABSORPTION-SPECTROSCOPY, Journal of applied physics, 82(6), 1997, pp. 3120-3124
EXAFS MEASUREMENTS ON THE STRUCTURE OF MO SI MULTILAYERS PRODUCED USING ION-BOMBARDMENT AND INCREASED DEPOSITION TEMPERATURE/
Authors: VOORMA HJ VANDORSSEN GE LOUIS E KOSTER NB SMITH AD ROPER MD BIJKERK F
Citation: Hj. Voorma et al., EXAFS MEASUREMENTS ON THE STRUCTURE OF MO SI MULTILAYERS PRODUCED USING ION-BOMBARDMENT AND INCREASED DEPOSITION TEMPERATURE/, Applied surface science, 93(3), 1996, pp. 221-230
SILICON-OXIDE STRUCTURES MEASURED AT THE SURFACES OF SILICON AND SILICATE GLASS - A REFLECTIVITY STUDY
Authors: VANDORSSEN GE DERST G GREAVES GN SMITH AD ROPER M
Citation: Ge. Vandorssen et al., SILICON-OXIDE STRUCTURES MEASURED AT THE SURFACES OF SILICON AND SILICATE GLASS - A REFLECTIVITY STUDY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 97(1-4), 1995, pp. 426-429
CORE EXCITONS IN SILICON AND SILICON-OXIDES
Authors: VANDORSSEN GE ROPER MD PADMORE HA SMITH AD GREAVES GN
Citation: Ge. Vandorssen et al., CORE EXCITONS IN SILICON AND SILICON-OXIDES, Review of scientific instruments, 66(2), 1995, pp. 1480-1482
SYNTHESIS AND MEASUREMENT OF NORMAL INCIDENCE X-RAY MULTILAYER MIRRORS OPTIMIZED FOR A PHOTON ENERGY OF 390 EV
Authors: KOZHEVNIKOV IV FEDORENKO AI KONDRATENKO VV PERSHIN YP YULIN SA ZUBAREV EN PADMORE HA CHEUNG KC VANDORSSEN GE ROPER M BALAKIREVA LL SEROV RV VINOGRADOV AV
Citation: Iv. Kozhevnikov et al., SYNTHESIS AND MEASUREMENT OF NORMAL INCIDENCE X-RAY MULTILAYER MIRRORS OPTIMIZED FOR A PHOTON ENERGY OF 390 EV, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 345(3), 1994, pp. 594-603
ENHANCEMENT OF REFLECTIVITY OF MULTILAYER MIRRORS FOR SOFT-X-RAY PROJECTION LITHOGRAPHY BY TEMPERATURE OPTIMIZATION AND ION-BOMBARDMENT
Authors: LOUIS E VOORMA HJ KOSTER NB SHMAENOK L BIJKERK F SCHLATMANN R VERHOEVEN J PLATONOV YY VANDORSSEN GE PADMORE HA
Citation: E. Louis et al., ENHANCEMENT OF REFLECTIVITY OF MULTILAYER MIRRORS FOR SOFT-X-RAY PROJECTION LITHOGRAPHY BY TEMPERATURE OPTIMIZATION AND ION-BOMBARDMENT, Microelectronic engineering, 23(1-4), 1994, pp. 215-218
ABSOLUTE BRIGHTNESS OF LASER PLASMAS IN THE SOFT-X-RAY EMISSION BAND
Authors: BIJKERK F LOUIS E VANDORSSEN GE SHEVELKO AP VASILYEV AA
Citation: F. Bijkerk et al., ABSOLUTE BRIGHTNESS OF LASER PLASMAS IN THE SOFT-X-RAY EMISSION BAND, Applied optics, 33(1), 1994, pp. 82-88
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