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Results: 1-25/40
Authors:
Miyashita, S
Vincent, E
Citation: S. Miyashita et E. Vincent, A microscopic mechanism for rejuvenation and memory effects in spin glasses, EUR PHY J B, 22(2), 2001, pp. 203-211
Authors:
Bravaix, A
Goguenheim, D
Revil, N
Vincent, E
Citation: A. Bravaix et al., Hot-carrier reliability study of second and first impact ionization degradation in 0.15-mu m channel-length N-MOSFETS, MICROEL ENG, 59(1-4), 2001, pp. 101-108
Authors:
Dupuis, V
Vincent, E
Bouchaud, JP
Hammann, J
Ito, A
Katori, HA
Citation: V. Dupuis et al., Aging, rejuvenation, and memory effects in Ising and Heisenberg spin glasses - art. no. 174204, PHYS REV B, 6417(17), 2001, pp. 4204
Authors:
Monsieur, F
Vincent, E
Roy, D
Bruyere, S
Pananakakis, G
Ghibaudo, G
Citation: F. Monsieur et al., Determination of dielectric breakdown Weibull distribution parameters confidence bounds for accurate ultrathin oxide reliability predictions, MICROEL REL, 41(9-10), 2001, pp. 1295-1300
Authors:
Bravaix, A
Goguenheim, D
Revil, N
Vincent, E
Citation: A. Bravaix et al., Injection mechanisms and lifetime prediction with the substrate voltage in0.15 mu m channel-length N-MOSFETs, MICROEL REL, 41(9-10), 2001, pp. 1313-1318
Authors:
Bruyere, S
Monsieur, F
Roy, D
Vincent, E
Ghibaudo, G
Citation: S. Bruyere et al., Failures in ultrathin oxides: Stored energy or carrier energy driven?, MICROEL REL, 41(9-10), 2001, pp. 1367-1372
Authors:
Bruyere, S
Roy, D
Robilliart, E
Vincent, E
Ghibaudo, G
Citation: S. Bruyere et al., Body effect induced wear-out acceleration in ultra-thin oxides, MICROEL REL, 41(7), 2001, pp. 1031-1034
Authors:
Monsieur, F
Vincent, E
Pananakakis, G
Ghibaudo, G
Citation: F. Monsieur et al., Wear-out, breakdown occurrence and failure detection in 18-25 angstrom ultrathin oxides, MICROEL REL, 41(7), 2001, pp. 1035-1039
Authors:
Jonason, K
Nordblad, P
Vincent, E
Hammann, J
Bouchard, JP
Citation: K. Jonason et al., Memory interference effects in spin glasses, EUR PHY J B, 13(1), 2000, pp. 99-105
Authors:
Ghibaudo, G
Clerc, R
Vincent, E
Bruyere, S
Autran, JL
Citation: G. Ghibaudo et al., Gate dielectrics for ultimate CMOS technologies - Limitations and alternative solutions, CR AC S IV, 1(7), 2000, pp. 911-927
Authors:
Dubreucq, B
Berger, N
Vincent, E
Boisson, M
Pelletier, G
Caboche, M
Lepiniec, L
Citation: B. Dubreucq et al., The Arabidopsis AtEPR1 extensin-like gene is specifically expressed in endosperm during seed germination, PLANT J, 23(5), 2000, pp. 643-652
Authors:
Vincent, E
Alet, F
Alba, M
Hammann, J
Ocio, M
Bouchaud, JP
Citation: E. Vincent et al., Aging phenomena in spin glasses and frustrated ferromagnets, PHYSICA B, 280(1-4), 2000, pp. 260-261
Improved method for the oxide thickness extraction in MOS structures with ultrathin gate dielectrics
Authors:
Ghibaudo, G
Bruyere, S
Devoivre, T
DeSalvo, B
Vincent, E
Citation: G. Ghibaudo et al., Improved method for the oxide thickness extraction in MOS structures with ultrathin gate dielectrics, IEEE SEMIC, 13(2), 2000, pp. 152-158
Authors:
Shackleton, NJ
Hall, MA
Vincent, E
Citation: Nj. Shackleton et al., Phase relationships between millennial-scale events 64,000-24,000 years ago, PALEOCEANOG, 15(6), 2000, pp. 565-569
Authors:
Sappey, R
Vincent, E
Ocio, M
Hammann, J
Citation: R. Sappey et al., Disentangling distribution effects and nature of the dynamics in relaxation measurements: the RMR method, J MAGN MAGN, 221(1-2), 2000, pp. 87-98
Authors:
Vincent, E
Dupuis, V
Alba, M
Hammann, J
Bouchaud, JP
Citation: E. Vincent et al., Aging phenomena in spin-glass and ferromagnetic phases: Domain growth and wall dynamics, EUROPH LETT, 50(5), 2000, pp. 674-680
Authors:
Wills, AS
Dupuis, V
Vincent, E
Hammann, J
Calemczuk, R
Citation: As. Wills et al., Aging in a topological spin glass, PHYS REV B, 62(14), 2000, pp. R9264-R9267
Authors:
Hammann, J
Vincent, E
Dupuis, V
Alba, M
Ocio, M
Bouchaud, JP
Citation: J. Hammann et al., Comparative review of aging properties in spin glasses and other disordered materials, J PHYS JPN, 69, 2000, pp. 206-211
Authors:
Joh, YG
Orbach, R
Wood, GG
Hammann, J
Vincent, E
Citation: Yg. Joh et al., Finite size effects on spin glass dynamics, J PHYS JPN, 69, 2000, pp. 215-222
Authors:
Bruyere, S
Guyader, F
De Coster, W
Vincent, E
Saadeddine, M
Revil, N
Ghibaudo, G
Citation: S. Bruyere et al., Wet or dry ultrathin oxides: impact on gate oxide and device reliability, MICROEL REL, 40(4-5), 2000, pp. 691-695
Authors:
Feltin, N
Levy, L
Ingert, D
Vincent, E
Pileni, MP
Citation: N. Feltin et al., Unusual static and dynamic magnetic properties of Cd1-yMnyS nanocrystals, J APPL PHYS, 87(3), 2000, pp. 1415-1423
Authors:
Bonville, P
Vincent, E
Bauer, E
Citation: P. Bonville et al., Low temperature Kondo reduction of quadrupolar and magnetic moments in theYbCu5-xAlx series, EUR PHY J B, 8(3), 1999, pp. 363-369
Authors:
Cayre, O
Lancelot, Y
Vincent, E
Citation: O. Cayre et al., Paleoceanographic reconstructions from planktonic foraminifera off the Iberian Margin: Temperature, salinity, and Heinrich events, PALEOCEANOG, 14(3), 1999, pp. 384-396
Authors:
Galoo, E
Potier, V
Romand, F
Claudel, N
Vincent, E
Desbaumes, J
Citation: E. Galoo et al., Primary chronic ulcerative ileo-jejunitis associated with a hemophagocyticsyndrome, GASTRO CL B, 23(6-7), 1999, pp. 783-787
Authors:
Romand, F
Vincent, E
Potier, V
Claudel, N
Galoo, E
Desbaumes, J
Citation: F. Romand et al., Angina-like chest pain and exertional esophageal pH monitoring., GASTRO CL B, 23(3), 1999, pp. 313-318