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Results:
1-7
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Results: 7
Authors:
Furcas, P
De Palo, R
Patella, ME
Salmini, G
Vanzi, M
Citation: P. Furcas et al., Damp Heat test on LiNbO optical modulators, MICROEL REL, 41(9-10), 2001, pp. 1603-1607
Authors:
Meneghesso, G
Podda, S
Vanzi, M
Citation: G. Meneghesso et al., Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs, MICROEL REL, 41(9-10), 2001, pp. 1609-1614
Authors:
Barton, DL
Nakajima, S
Vanzi, M
Citation: Dl. Barton et al., Special section: Advanced failure analysis - Editorial, MICROEL REL, 41(8), 2001, pp. 1143-1144
Authors:
Vanzi, M
Bonfiglio, A
Magistrali, F
Salmini, G
Citation: M. Vanzi et al., Electron microscopy of life-tested semiconductor laser diodes, MICRON, 31(3), 2000, pp. 259-267
Authors:
Vanzi, M
Salmini, G
De Palo, R
Citation: M. Vanzi et al., New FIB/TEM evidence for a REDR mechanism in sudden failures of 980 nm SL SQW InGaAs/AlGaAs pump laser diodes, MICROEL REL, 40(8-10), 2000, pp. 1753-1757
Authors:
Vanzi, M
Bonfiglio, A
Salaris, P
Deplano, P
Trogu, EF
Serpe, A
Salmini, G
De Palo, R
Citation: M. Vanzi et al., Gold removal in failure analysis of GaAs-based laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1043-1047
Authors:
Vanzi, M
Martines, G
Bonfiglio, A
Licheri, M
D'Arco, R
Salmini, G
De Palo, R
Citation: M. Vanzi et al., A simpler method for life-testing laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1067-1071
Risultati:
1-7
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