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Authors: VANKAN JA VIS RD

Citation: Ja. Vankan et Rd. Vis, AN OPTIMIZED SET-UP FOR TOTAL-REFLECTION PARTICLE-INDUCED X-RAY-EMISSION, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 847-853

Authors: VANKAN JA VIS RD

Citation: Ja. Vankan et Rd. Vis, GLANCING INCIDENT MEV ION-BEAMS FOR TOTAL-REFLECTION PIXE (TPIXE) ANDRBS SURFACE-ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 373-377

Authors: VANKAN JA VIS RD

Citation: Ja. Vankan et Rd. Vis, TOTAL-REFLECTION PIXE (TPIXE) AND RBS FOR SURFACE AND TRACE-ELEMENT ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 85-93

Authors: VANKAN JA VIS RD

Citation: Ja. Vankan et Rd. Vis, TOTAL-REFLECTION PIXE (TPIXE) AND RBS FOR SURFACE-ANALYSIS, X-ray spectrometry, 24(2), 1995, pp. 58-62

Authors: VANKAN JA RECTOR JH DAM B VIS RD

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