AAAAAA
Results: 26-50/59
Authors:
SCHUBERT M
RHEINLANDER B
CRAMER C
SCHMIEDEL H
WOOLLAM JA
HERZINGER CM
JOHS B
Citation: M. Schubert et al., GENERALIZED TRANSMISSION ELLIPSOMETRY FOR TWISTED BIAXIAL DIELECTRIC MEDIA - APPLICATION TO CHIRAL LIQUID-CRYSTALS, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(9), 1996, pp. 1930-1940
Authors:
SCHUBERT M
RHEINLANDER B
WOOLLAM JA
JOHS B
HERZINGER CM
Citation: M. Schubert et al., EXTENSION OF ROTATING-ANALYZER ELLIPSOMETRY TO GENERALIZED ELLIPSOMETRY - DETERMINATION OF THE DIELECTRIC FUNCTION TENSOR FROM UNIAXIAL TIO2, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(4), 1996, pp. 875-883
Authors:
SYNOWICKI RA
HALE JS
MCGAHAN WA
IANNO NJ
WOOLLAM JA
Citation: Ra. Synowicki et al., OXYGEN PLASMA ASHER CONTAMINATION - AN ANALYSIS OF SOURCES AND REMEDIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(6), 1996, pp. 3075-3081
Authors:
HILFIKER JN
GLENN DW
HECKENS S
WOOLLAM JA
WIERMAN KW
Citation: Jn. Hilfiker et al., IN-SITU AND EX-SITU OPTICAL CHARACTERIZATION OF ELECTRO DEPOSITED MAGNETOOPTIC MATERIALS, Journal of applied physics, 79(8), 1996, pp. 6193-6195
Authors:
HERZINGER CM
SNYDER PG
CELLI FG
KAO YC
CHOW D
JOHS B
WOOLLAM JA
Citation: Cm. Herzinger et al., STUDIES OF THIN STRAINED INAS, ALAS, AND ALSB LAYERS BY SPECTROSCOPICELLIPSOMETRY, Journal of applied physics, 79(5), 1996, pp. 2663-2674
Authors:
SNYDER PG
IANNO NJ
WIGERT B
PITTAL S
JOHS B
WOOLLAM JA
Citation: Pg. Snyder et al., SPECTROSCOPIC ELLIPSOMETRIC MONITORING OF ELECTRON-CYCLOTRON-RESONANCE PLASMA-ETCHING OF GAAS AND ALGAAS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2255-2259
Authors:
HECKENS S
WOOLLAM JA
Citation: S. Heckens et Ja. Woollam, IN-SITU ELLIPSOMETRY ON SPUTTERED DIELECTRIC AND MAGNETOOPTIC THIN-FILMS, Thin solid films, 270(1-2), 1995, pp. 65-68
Authors:
HILFIKER JN
THOMPSON DW
HALE JS
WOOLLAM JA
Citation: Jn. Hilfiker et al., IN-SITU ELLIPSOMETRIC CHARACTERIZATION OF THE ELECTRODEPOSITION OF METAL-FILMS, Thin solid films, 270(1-2), 1995, pp. 73-77
Authors:
ZOLLNER S
HERZINGER CM
WOOLLAM JA
IYER SS
POWELL AP
EBERL K
Citation: S. Zollner et al., PIEZO-OPTICAL RESPONSE OF SI1-YCY ALLOYS GROWN PSEUDOMORPHICALLY ON SI(001), Solid state communications, 96(5), 1995, pp. 305-308
Authors:
SPADY BR
SYNOWICKI RA
HALE JS
DEVRIES MJ
WOOLLAM JA
MOORE AW
LAKE M
Citation: Br. Spady et al., LOW-EARTH-ORBIT EXPOSURE OF CARBON-BASED MATERIALS ABOARD SHUTTLE FLIGHT STS-46, Journal of spacecraft and rockets, 32(6), 1995, pp. 1015-1017
Authors:
SYNOWICKI RA
HALE JS
SPADY B
REISER M
NAFIS S
WOOLLAM JA
Citation: Ra. Synowicki et al., THIN-FILM MATERIALS EXPOSURE TO LOW-EARTH-ORBIT ABOARD SPACE-SHUTTLE, Journal of spacecraft and rockets, 32(1), 1995, pp. 97-102
Authors:
HERZINGER CM
YAO H
SNYDER PG
CELII FG
KAO YC
JOHS B
WOOLLAM JA
Citation: Cm. Herzinger et al., DETERMINATION OF ALAS OPTICAL-CONSTANTS BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY AND A MULTISAMPLE ANALYSIS, Journal of applied physics, 77(9), 1995, pp. 4677-4687
Authors:
SCHUBERT M
GOTTSCHALCH V
HERZINGER CM
YAO H
SNYDER PG
WOOLLAM JA
Citation: M. Schubert et al., OPTICAL-CONSTANTS OF GAXIN1-XP LATTICE-MATCHED TO GAAS, Journal of applied physics, 77(7), 1995, pp. 3416-3419
Authors:
HERZINGER CM
SNYDER PG
JOHS B
WOOLLAM JA
Citation: Cm. Herzinger et al., INP OPTICAL-CONSTANTS BETWEEN 0.75 AND 5.0 EV DETERMINED BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY, Journal of applied physics, 77(4), 1995, pp. 1715-1724
Authors:
ZHANG YB
WOOLLAM JA
Citation: Yb. Zhang et Ja. Woollam, ANNEALING EFFECTS OF CO NI MULTILAYERS, IEEE transactions on magnetics, 31(6), 1995, pp. 3262-3264
Authors:
JOHS BD
MCGAHAN WA
WOOLLAM JA
Citation: Bd. Johs et al., OPTICAL ANALYSIS OF COMPLEX MULTILAYER STRUCTURES USING MULTIPLE DATA-TYPES, Thin solid films, 253(1-2), 1994, pp. 25-27
Authors:
MCGAHAN WA
MAKOVICKA T
HALE J
WOOLLAM JA
Citation: Wa. Mcgahan et al., MODIFIED FOROUHI AND BLOOMER DISPERSION MODEL FOR THE OPTICAL-CONSTANTS OF AMORPHOUS HYDROGENATED CARBON THIN-FILMS, Thin solid films, 253(1-2), 1994, pp. 57-61
Authors:
WOOLLAM JA
MCGAHAN WA
JOHS B
Citation: Ja. Woollam et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF INDIUM TIN OXIDE AND OTHER FLAT-PANEL DISPLAY MULTILAYER MATERIALS, Thin solid films, 241(1-2), 1994, pp. 44-46
Authors:
WOOLLAM JA
SYNOWICKI RA
HALE JS
IANNO NJ
SPADY BL
MOORE AW
HAMBOURGER P
Citation: Ja. Woollam et al., DEGRADATION OF THIN-FILMS - COMPARISON BETWEEN LOW-EARTH-ORBIT EXPERIMENTS AND LABORATORY SIMULATIONS OF THE SPACE ENVIRONMENT, Thin solid films, 241(1-2), 1994, pp. 218-221
Authors:
JEONG SY
SHAN ZS
HE P
SHEN JX
ZHANG YB
WOOLLAM JA
SELLMYER DJ
Citation: Sy. Jeong et al., SPUTTERING PRESSURE EFFECTS AND TEMPERATURE-DEPENDENT MAGNETISM OF COPD MULTILAYERS/, Journal of applied physics, 76(10), 1994, pp. 6084-6086
Authors:
ZHANG YB
HE P
WOOLLAM JA
SHEN JX
KIRBY RD
SELLMYER DJ
Citation: Yb. Zhang et al., MAGNETIC AND MAGNETOOPTIC PROPERTIES OF SPUTTERED CO NI MULTILAYERS/, Journal of applied physics, 75(10), 1994, pp. 6495-6497
Authors:
SHEN JX
WIERMAN KW
ZHANG YB
KIRBY RD
WOOLLAM JA
SELLMYER DJ
Citation: Jx. Shen et al., MAGNETOOPTICAL AND STRUCTURAL-PROPERTIES OF BIALDYIG FE MULTILAYERS/, Journal of applied physics, 75(10), 1994, pp. 6670-6672
Authors:
HILFIKER JN
ZHANG YB
WOOLLAM JA
Citation: Jn. Hilfiker et al., OPTICAL PROPERTY INFLUENCE ON MAGNETOOPTICS OF CONI AND TBCO MULTILAYERS ON NOBLE-METAL ALLOY SUBSTRATES, IEEE transactions on magnetics, 30(6), 1994, pp. 4437-4439
Authors:
ZHANG YB
WOOLLAM JA
SHAN ZS
SHEN JX
SELLMYER DJ
Citation: Yb. Zhang et al., ANISOTROPY AND MAGNETOOPTICAL PROPERTIES OF SPUTTERED CO NI MULTILAYER THIN-FILMS/, IEEE transactions on magnetics, 30(6), 1994, pp. 4440-4442
LOW-EARTH-ORBIT EFFECTS ON INDIUM TIN OXIDE AND POLYESTER AND COMPARISON WITH LABORATORY SIMULATIONS
Authors:
SYNOWICKI RA
HALE JS
IANNO NJ
WOOLLAM JA
HAMBOURGER PD
Citation: Ra. Synowicki et al., LOW-EARTH-ORBIT EFFECTS ON INDIUM TIN OXIDE AND POLYESTER AND COMPARISON WITH LABORATORY SIMULATIONS, Surface & coatings technology, 62(1-3), 1993, pp. 499-503