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Results: 1-13 |
Results: 13
Information features of multi-extremal functions for describing the functioning indicators of the components of information measurement systems
Authors: Blinov, AV Erokhin, AT Yurkov, NK
Citation: Av. Blinov et al., Information features of multi-extremal functions for describing the functioning indicators of the components of information measurement systems, MEAS TECH R, 43(8), 2000, pp. 660-664
Analysis of measurement information on steady-state vibrations
Authors: Belogurskii, IM Andreev, AN Blinov, AV Yurkov, NK
Citation: Im. Belogurskii et al., Analysis of measurement information on steady-state vibrations, MEAS TECH R, 43(8), 2000, pp. 665-666
Information models for designing conceptual broad-profile flight simulators
Authors: Andreev, AN Danilov, AM Klyuev, BV Lapshin, EV Blinov, AV Yurkov, NK
Citation: An. Andreev et al., Information models for designing conceptual broad-profile flight simulators, MEAS TECH R, 43(8), 2000, pp. 667-672
Model for organization of computer teaching
Authors: Andreev, AN Yurkov, NK Blinov, AV
Citation: An. Andreev et al., Model for organization of computer teaching, MEAS TECH R, 43(8), 2000, pp. 675-678
Diagnosis of restorable components of special-purpose on-board data-acquisition systems
Authors: Blinov, AV Maksud, DS Yurkov, NK
Citation: Av. Blinov et al., Diagnosis of restorable components of special-purpose on-board data-acquisition systems, MEAS TECH R, 43(7), 2000, pp. 578-580
Boolean matrices in problems on determining the state of discrete components in computerized measurement systems
Authors: Gorish, AV Novikov, NN Kladenok, LA Blinov, AV Yurkov, NK
Citation: Av. Gorish et al., Boolean matrices in problems on determining the state of discrete components in computerized measurement systems, MEAS TECH R, 43(6), 2000, pp. 481-485
Acceptance checking methods for UHF electronic components
Authors: Blinov, AV Kanakov, AG Trusov, VA Yurkov, NK
Citation: Av. Blinov et al., Acceptance checking methods for UHF electronic components, MEAS TECH R, 43(10), 2000, pp. 895-901
The dependence of the profile of a titanium substrate on the composition of the dielectric coating
Authors: Yurkov, NK Trusov, VA
Citation: Nk. Yurkov et Va. Trusov, The dependence of the profile of a titanium substrate on the composition of the dielectric coating, MEAS TECH R, 42(9), 1999, pp. 853-857
A functional-target approach to synthesis of systems controlling integrated industrial complexes
Authors: Yurkov, NK
Citation: Nk. Yurkov, A functional-target approach to synthesis of systems controlling integrated industrial complexes, MEAS TECH R, 42(7), 1999, pp. 643-647
The influence of tensoeffect on TCR and stability of resistors
Authors: Avanesyan, RR Osipov, YA Blinov, AV Telegin, VM Yurkov, NK
Citation: Rr. Avanesyan et al., The influence of tensoeffect on TCR and stability of resistors, MEAS TECH R, 42(7), 1999, pp. 655-657
Conceptual approach to introduction of information technology into the field of simulation
Authors: Andreev, AN Blinov, AV Yurkov, NK Yakimov, AN
Citation: An. Andreev et al., Conceptual approach to introduction of information technology into the field of simulation, MEAS TECH R, 42(5), 1999, pp. 421-426
Hierarchical model of technological design system
Authors: Yurkov, NK Blinov, AV Yakimov, AN
Citation: Nk. Yurkov et al., Hierarchical model of technological design system, MEAS TECH R, 42(5), 1999, pp. 433-436
On-line system for university-level training of technical specialists
Authors: Andreev, AN Blinov, AV Yurkov, NK Yakimov, AN
Citation: An. Andreev et al., On-line system for university-level training of technical specialists, MEAS TECH R, 42(5), 1999, pp. 445-448
Risultati: 1-13 |