Authors: ZHOU YQ WONG MWT MIN YH

Citation: Yq. Zhou et al., ON CONCURRENT MULTIPLE ERROR DIAGNOSABILITY IN LINEAR ANALOG CIRCUITSUSING CONTINUOUS CHECKSUM, International journal of circuit theory and applications, 26(1), 1998, pp. 53-64

Authors: WONG MWT ZHOU YQ LEE YS

Citation: Mwt. Wong et al., FAULT COVERAGE IMPROVEMENT OF LINEAR ANALOG CIRCUITS BASED ON ERROR SIGNAL ANALYSIS, International journal of electronics, 84(2), 1998, pp. 137-146

Authors: PANG JCW WONG MWT LEE YS

Citation: Jcw. Pang et al., AN EFFICIENT TEST-GENERATION FOR MULTIPLE-FAULT COVERAGE OF 2-RAIL CHECKERS, International journal of electronics, 83(6), 1997, pp. 837-848

Authors: ZHOU YQ WONG MWT MIN YH

Citation: Yq. Zhou et al., HARDWARE REDUCTION IN CONTINUOUS CHECKSUM-BASED ANALOG CHECKERS - ALGORITHM AND ITS ANALYSIS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 153-163