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Results:
1-10
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Results: 10
Authors:
TANIMOTO M
VATEL O
Citation: M. Tanimoto et O. Vatel, KELVIN PROBE FORCE MICROSCOPY FOR CHARACTERIZATION OF SEMICONDUCTOR-DEVICES AND PROCESSES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1547-1551
Authors:
VATEL O
TANIMOTO M
Citation: O. Vatel et M. Tanimoto, KELVIN PROBE FORCE MICROSCOPY FOR POTENTIAL DISTRIBUTION MEASUREMENT OF SEMICONDUCTOR-DEVICES, Journal of applied physics, 77(6), 1995, pp. 2358-2362
Authors:
CHAVEZPIRSON A
VATEL O
TANIMOTO M
ANDO H
IWAMURA H
KANBE H
Citation: A. Chavezpirson et al., NANOMETER-SCALE IMAGING OF POTENTIAL PROFILES IN OPTICALLY-EXCITED N-I-P-I HETEROSTRUCTURE USING KELVIN PROBE FORCE MICROSCOPY, Applied physics letters, 67(21), 1995, pp. 3069-3071
Authors:
VATEL O
ANDRE E
CHOLLET F
DUMAS P
SALVAN F
Citation: O. Vatel et al., ATOMIC-FORCE MICROSCOPY STUDIES OF POLYSILICON GROWTH DURING DEPOSITION ON SILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2037-2039
Authors:
BENDER H
VERHAVERBEKE S
CAYMAX M
VATEL O
HEYNS MM
Citation: H. Bender et al., SURFACE RECONSTRUCTION OF HYDROGEN ANNEALED (100) SILICON, Journal of applied physics, 75(2), 1994, pp. 1207-1209
Authors:
PETRI R
BRAULT P
VATEL O
HENRY D
ANDRE E
DUMAS P
SALVAN F
Citation: R. Petri et al., SILICON ROUGHNESS INDUCED BY PLASMA-ETCHING, Journal of applied physics, 75(11), 1994, pp. 7498-7506
Authors:
MOISON JM
HOUZAY F
BARTHE F
LEPRINCE L
ANDRE E
VATEL O
Citation: Jm. Moison et al., SELF-ORGANIZED GROWTH OF REGULAR NANOMETER-SCALE INAS DOTS ON GAAS, Applied physics letters, 64(2), 1994, pp. 196-198
Authors:
VATEL O
DUMAS P
CHOLLET F
SALVAN F
ANDRE E
Citation: O. Vatel et al., ROUGHNESS ASSESSMENT OF POLYSILICON USING POWER SPECTRAL DENSITY, JPN J A P 1, 32(12A), 1993, pp. 5671-5674
Authors:
VATEL O
VERHAVERBEKE S
BENDER H
CAYMAX M
CHOLLET F
VERMEIRE B
MERTENS P
ANDRE E
HEYNS M
Citation: O. Vatel et al., ATOMIC-FORCE MICROSCOPY AND INFRARED-SPECTROSCOPY STUDIES OF HYDROGENBAKED SI SURFACES, JPN J A P 2, 32(10B), 1993, pp. 120001489-120001491
Authors:
DUMAS P
BOUFFAKHREDDINE B
AMRA C
VATEL O
ANDRE E
GALINDO R
SALVAN F
Citation: P. Dumas et al., QUANTITATIVE MICROROUGHNESS ANALYSIS DOWN TO THE NANOMETER-SCALE, Europhysics letters, 22(9), 1993, pp. 717-722
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1-10
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