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Facchini, G
Zappettini, A
Canali, A
Martinelli, M
Gabetta, G
Tallarida, G
Citation: G. Facchini et al., Erbium-doped crystalline YAG planar and ridge waveguides on quartz and sapphire substrates: deposition and material characterisation, OPT MATER, 17(1-2), 2001, pp. 251-254
Authors:
Pietralunga, SM
Milani, A
Zappettini, A
Martinelli, M
Citation: Sm. Pietralunga et al., Experimental characterization of ternary Cd0.9Zn0.1Te as a basic material for all-optical processing in the 1.5-mu m range, J OPT SOC B, 18(2), 2001, pp. 176-181
Authors:
Bocchi, E
Milani, A
Zappettini, A
Pietralunga, SM
Martinelli, M
Citation: E. Bocchi et al., Determination of ionic and pure electronic contributions to the electro-optic coefficient of cadmium telluride and gallium arsenide single crystals, SYNTH METAL, 124(1), 2001, pp. 257-259
Authors:
Zappettini, A
Pietralunga, SM
Milani, A
Piccinin, D
Fere, M
Martinelli, M
Citation: A. Zappettini et al., Near-IR comparative characterization of optical second-order nonlinearities in Te-based semiconductors, J ELEC MAT, 30(6), 2001, pp. 738-742
Authors:
Milani, A
Pietralunga, SM
Sangiovanni, A
Zappettini, A
Martinelli, M
Citation: A. Milani et al., Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications, MAT SCI E A, 288(2), 2000, pp. 205-208
Authors:
Zappettini, A
Bissoli, F
Zanotti, L
Zha, M
Broglia, C
Paorici, C
Citation: A. Zappettini et al., Stoichiometric deviations and partial-pressure measurements in solid-vapour cadmium telluride system, MATER CH PH, 66(2-3), 2000, pp. 138-142
Authors:
Zappettini, A
Pietralunga, SM
Milani, A
Martinelli, M
Mycielski, A
Citation: A. Zappettini et al., Measurements of second-order susceptibility at lambda=1.5 mu m in CdTe-based ternary alloys for efficient wavelength conversion, J APPL PHYS, 88(8), 2000, pp. 4913-4915