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Results: 1-12 |
Results: 12
Testing micro devices with fringe projection and white-light interferometry
Authors: Windecker, R Fleischer, M Korner, K Tiziani, HJ
Citation: R. Windecker et al., Testing micro devices with fringe projection and white-light interferometry, OPT LASER E, 36(2), 2001, pp. 141-154
One-grating projection for absolute three-dimensional profiling
Authors: Korner, K Windecker, R Fleischer, M Tiziani, HJ
Citation: K. Korner et al., One-grating projection for absolute three-dimensional profiling, OPT ENG, 40(8), 2001, pp. 1653-1660
High resolution optical sensor for the inspection of engine cylinder walls
Authors: Windecker, R
Citation: R. Windecker, High resolution optical sensor for the inspection of engine cylinder walls, OPTIK, 112(9), 2001, pp. 407-412
Absolute macroscopic 3-D measurements with the innovative depth-scanning fringe projection technique (DSFP)
Authors: Korner, K Windecker, R
Citation: K. Korner et R. Windecker, Absolute macroscopic 3-D measurements with the innovative depth-scanning fringe projection technique (DSFP), OPTIK, 112(9), 2001, pp. 433-441
Theoretical limits of scanning white-light interferometry signal evaluation algorithms
Authors: Fleischer, M Windecker, R Tiziani, HJ
Citation: M. Fleischer et al., Theoretical limits of scanning white-light interferometry signal evaluation algorithms, APPL OPTICS, 40(17), 2001, pp. 2815-2820
Co-trimoxazole-induced liver and renal failure
Authors: Windecker, R Steffen, J Cascorbi, I Thurmann, PA
Citation: R. Windecker et al., Co-trimoxazole-induced liver and renal failure, EUR J CL PH, 56(2), 2000, pp. 191-193
Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology
Authors: Fleischer, M Windecker, R Tiziani, HJ
Citation: M. Fleischer et al., Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology, APPL OPTICS, 39(8), 2000, pp. 1290-1297
White-light interferometry with an extended zoom range
Authors: Windecker, R Fleischer, M Tiziani, HJ
Citation: R. Windecker et al., White-light interferometry with an extended zoom range, J MOD OPT, 46(7), 1999, pp. 1123-1135
Measurement and description of microstructures with consideration of material-specific characteristics
Authors: Tiziani, HJ Windecker, R Wegner, M Leonhardt, K Steudle, D Fleischer, M
Citation: Hj. Tiziani et al., Measurement and description of microstructures with consideration of material-specific characteristics, TEC MES, 66(11), 1999, pp. 429-436
Optical roughness measurements using extended white-light interferometry
Authors: Windecker, R Tiziani, HJ
Citation: R. Windecker et Hj. Tiziani, Optical roughness measurements using extended white-light interferometry, OPT ENG, 38(6), 1999, pp. 1081-1087
Topograph for inspection of engine cylinder walls
Authors: Franz, S Leonhardt, K Windecker, R Tiziani, HJ
Citation: S. Franz et al., Topograph for inspection of engine cylinder walls, APPL OPTICS, 38(36), 1999, pp. 7375-7381
Optical roughness measurements with fringe projection
Authors: Windecker, R Franz, S Tiziani, HJ
Citation: R. Windecker et al., Optical roughness measurements with fringe projection, APPL OPTICS, 38(13), 1999, pp. 2837-2842
Risultati: 1-12 |