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Results: 1-25 | 26-50 | 51-75 | 76-83
Results: 26-50/83
GROWTH OF CR ON AG(001) STUDIED BY SCANNING-TUNNELING-MICROSCOPY
Authors: QUINN AJ LAWLER JF SCHAD R VANKEMPEN H
Citation: Aj. Quinn et al., GROWTH OF CR ON AG(001) STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 385(2-3), 1997, pp. 395-401
LOW-TEMPERATURE PROPERTIES OF INCOMMENSURATE FERROELECTRICS (PBYSN1-Y)(2)P2SE6
Authors: MAIOR MM WIEGERS SAJ RASING T EIJT SWH PENNING FC VYSOCHANSKII YM MOTRJA SF VANKEMPEN H
Citation: Mm. Maior et al., LOW-TEMPERATURE PROPERTIES OF INCOMMENSURATE FERROELECTRICS (PBYSN1-Y)(2)P2SE6, Ferroelectrics, 202(1-4), 1997, pp. 139-148
REPRODUCIBILITY OF LOW-TEMPERATURE CAPACITANCE THERMOMETERS BASED ON (PB0.45SN0.55)(2)P2SE6 SINGLE-CRYSTAL
Authors: WIEGERS SAJ MAIOR MM PENNING FC MOLNAR SB VANKEMPEN H VYSOCHANSKII YM MAAN JC
Citation: Saj. Wiegers et al., REPRODUCIBILITY OF LOW-TEMPERATURE CAPACITANCE THERMOMETERS BASED ON (PB0.45SN0.55)(2)P2SE6 SINGLE-CRYSTAL, Ferroelectrics, 192(1-4), 1997, pp. 349-352
NEW OPTOELECTRONIC TIP DESIGN FOR ULTRAFAST SCANNING-TUNNELING-MICROSCOPY
Authors: GROENEVELD RHM RASING T KAUFMANN LMF SMALBRUGGE E WOLTER JH MELLOCH MR VANKEMPEN H
Citation: Rhm. Groeneveld et al., NEW OPTOELECTRONIC TIP DESIGN FOR ULTRAFAST SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 861-863
SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY ON THIN FE3O4 (110) FILMS ON MGO
Authors: JANSEN R VANKEMPEN H WOLF RM
Citation: R. Jansen et al., SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY ON THIN FE3O4 (110) FILMS ON MGO, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1173-1175
SCANNING TUNNELING MICROSCOPE FOR MAGNETOOPTICAL IMAGING
Authors: PRINS MWJ GROENEVELD RHM ABRAHAM DL SCHAD R VANKEMPEN H VANKESTEREN HW
Citation: Mwj. Prins et al., SCANNING TUNNELING MICROSCOPE FOR MAGNETOOPTICAL IMAGING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1206-1209
SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY STUDY OF NANOMETER-SIZED METAL-CLUSTERS
Authors: DUBOIS JGA GERRITSEN JW SCHMID G VANKEMPEN H
Citation: Jga. Dubois et al., SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY STUDY OF NANOMETER-SIZED METAL-CLUSTERS, Physica. B, Condensed matter, 218(1-4), 1996, pp. 262-264
ELECTRODE GEOMETRY INFLUENCING THE TUNNEL RESISTANCE IN A MECHANICALLY CONTROLLABLE BREAK JUNCTION
Authors: KEIJSERS RJP VOETS J SHKLYAREVSKII OI VANKEMPEN H
Citation: Rjp. Keijsers et al., ELECTRODE GEOMETRY INFLUENCING THE TUNNEL RESISTANCE IN A MECHANICALLY CONTROLLABLE BREAK JUNCTION, Physica. B, Condensed matter, 218(1-4), 1996, pp. 283-286
THE INFLUENCE OF ADSORBED HELIUM ON TUNNELING IN MECHANICALLY CONTROLLABLE BREAK JUNCTIONS
Authors: SHKLYAREVSKII OI KEIJSERS RJP VOETS J VANKEMPEN H
Citation: Oi. Shklyarevskii et al., THE INFLUENCE OF ADSORBED HELIUM ON TUNNELING IN MECHANICALLY CONTROLLABLE BREAK JUNCTIONS, Physica. B, Condensed matter, 218(1-4), 1996, pp. 287-289
LARGE CORRUGATIONS AND STRONG ADHESION FORCES OBSERVED WITH A MECHANICALLY CONTROLLABLE BREAK JUNCTION
Authors: VOETS J KEIJSERS RJP SHKLYAREVSKII OI VANKEMPEN H
Citation: J. Voets et al., LARGE CORRUGATIONS AND STRONG ADHESION FORCES OBSERVED WITH A MECHANICALLY CONTROLLABLE BREAK JUNCTION, Physica. B, Condensed matter, 218(1-4), 1996, pp. 290-293
DETECTION OF PICOSECOND ELECTRICAL TRANSIENTS IN A SCANNING TUNNELINGMICROSCOPE
Authors: GROENEVELD RHM RASING T KAUFMANN LMF SMALBRUGGE E WOLTER JH MELLOCH MR VANKEMPEN H
Citation: Rhm. Groeneveld et al., DETECTION OF PICOSECOND ELECTRICAL TRANSIENTS IN A SCANNING TUNNELINGMICROSCOPE, Physica. B, Condensed matter, 218(1-4), 1996, pp. 294-296
COULOMB STAIRCASES AND QUANTUM-SIZE EFFECTS IN TUNNELING SPECTROSCOPYON LIGAND-STABILIZED METAL-CLUSTERS
Authors: GERRITSEN JW SHAFRANJUK SE BOON EJG SCHMID G VANKEMPEN H
Citation: Jw. Gerritsen et al., COULOMB STAIRCASES AND QUANTUM-SIZE EFFECTS IN TUNNELING SPECTROSCOPYON LIGAND-STABILIZED METAL-CLUSTERS, Europhysics letters, 33(4), 1996, pp. 279-284
EFFECTS OF ELECTRODE INTERACTIONS OBSERVED IN A MECHANICALLY CONTROLLABLE BREAK JUNCTION
Authors: VOETS J KEIJSERS RJP SHKLYAREVSKII OI VANKEMPEN H
Citation: J. Voets et al., EFFECTS OF ELECTRODE INTERACTIONS OBSERVED IN A MECHANICALLY CONTROLLABLE BREAK JUNCTION, Physical review. B, Condensed matter, 53(3), 1996, pp. 1072-1075
SEMICONDUCTOR BAND SWITCHING BY CHARGING A SMALL-GRAIN WITH A SINGLE-ELECTRON
Authors: WILDOER JWG VANROIJ AJA HARMANS CJPM VANKEMPEN H
Citation: Jwg. Wildoer et al., SEMICONDUCTOR BAND SWITCHING BY CHARGING A SMALL-GRAIN WITH A SINGLE-ELECTRON, Physical review. B, Condensed matter, 53(16), 1996, pp. 10695-10698
GROWTH OF CR ON CU(001) STUDIED BY SCANNING-TUNNELING-MICROSCOPY
Authors: LAWLER JF VANDERKRAAN RGP VANKEMPEN H QUINN AJ
Citation: Jf. Lawler et al., GROWTH OF CR ON CU(001) STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Physical review. B, Condensed matter, 53(16), 1996, pp. 11159-11163
PHOTOELECTRICAL PROPERTIES OF SEMICONDUCTOR TIPS IN SCANNING-TUNNELING-MICROSCOPY
Authors: PRINS MWJ JANSEN R GROENEVELD RHM VANGELDER AP VANKEMPEN H
Citation: Mwj. Prins et al., PHOTOELECTRICAL PROPERTIES OF SEMICONDUCTOR TIPS IN SCANNING-TUNNELING-MICROSCOPY, Physical review. B, Condensed matter, 53(12), 1996, pp. 8090-8104
SPIN-POLARIZED TUNNELING WITH GAAS TIPS IN SCANNING-TUNNELING-MICROSCOPY
Authors: PRINS MWJ JANSEN R VANKEMPEN H
Citation: Mwj. Prins et al., SPIN-POLARIZED TUNNELING WITH GAAS TIPS IN SCANNING-TUNNELING-MICROSCOPY, Physical review. B, Condensed matter, 53(12), 1996, pp. 8105-8113
THIN-FILM MECHANICALLY CONTROLLABLE BREAK JUNCTIONS
Authors: KEIJSERS RJP SHKLYAREVSKII OI HERMSEN JGH VANKEMPEN H
Citation: Rjp. Keijsers et al., THIN-FILM MECHANICALLY CONTROLLABLE BREAK JUNCTIONS, Review of scientific instruments, 67(8), 1996, pp. 2863-2866
A SENSITIVE CAPACITANCE THERMOMETER AT LOW-TEMPERATURE FOR USE IN MAGNETIC-FIELDS UP TO 20 T
Authors: PENNING FC MAIOR MM WIEGERS SAJ VANKEMPEN H MAAN JC
Citation: Fc. Penning et al., A SENSITIVE CAPACITANCE THERMOMETER AT LOW-TEMPERATURE FOR USE IN MAGNETIC-FIELDS UP TO 20 T, Review of scientific instruments, 67(7), 1996, pp. 2602-2605
POINT-CONTACT STUDY OF FAST AND SLOW 2-LEVEL FLUCTUATORS IN METALLIC GLASSES
Authors: KEIJSERS RJP SHKLYAREVSKII OI VANKEMPEN H
Citation: Rjp. Keijsers et al., POINT-CONTACT STUDY OF FAST AND SLOW 2-LEVEL FLUCTUATORS IN METALLIC GLASSES, Physical review letters, 77(16), 1996, pp. 3411-3414
DIRECT OBSERVATION OF FRIEDEL OSCILLATIONS AROUND INCORPORATED SIE, DOPANTS IN GAAS BY LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY
Authors: VANDERWIELEN MCMM VANROIJ AJA VANKEMPEN H
Citation: Mcmm. Vanderwielen et al., DIRECT OBSERVATION OF FRIEDEL OSCILLATIONS AROUND INCORPORATED SIE, DOPANTS IN GAAS BY LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY, Physical review letters, 76(7), 1996, pp. 1075-1078
EFFECT OF ADSORBED HELIUM ON ELECTRON-TUNNELING BETWEEN METAL-ELECTRODES
Authors: KEIJSERS RJP VOETS J SHKLYAREVSKII OI VANKEMPEN H
Citation: Rjp. Keijsers et al., EFFECT OF ADSORBED HELIUM ON ELECTRON-TUNNELING BETWEEN METAL-ELECTRODES, Physical review letters, 76(7), 1996, pp. 1138-1141
ELECTRON SOUND IN AL
Authors: FIL VD BEZUGLYI EV BURMA NG GAIDUK AL KOLOBOV IG VANKEMPEN H DEYNEKA EY
Citation: Vd. Fil et al., ELECTRON SOUND IN AL, Czechoslovak journal of Physics, 46, 1996, pp. 2547-2548
THE CAPACITIVE ORIGIN OF THE PICOSECOND ELECTRICAL TRANSIENTS DETECTED BY A PHOTOCONDUCTIVELY GATED SCANNING TUNNELING MICROSCOPE
Authors: GROENEVELD RHM VANKEMPEN H
Citation: Rhm. Groeneveld et H. Vankempen, THE CAPACITIVE ORIGIN OF THE PICOSECOND ELECTRICAL TRANSIENTS DETECTED BY A PHOTOCONDUCTIVELY GATED SCANNING TUNNELING MICROSCOPE, Applied physics letters, 69(15), 1996, pp. 2294-2296
SPIN-DEPENDENT TRANSPORT IN METAL-SEMICONDUCTOR TUNNEL-JUNCTIONS
Authors: PRINS MWJ VANKEMPEN H VANLEUKEN H DEGROOT RA VANROY W DEBOECK J
Citation: Mwj. Prins et al., SPIN-DEPENDENT TRANSPORT IN METAL-SEMICONDUCTOR TUNNEL-JUNCTIONS, Journal of physics. Condensed matter, 7(49), 1995, pp. 9447-9464
Risultati: 1-25 | 26-50 | 51-75 | 76-83