Authors:
Verardi, P
Dinescu, M
Craciun, F
Dinu, R
Vrejoiu, I
Citation: P. Verardi et al., Influence of PZT template layer on pulsed laser deposited Pb(Mg1/3Nb2/3)O-3 thin films, APPL SURF S, 168(1-4), 2000, pp. 340-344
Authors:
Jones, L
Ahmad, S
Chan, K
Verardi, P
Morton, WR
Grant, R
Yilma, T
Citation: L. Jones et al., Enhanced safety and efficacy of live attenuated SIV vaccines by prevaccination with recombinant vaccines, J MED PRIM, 29(3-4), 2000, pp. 231-239
Authors:
Verardi, P
Dinescu, M
Craciun, F
Dinu, R
Ciobanu, MF
Citation: P. Verardi et al., Growth of oriented Pb(ZrxTi1-x)O-3 thin films on glass substrates by pulsed laser deposition, APPL PHYS A, 69, 1999, pp. S837-S839
Authors:
Craciun, F
Verardi, P
Dinescu, M
Galassi, C
Costa, A
Citation: F. Craciun et al., Growth of piezoelectric thin films with fine grain microstructure by high energy pulsed laser deposition, SENS ACTU-A, 74(1-3), 1999, pp. 35-40
Authors:
Verardi, P
Dinescu, M
Craciun, F
Dinu, R
Sandu, V
Tapfer, L
Cappello, A
Citation: P. Verardi et al., Pulsed laser deposition of multilayer TiN/Pb(ZrxTi1-x)O-3 for piezoelectric microdevices, SENS ACTU-A, 74(1-3), 1999, pp. 41-44
Authors:
Verardi, P
Craciun, F
Mirenghi, L
Dinescu, M
Sandu, V
Citation: P. Verardi et al., An XPS and XRD study of physical and chemical homogeneity of Pb(Zr,Ti)O-3 thin films obtained by pulsed laser deposition, APPL SURF S, 139, 1999, pp. 552-556
Authors:
Verardi, P
Nastase, N
Gherasim, C
Ghica, C
Dinescu, M
Dinu, R
Flueraru, C
Citation: P. Verardi et al., Scanning force microscopy and electron microscopy studies of pulsed laser deposited ZnO thin films: application to the bulk acoustic waves (BAW) devices, J CRYST GR, 197(3), 1999, pp. 523-528
Citation: P. Verardi et al., Characterization of microstructural and piezoelectric properties of oriented PZT thin films obtained by pulsed laser deposition, J PHYS IV, 8(P9), 1998, pp. 121-124
Authors:
Craciun, F
Verardi, P
Dinescu, M
Dinelli, F
Kolosov, O
Citation: F. Craciun et al., Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy, THIN SOL FI, 336(1-2), 1998, pp. 281-285