Authors:
Chen, YD
Liu, XQ
Lu, W
Shi, GL
Shen, XC
Zhao, QX
Willander, M
Citation: Yd. Chen et al., Study of the inter-band transition of the GaAs single-crystal film on SrTiO3 substrate by MBE, ACT PHY C E, 48(9), 1999, pp. 1718-1722
Citation: Y. Fu et M. Willander, Suppression of the tunneling effect by shallow junctions in field-effect transistor, SUPERLATT M, 26(5), 1999, pp. 289-297
Authors:
Li, N
Li, N
Lu, W
Liu, XQ
Yuan, XZ
Li, ZF
Dou, HF
Shen, SC
Fu, Y
Willander, M
Fu, L
Tan, HH
Jagadish, C
Johnston, MB
Gal, M
Citation: N. Li et al., Proton implantation and rapid thermal annealing effects on GaAs/AlGaAs quantum well infrared photodetectors, SUPERLATT M, 26(5), 1999, pp. 317-324
Authors:
Shubina, TV
Mamutin, VV
Vekshin, VA
Ratnikov, VV
Toropov, AA
Sitnikova, AA
Ivanov, SV
Karlsteen, M
Sodervall, U
Willander, M
Pozina, G
Bergman, JP
Monemar, B
Citation: Tv. Shubina et al., Optical properties of an AlInN interface layer spontaneously formed in hexagonal InN/sapphire heterostructures, PHYS ST S-B, 216(1), 1999, pp. 205-209
Authors:
Pozina, G
Bergman, JP
Monemar, B
Mamutin, VV
Shubina, TV
Vekshin, VA
Toropov, AA
Ivanov, SV
Karlsteen, M
Willander, M
Citation: G. Pozina et al., Optical and structural characterization of Ga(In)N three-dimensional nanostructures grown by plasma-assisted molecular beam epitaxy, PHYS ST S-B, 216(1), 1999, pp. 445-450
Authors:
Zhao, QX
Nawaz, M
Karlsteen, M
Sodervall, U
Willander, M
Stenarson, J
Zirath, H
Strupinski, W
Citation: Qx. Zhao et al., Optical and electrical characterization of MOCVD-grown modulation-doped field effect transistors, SEMIC SCI T, 14(8), 1999, pp. 736-739
Authors:
Mamor, M
Auret, FD
Willander, M
Goodman, SA
Myburg, G
Meyer, F
Citation: M. Mamor et al., Electronic properties of defects introduced in strained, epitaxial p-type SiGe alloys during sputter etching in an argon plasma, SEMIC SCI T, 14(7), 1999, pp. 611-614
Citation: Yv. Mamontov et al., Modelling of high-dimensional diffusion stochastic process with nonlinear coefficients for engineering applications - part I: Approximations for expectation and variance of nonstationary process, MATH MOD M, 9(8), 1999, pp. 1201-1246
Citation: Yv. Mamontov et M. Willander, Modelling of high-dimensional diffusion stochastic process with nonlinear coefficients for engineering applications - part II: Approximations for covariance and spectral density of stationary process, MATH MOD M, 9(8), 1999, pp. 1247-1277
Authors:
Toropov, AA
Shubina, TV
Sorokin, SV
Lebedev, AV
Kyutt, RN
Ivanov, SV
Karlsteen, M
Willander, M
Pozina, GR
Bergman, JP
Monemar, B
Citation: Aa. Toropov et al., Broadening of the excitonic mobility edge in a macroscopically disordered CdSe/ZnSe short-period superlattice, PHYS REV B, 59(4), 1999, pp. R2510-R2513
Citation: Y. Fu et al., Conduction modelling of a conductive adhesive with bimodal distribution ofconducting element, INT J ADHES, 19(4), 1999, pp. 281-286
Authors:
Mamutin, VV
Vekshin, VA
Davydov, VY
Ratnikov, VV
Shubina, TV
Ivanov, SV
Kopev, PS
Karlsteen, M
Soderwall, U
Willander, M
Citation: Vv. Mamutin et al., MBE growth of hexagonal InN films on sapphire with different initial growth stages, PHYS ST S-A, 176(1), 1999, pp. 247-252
Authors:
Mamor, M
Nur, O
Karlsteen, M
Willander, M
Auret, FD
Citation: M. Mamor et al., Fermi-level pinning and Schottky barrier heights on epitaxially grown fully strained and partially relaxed n-type Si1-xGex layers, J APPL PHYS, 86(12), 1999, pp. 6890-6894
Citation: Qx. Zhao et M. Willander, Theoretical investigation of shallow acceptors confined in Si/Si1-xGex quantum well structures, J APPL PHYS, 86(10), 1999, pp. 5624-5629
Authors:
Ouacha, H
Willander, M
Wahab, Q
Ouacha, A
Holmen, G
Citation: H. Ouacha et al., Noise in 6H-SiC ion implanted p-n diodes: Effect of the active area on thenoise properties of these junctions, J APPL PHYS, 85(9), 1999, pp. 6557-6562
Citation: Qx. Zhao et M. Willander, Stress dependence of infrared absorption frequencies and oscillator strengths of acceptors confined in GaAs/AlGaAs quantum wells, J APPL PHYS, 85(7), 1999, pp. 3922-3924