Authors: Parchinskii, PB Vlasov, SI Nasirov, AA

Citation: Pb. Parchinskii et al., Slowly relaxing charge in lead borosilicate glass passive coatings studiedby isothermal capacitance relaxation, TECH PHYS L, 27(9), 2001, pp. 786-788

Authors: Parchinskii, PB Vlasov, SI Muminov, RA Ismailov, KK Turgunov, UT

Citation: Pb. Parchinskii et al., The effect of ultrasound on the parameters of metal-dielectric-semiconductor structures, TECH PHYS L, 26(5), 2000, pp. 420-422

Authors: Vlasov, SI Nazyrov, DE Iminov, AA Khudaiberdiev, SS

Citation: Si. Vlasov et al., Effect of heat treatment on the properties of erbium-doped silicon, TECH PHYS L, 26(4), 2000, pp. 328-329

Authors: Vlasov, SI Parchinskii, PB Olmatov, BA

Citation: Si. Vlasov et al., Electronic density of states at the interface between silicon and lead borosilicate glass, INORG MATER, 36(5), 2000, pp. 502-503

Authors: Vlasov, SI Parchinskii, PB Nasirov, AA Olmatov, BA

Citation: Si. Vlasov et al., On the nature of the mobile charge in passivating coatings based on lead-borosilicate glasses, TECH PHYS, 44(8), 1999, pp. 998-999