ACNP - Italian Periodicals Catalogue

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Results: 1-9 |

Results: 9

Vertical and lateral ordering in self-organized quantum dot superlattices

Authors: Springholz, G Pinczolits, M Holy, V Zerlauth, S Vavra, I Bauer, G

Citation: G. Springholz et al., Vertical and lateral ordering in self-organized quantum dot superlattices, PHYSICA E, 9(1), 2001, pp. 149-163

Local lattice distortion in Si1-x-yGexCy epitaxial layers from x-ray absorption fine structure - art. no. 045314

Authors: De Salvador, D Tormen, M Berti, M Drigo, AV Romanato, F Boscherini, F Stangl, J Zerlauth, S Bauer, G Colombo, L Mobilio, S

Citation: D. De Salvador et al., Local lattice distortion in Si1-x-yGexCy epitaxial layers from x-ray absorption fine structure - art. no. 045314, PHYS REV B, 6304(4), 2001, pp. 5314

Metastability of Si1-yCy epilayers under 2 MeV alpha-particle irradiation

Authors: Berti, M De Salvador, D Drigo, AV Petrovich, M Stangl, J Schaffler, F Zerlauth, S Bauer, G Armigliato, A

Citation: M. Berti et al., Metastability of Si1-yCy epilayers under 2 MeV alpha-particle irradiation, MICRON, 31(3), 2000, pp. 285-289

In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction

Authors: Zhuang, Y Pietsch, U Stangl, J Holy, V Darowski, N Grenzer, J Zerlauth, S Schaffler, F Bauer, G

Citation: Y. Zhuang et al., In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction, PHYSICA B, 283(1-3), 2000, pp. 130-134

Lattice parameter of Si1-x-yGexCy alloys

Authors: De Salvador, D Petrovich, M Berti, M Romanato, F Napolitani, E Drigo, A Stangl, J Zerlauth, S Muhlberger, M Schaffler, F Bauer, G Kelires, PC

Citation: D. De Salvador et al., Lattice parameter of Si1-x-yGexCy alloys, PHYS REV B, 61(19), 2000, pp. 13005-13013

X-ray reflection from self-organized interfaces in an SiGe/Si multilayer

Authors: Grim, J Holy, V Kubena, J Darhuber, AA Zerlauth, S Bauer, G

Citation: J. Grim et al., X-ray reflection from self-organized interfaces in an SiGe/Si multilayer, SEMIC SCI T, 14(1), 1999, pp. 32-40

Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers

Authors: Grim, J Holy, V Kubena, J Stangl, J Darhuber, AA Zerlauth, S Schaffler, F Bauer, G

Citation: J. Grim et al., Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers, J PHYS D, 32(10A), 1999, pp. A216-A219

Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction

Authors: Zhuang, Y Holy, V Stangl, J Darhuber, AA Mikulik, P Zerlauth, S Schaffler, F Bauer, G Darowski, N Lubbert, D Pietsch, U

Citation: Y. Zhuang et al., Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction, J PHYS D, 32(10A), 1999, pp. A224-A229

Lateral arrangement of self-assembled quantum dots in an SiGe Si superlattice

Authors: Holy, V Stangl, J Zerlauth, S Bauer, G Darowski, N Lubbert, D Pietsch, U

Citation: V. Holy et al., Lateral arrangement of self-assembled quantum dots in an SiGe Si superlattice, J PHYS D, 32(10A), 1999, pp. A234-A238

Risultati: 1-9 |