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Authors: FRAIT Z FRAITOVA D STURC P ZEMEK J SCHREIBER F PELZI J
Citation: Z. Frait et al., INDUCED SURFACE ANISOTROPY OF AMORPHOUS IRON-NICKEL ALLOYS STUDIED BYFERROMAGNETIC-RESONANCE AND ANTIRESONANCE, Journal de physique. IV, 8(P2), 1998, pp. 71-74

Authors: DEGIORGI ML LEGGIERI G LUCHES A PERRONE A ZOCCO A ZEMEK J TRCHOVA M BARUCCA G MENGUCCI P
Citation: Ml. Degiorgi et al., STUDY OF CARBON NITRIDE SYNTHESIS AND DEPOSITION BY REACTIVE LASER-ABLATION OF GRAPHITE IN LOW-PRESSURE NITROGEN ATMOSPHERE, Laser physics, 8(1), 1998, pp. 270-274

Authors: SIKOLA T SPOUSTA J CESKA R ZLAMAL J DITTRICHOVA L NEBOJSA A NAVRATIL K RAFAJA D ZEMEK J PERINA V
Citation: T. Sikola et al., DEPOSITION OF METAL NITRIDES BY IBAD, Surface & coatings technology, 109(1-3), 1998, pp. 284-291

Authors: LESIAK B ZEMEK J JOZWIK A
Citation: B. Lesiak et al., PHASE DISTINCTION IN SEMIINSULATING POLYCRYSTALLINE SILICON BY PATTERN-RECOGNITION OF X-RAY PHOTOELECTRON-SPECTROSCOPY X-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPY DATA, Applied surface science, 135(1-4), 1998, pp. 318-330

Authors: ZEMEK J ZALMAN J LUCHES A
Citation: J. Zemek et al., XAES AND XPS STUDY OF AMORPHOUS-CARBON NITRIDE LAYERS, Applied surface science, 133(1-2), 1998, pp. 27-32

Authors: TURCICOVA H VACIK J CERVENA J PERINA V POLCAROVA M BRADLER J ZELEZNY V ZEMEK J
Citation: H. Turcicova et al., LINBO3 EXPOSED TO RADIOFREQUENCY PLASMA, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 141(1-4), 1998, pp. 494-497

Authors: LESIAK B JABLONSKI A ZEMEK J JIRICEK P
Citation: B. Lesiak et al., DETERMINATION OF THE INELASTIC MEAN FREE PATHS OF ELECTRONS IN COPPERAND COPPER OXIDES BY ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES), Surface and interface analysis, 26(5), 1998, pp. 400-411

Authors: ZEMEK J HUCEK S JABLONSKI A TILININ IS
Citation: J. Zemek et al., ESCAPE PROBABILITY OF S-PHOTOELECTRONS LEAVING ALUMINUM AND COPPER OXIDES, Surface and interface analysis, 26(3), 1998, pp. 182-187

Authors: KUCIRKOVA A NAVRATIL K ZEMEK J
Citation: A. Kucirkova et al., DEPTH INHOMOGENEITY OF DEPOSITED THIN-FILMS - APPLICATION TO SEMIINSULATING POLYCRYSTALLINE SILICON FILMS, Thin solid films, 323(1-2), 1998, pp. 53-58

Authors: ZEMEK J KAMBERSKY V DEHAAN P WEBER J JANDA P
Citation: J. Zemek et al., SURFACES AND INTERFACES OF PD CO MULTILAYERS, Surface science, 404(1-3), 1998, pp. 529-532

Authors: TURCICOVA H PERINA V VACIK J CERVENA J ZEMEK J ZELEZNY V AREND H
Citation: H. Turcicova et al., PLASMA PROCESSING OF LINBO3 IN A HYDROGEN OXYGEN RADIOFREQUENCY DISCHARGE/, Journal of physics. D, Applied physics, 31(9), 1998, pp. 1052-1059

Authors: TRCHOVA M ZEMEK J JUREK K
Citation: M. Trchova et al., INFRARED AND PHOTOELECTRON-SPECTROSCOPY OF SEMIINSULATING SILICON LAYERS, Journal of non-crystalline solids, 230, 1998, pp. 911-915

Authors: TILININ IS JABLONSKI A ZEMEK J HUCEK S
Citation: Is. Tilinin et al., ESCAPE PROBABILITY OF SIGNAL PHOTOELECTRONS FROM NONCRYSTALLINE SOLIDS - INFLUENCE OF ANISOTROPY OF PHOTOEMISSION, Journal of electron spectroscopy and related phenomena, 87(2), 1997, pp. 127-140

Authors: HUCEK S ZEMEK J JABLONSKI A
Citation: S. Hucek et al., ESCAPE PROBABILITY OF O IS PHOTOELECTRONS LEAVING COPPER-OXIDE, Journal of electron spectroscopy and related phenomena, 85(3), 1997, pp. 257-262

Authors: HUCEK S TILININ IS ZEMEK J
Citation: S. Hucek et al., ANGULAR-DISTRIBUTION OF PHOTOELECTRONS EMITTED FROM SOLIDS, Journal of electron spectroscopy and related phenomena, 85(3), 1997, pp. 263-268

Authors: TILININ IS ZEMEK J HUCEK S
Citation: Is. Tilinin et al., ESCAPE PROBABILITY OF SIGNAL AUGER AND PHOTOELECTRONS FROM ULTRATHIN OVERLAYERS, Surface and interface analysis, 25(9), 1997, pp. 683-687

Authors: BIEDERMAN H HOWSON RP SLAVINSKA D STUNDZIA V ZEMEK J
Citation: H. Biederman et al., COMPOSITE METAL C-H FILMS PREPARED IN AN UNBALANCED MAGNETRON/, Vacuum, 48(10), 1997, pp. 883-886

Authors: CARICATO AP LEGGIERI G LUCHES A PERRONE A GYORGY E MIHAILESCU IN POPESCU M BARUCCA G MENGUCCI P ZEMEK J TRCHOVA M
Citation: Ap. Caricato et al., CHARACTERIZATION OF C-N THIN-FILMS DEPOSITED BY REACTIVE EXCIMER-LASER ABLATION OF GRAPHITE TARGETS IN NITROGEN ATMOSPHERE, Thin solid films, 307(1-2), 1997, pp. 54-59

Authors: BULIR J JELINEK M VORLICEK V ZEMEK J PERINA V
Citation: J. Bulir et al., STUDY OF NITROGEN PRESSURE EFFECT ON THE LASER-DEPOSITED AMORPHOUS-CARBON FILMS, Thin solid films, 292(1-2), 1997, pp. 318-323

Authors: JABLONSKI A ZEMEK J
Citation: A. Jablonski et J. Zemek, EXPERIMENTAL AND THEORETICAL TESTS OF ELASTIC-SCATTERING EFFECTS IN XPS, Surface science, 387(1-3), 1997, pp. 288-299

Authors: TRCHOVA M ZEMEK J JUREK K
Citation: M. Trchova et al., PHOTOELECTRON AND INFRARED-SPECTROSCOPY OF SEMIINSULATING SILICON LAYERS, Journal of applied physics, 82(7), 1997, pp. 3519-3527

Authors: SOUKUP L PERINA V JASTRABIK L SICHA M POKORNY P SOUKUP RJ NOVAK M ZEMEK J
Citation: L. Soukup et al., GERMANIUM NITRIDE LAYERS PREPARED BY SUPERSONIC RF PLASMA-JET, Surface & coatings technology, 78(1-3), 1996, pp. 280-283

Authors: DANNA E LUCHES A PERRONE A ACQUAVIVA S ALEXANDRESCU R MIHAILESCU IN ZEMEK J MAJNI G
Citation: E. Danna et al., DEPOSITION OF C-N FILMS BY REACTIVE LASER-ABLATION, Applied surface science, 106, 1996, pp. 126-131

Authors: BIEDERMAN H HLIDEK P PESICKA J SLAVINSKA D STUNDZIA V ZEMEK J KINGDON RJ HOWSON RP
Citation: H. Biederman et al., COMPOSITE METAL C-H FILMS PREPARED BY UNBALANCED MAGNETRON SPUTTERING- NI/C-H/, Vacuum, 47(12), 1996, pp. 1453-1463

Authors: JABLONSKI A ZEMEK J
Citation: A. Jablonski et J. Zemek, MAXIMUM PROBABILITY OF ELASTIC ELECTRON BACKSCATTERING FROM SURFACES OF AMORPHOUS AND POLYCRYSTALLINE SOLIDS, Surface science, 347(1-2), 1996, pp. 207-214
Risultati: 1-25 | 26-41