AAAAAA
Results: 26-47/47
Authors:
MEUNIER M
DESJARDINS P
TABBAL M
ELYAAGOUBI N
IZQUIERDO R
YELON A
Citation: M. Meunier et al., LASER PROCESSING OF TUNGSTEN FROM WF6 AND SIH4, Applied surface science, 86(1-4), 1995, pp. 475-483
Authors:
OUHLAL A
SELMANI A
YELON A
Citation: A. Ouhlal et al., COPPER POLYIMIDE INTERACTION - A LOCAL SPIN-DENSITY STUDY/, Journal of adhesion science and technology, 9(7), 1995, pp. 971-982
Authors:
SHI MK
MARTINU L
SECHER E
SELMANI A
WERTHEIMER MR
YELON A
Citation: Mk. Shi et al., ANGLE-RESOLVED XPS STUDY OF PLASMA-TREATED TEFLON PFA SURFACES, Surface and interface analysis, 23(2), 1995, pp. 99-104
Authors:
GRUNING U
YELON A
Citation: U. Gruning et A. Yelon, CAPILLARY AND VAN-DER-WAALS FORCES AND MECHANICAL STABILITY OF POROUSSILICON, Thin solid films, 255(1-2), 1995, pp. 135-138
Authors:
BOISVERT G
LEWIS LJ
YELON A
Citation: G. Boisvert et al., MANY-BODY NATURE OF THE MEYER-NELDEL COMPENSATION LAW FOR DIFFUSION, Physical review letters, 75(3), 1995, pp. 469-472
Authors:
MASSON DP
OUHLAL A
YELON A
Citation: Dp. Masson et al., LONG-RANGE STRUCTURAL RELAXATION IN THE STAEBLER-WRONSKI EFFECT, Journal of non-crystalline solids, 190(1-2), 1995, pp. 151-156
Authors:
OUHLAL A
SELMANI A
YELON A
Citation: A. Ouhlal et al., BONDING IN (ETA(6)-C6H6)M AND (ETA(6)-C6H6)M- A LOCAL SPIN-DENSITY STUDY(, M=TI,CR,NI, AND CU ), Chemical physics letters, 243(3-4), 1995, pp. 269-274
Authors:
ABABOU Y
MASUT RA
YELON A
POULIN S
Citation: Y. Ababou et al., LOW-TEMPERATURE HETEROEPITAXY OF INP ON SI(111) SUBSTRATES TREATED WITH BUFFERED HF SOLUTION, Applied physics letters, 66(24), 1995, pp. 3352-3354
Authors:
SHI MK
LAMONTAGNE B
SELMANI A
MARTINU L
SACHER E
WERTHEIMER MR
YELON A
Citation: Mk. Shi et al., METALLIZATION OF TEFLON PFA .2. INTERACTIONS OF TI, AG, AND AU MEASURED BY X-RAY PHOTOELECTRON-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(3), 1994, pp. 807-812
Authors:
CHENITE A
SELMANI A
YELON A
Citation: A. Chenite et al., X-RAY PHOTOELECTRON-SPECTROSCOPY INVESTIGATION OF INTERFACIAL INTERACTIONS IN THE CR BPDA-PDA AND TI BPDA-PDA SYSTEMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 513-522
Authors:
SHI MK
LAMONTAGNE B
SELMANI A
MARTINU L
SACHER E
WERTHEIMER MR
YELON A
Citation: Mk. Shi et al., METALLIZATION OF TEFLON PFA .1. INTERACTIONS OF EVAPORATED CR AND AL MEASURED BY X-RAY PHOTOELECTRON-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(1), 1994, pp. 29-34
Authors:
MEUNIER M
SUYS M
TABBAL M
IZQUIERDO R
YELON A
SACHER E
Citation: M. Meunier et al., EXCIMER LASER-INDUCED METALLIZATION FOR IN-SITU PROCESSING ON SI AND GAAS, Applied surface science, 80, 1994, pp. 208-214
Authors:
OUHLAL A
SELMANI A
YELON A
ANDREWS M
Citation: A. Ouhlal et al., LOCAL SPIN-DENSITY INVESTIGATION OF THE CHROMIUM POLYIMIDE INTERFACE, Journal of adhesion science and technology, 8(5), 1994, pp. 485-499
Authors:
SHI MK
SELMANI A
MARTINU L
SACHER E
WERTHEIMER MR
YELON A
Citation: Mk. Shi et al., FLUOROPOLYMER SURFACE MODIFICATION FOR ENHANCED EVAPORATED METAL ADHESION, Journal of adhesion science and technology, 8(10), 1994, pp. 1129-1141
Authors:
SHI MK
SELMANI A
MARTINU L
SACHER E
WERTHEIMER MR
YELON A
Citation: Mk. Shi et al., FLUOROPOLYMER SURFACE MODIFICATION FOR ENHANCED EVAPORATED METAL ADHESION, Journal of adhesion science and technology, 8(10), 1994, pp. 1129-1141
Authors:
IVANOV D
CURRIE J
BOUCHARD H
LECOURS A
ANDRIAN J
YELON A
POULIN S
Citation: D. Ivanov et al., SPUTTERED SILICATE-LIMIT NASICON THIN-FILMS FOR ELECTROCHEMICAL SENSORS, Solid state ionics, 67(3-4), 1994, pp. 295-299
Authors:
GRIMAL O
MASSON DP
BERTRAND L
YELON A
Citation: O. Grimal et al., EVIDENCE OF WEAK PHONON COUPLING TO THE SI-H STRETCHING MODES IN A-SIH, Physical review. B, Condensed matter, 49(15), 1994, pp. 10242-10247
Authors:
GRUNING U
GUJRATHI SC
POULIN S
DIAWARA Y
YELON A
Citation: U. Gruning et al., REMOTE OXYGEN-CONTAINING HYDROGEN PLASMA TREATMENT OF POROUS SILICON, Journal of applied physics, 75(12), 1994, pp. 8075-8079
Authors:
CIUREANU P
RUDKOWSKI P
STROMOLSEN JO
YELON A
Citation: P. Ciureanu et al., THIN-FILM AND MICRO-FIBER PERMALLOY MAGNETORESISTORS - A COMPARISON, IEEE transactions on magnetics, 30(6), 1994, pp. 4620-4622
Authors:
CHENITE A
SELMANI A
LAMONTAGNE B
YELON A
Citation: A. Chenite et al., INTERFACIAL REACTIONS BETWEEN ALUMINUM AND BPDA-PDA, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 11(5), 1993, pp. 2411-2419
Authors:
TOUHOUCHE K
JACKMAN J
YELON A
Citation: K. Touhouche et al., CONCENTRATION PROFILES OF HIGH-DOSE MEV OXYGEN-IMPLANTED SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 857-861
Authors:
TAO Y
YELON A
LEONELLI R
Citation: Y. Tao et al., ELECTRONIC-PROPERTIES OF (NH4)2S PASSIVATED INP(100) SURFACES, Canadian journal of physics, 70(10-11), 1992, pp. 1039-1042