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Results:
1-7
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Results: 7
Damp Heat test on LiNbO optical modulators
Authors:
Furcas, P De Palo, R Patella, ME Salmini, G Vanzi, M
Citation:
P. Furcas et al., Damp Heat test on LiNbO optical modulators, MICROEL REL, 41(9-10), 2001, pp. 1603-1607
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs
Authors:
Meneghesso, G Podda, S Vanzi, M
Citation:
G. Meneghesso et al., Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs, MICROEL REL, 41(9-10), 2001, pp. 1609-1614
Special section: Advanced failure analysis - Editorial
Authors:
Barton, DL Nakajima, S Vanzi, M
Citation:
Dl. Barton et al., Special section: Advanced failure analysis - Editorial, MICROEL REL, 41(8), 2001, pp. 1143-1144
Electron microscopy of life-tested semiconductor laser diodes
Authors:
Vanzi, M Bonfiglio, A Magistrali, F Salmini, G
Citation:
M. Vanzi et al., Electron microscopy of life-tested semiconductor laser diodes, MICRON, 31(3), 2000, pp. 259-267
New FIB/TEM evidence for a REDR mechanism in sudden failures of 980 nm SL SQW InGaAs/AlGaAs pump laser diodes
Authors:
Vanzi, M Salmini, G De Palo, R
Citation:
M. Vanzi et al., New FIB/TEM evidence for a REDR mechanism in sudden failures of 980 nm SL SQW InGaAs/AlGaAs pump laser diodes, MICROEL REL, 40(8-10), 2000, pp. 1753-1757
Gold removal in failure analysis of GaAs-based laser diodes
Authors:
Vanzi, M Bonfiglio, A Salaris, P Deplano, P Trogu, EF Serpe, A Salmini, G De Palo, R
Citation:
M. Vanzi et al., Gold removal in failure analysis of GaAs-based laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1043-1047
A simpler method for life-testing laser diodes
Authors:
Vanzi, M Martines, G Bonfiglio, A Licheri, M D'Arco, R Salmini, G De Palo, R
Citation:
M. Vanzi et al., A simpler method for life-testing laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1067-1071
Risultati:
1-7
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