Citation: D. Sueva et al., INVESTIGATION OF THE N(-P-PI-P(+) STRUCTURE OF SILICON AVALANCHE-DIODES BY CHARGED-PARTICLES()), Applied physics A: Materials science & processing, 66(5), 1998, pp. 549-554
Authors:
VAPIREV EI
DIMITROV VI
JORDANOV TJ
CHRISTOSKOV ID
Citation: Ei. Vapirev et al., CONVERSION OF HIGH ENRICHED URANIUM IN THORIUM-232-BASED OXIDE FUEL FOR LIGHT AND HEAVY-WATER REACTORS - MOX-T FUEL, Nuclear Engineering and Design, 167(2), 1996, pp. 105-112
Authors:
VAPIREV EI
SUEVA D
SPASSOV V
CHIKOV N
IVANOV I
Citation: Ei. Vapirev et al., DETECTION OF BETA-PARTICLES, CONVERSION ELECTRONS AND GAMMA-RAYS WITHSILICON PLANAR DETECTORS, Applied radiation and isotopes, 45(4), 1994, pp. 453-459
Authors:
VAPIREV EI
TSACHEVA T
BOURIN KI
HRISTOVA AV
KAMENOVA T
GOUREV V
Citation: Ei. Vapirev et al., NUCLEAR SPECTROSCOPY AND ELECTRON-MICROPROBE STUDY OF A BA HOT PARTICLE ORIGINATING FROM THE CHERNOBYL ACCIDENT, Radiation protection dosimetry, 55(2), 1994, pp. 143-147
Citation: Ei. Vapirev et Av. Hristova, RAPID CORRELATION ASSESSMENT OF SR IN FALLOUT BY GAMMA-SPECTROSCOPY, Journal of environmental radioactivity, 20(1), 1993, pp. 23-34
Authors:
VAPIREV EI
GROZEV PA
BOTSOVA LI
HRISTOVA AV
Citation: Ei. Vapirev et al., BETA-SPECTROSCOPIC SEPARATION OF SR-90, Y-90 AND SR-89 WITH A SCINTILLATION DETECTOR, Journal of radioanalytical and nuclear chemistry, 173(2), 1993, pp. 293-302
Authors:
BONCHEV T
VAPIREV EI
HELAL F
JORDANOV V
SEMOVA T
Citation: T. Bonchev et al., A RAPID METHOD FOR INVESTIGATION OF SURFACE ALPHA-CONTAMINATION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 337(1), 1993, pp. 204-210
Citation: Ei. Vapirev et Pa. Grozev, ASSESSMENTS OF THE RISK FOR THE BULGARIAN POPULATION DUE TO STANDARD UO2 HOT PARTICLES RELEASED DURING THE CHERNOBYL ACCIDENT, Radiation protection dosimetry, 46(4), 1993, pp. 273-279
Authors:
SUEVA D
SPASSOV V
CHIKOV N
VAPIREV EI
IVANOV I
Citation: D. Sueva et al., SILICON DETECTORS FOR CHARGED-PARTICLES MANUFACTURED BY CONVENTIONAL PLANAR TECHNOLOGY, IEEE transactions on nuclear science, 40(3), 1993, pp. 257-261