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Results: 1-13 |

Results: 13

ELECTRON-CAPTURE AND LOSS PROCESSES ON OXIDES AND OXIDIZED SURFACES

Authors: USTAZE S GUILLEMOT L VERUCCHI R LACOMBE S ESAULOV VA

Citation: S. Ustaze et al., ELECTRON-CAPTURE AND LOSS PROCESSES ON OXIDES AND OXIDIZED SURFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 135(1-4), 1998, pp. 319-323

ELECTRON-CAPTURE ON SURFACES WITH ELECTRONEGATIVE ADSORBATES AND SURFACE POISONING

Authors: USTAZE S GUILLEMOT L VERUCCHI R ESAULOV VA

Citation: S. Ustaze et al., ELECTRON-CAPTURE ON SURFACES WITH ELECTRONEGATIVE ADSORBATES AND SURFACE POISONING, Surface science, 397(1-3), 1998, pp. 361-373

LOCAL-EFFECTS IN ELECTRON-CAPTURE PROCESSES OF FLUORINE-ATOMS INTERACTING WITH AN OXIDIZED MG SURFACE

Authors: USTAZE S VERUCCHI R GUILLEMOT L ESAULOV VA OCHS D KEMPTER V

Citation: S. Ustaze et al., LOCAL-EFFECTS IN ELECTRON-CAPTURE PROCESSES OF FLUORINE-ATOMS INTERACTING WITH AN OXIDIZED MG SURFACE, Europhysics letters, 40(3), 1997, pp. 329-335

P-LVV AND LMM AUGER EMISSION INDUCED BY AR+ IMPACT ON THE INP(110) SURFACE

Authors: VALERI S LIBERI M VERUCCHI R

Citation: S. Valeri et al., P-LVV AND LMM AUGER EMISSION INDUCED BY AR+ IMPACT ON THE INP(110) SURFACE, Physical review. B, Condensed matter, 56(23), 1997, pp. 15272-15276

OXIDATION OF MG AND ELECTRON-TRANSFER PROCESSES

Authors: ESAULOV VA GRIZZI O GUILLEMOT L MAAZOUZ M USTAZE S VERUCCHI R

Citation: Va. Esaulov et al., OXIDATION OF MG AND ELECTRON-TRANSFER PROCESSES, Surface science, 380(2-3), 1997, pp. 521-526

ELECTRON-CAPTURE AND LOSS PROCESSES IN THE INTERACTION OF HYDROGEN, OXYGEN, AND FLUORINE-ATOMS AND NEGATIVE-IONS WITH A MGO(100) SURFACE

Authors: USTAZE S VERUCCHI R LACOMBE S GUILLEMOT L ESAULOV VA

Citation: S. Ustaze et al., ELECTRON-CAPTURE AND LOSS PROCESSES IN THE INTERACTION OF HYDROGEN, OXYGEN, AND FLUORINE-ATOMS AND NEGATIVE-IONS WITH A MGO(100) SURFACE, Physical review letters, 79(18), 1997, pp. 3526-3529

AUGER EMISSION BY IMPACT OF ENERGETIC ATOMS ON SI MONOLAYER(S)

Authors: VALERI S BARALDI S VERUCCHI R

Citation: S. Valeri et al., AUGER EMISSION BY IMPACT OF ENERGETIC ATOMS ON SI MONOLAYER(S), Surface science, 365(2), 1996, pp. 517-524

PARTICLE-INDUCED AUGER EMISSION FROM SI MONOLAYERS

Authors: VERUCCHI R BARALDI S VALERI S

Citation: R. Verucchi et al., PARTICLE-INDUCED AUGER EMISSION FROM SI MONOLAYERS, Surface science, 352, 1996, pp. 719-723

EX-SITU XPS-INVESTIGATION OF THE INTERFACE BETWEEN PE-CVD SIO2 AND WET CHEMICALLY ETCHED MO-CVD EPITAXIAL LAYERS OF IN0.53GA0.47AS

Authors: PROCOP M WANDEL K VERUCCHI R

Citation: M. Procop et al., EX-SITU XPS-INVESTIGATION OF THE INTERFACE BETWEEN PE-CVD SIO2 AND WET CHEMICALLY ETCHED MO-CVD EPITAXIAL LAYERS OF IN0.53GA0.47AS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 647-654

SUBSTRATE AMORPHIZATION INDUCED BY THE SPUTTER-DEPOSITION PROCESS - GEOMETRICAL ASPECTS

Authors: VALERI S ALTIERI S DIDOMENICO T VERUCCHI R

Citation: S. Valeri et al., SUBSTRATE AMORPHIZATION INDUCED BY THE SPUTTER-DEPOSITION PROCESS - GEOMETRICAL ASPECTS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(2), 1995, pp. 394-399

SURFACE SENSITIVITY OF ION-INDUCED AUGER-ELECTRON EMISSION (IAE) SPECTROSCOPY

Authors: VERUCCHI R ALTIERI S VALERI S

Citation: R. Verucchi et al., SURFACE SENSITIVITY OF ION-INDUCED AUGER-ELECTRON EMISSION (IAE) SPECTROSCOPY, Surface science, 333, 1995, pp. 1256-1261

EFFECT OF THE INCIDENCE GEOMETRY ON THE ION-INDUCED NI-SILICIDES SURFACE COMPOSITIONAL MODIFICATIONS

Authors: VERUCCHI R SCORZONI C VALERI S

Citation: R. Verucchi et al., EFFECT OF THE INCIDENCE GEOMETRY ON THE ION-INDUCED NI-SILICIDES SURFACE COMPOSITIONAL MODIFICATIONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 877-880

ION-BOMBARDMENT INFLUENCE ON THE CR AUGER AUTOIONIZATION STRUCTURE

Authors: VERUCCHI R VALERI S

Citation: R. Verucchi et S. Valeri, ION-BOMBARDMENT INFLUENCE ON THE CR AUGER AUTOIONIZATION STRUCTURE, Solid state communications, 86(11), 1993, pp. 695-698

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