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Citation: Ja. Vankan et Rd. Vis, AN OPTIMIZED SET-UP FOR TOTAL-REFLECTION PARTICLE-INDUCED X-RAY-EMISSION, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 847-853
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DAMMAN AH
KARS SM
TOURET JLR
RIEFFE EC
KRAMER JALM
VIS RD
PINTEA I
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OLIVIER C
VANLANGEVELDE F
VANNIEKERK HL
VIS RD
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VIS RD
KRAMER JLAM
TROS GHJ
VANLANGEVELDE F
MARS L
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Citation: Rd. Vis, A COMPARISON BETWEEN THE USE OF MEV ION-BEAMS AND SYNCHROTRON RADIATION FOR ELEMENT ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 75(1-4), 1993, pp. 547-552