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Results:
1-19
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Results: 19
Authors:
Castineira, MM
Brandt, R
von Bohlen, A
Jakubowski, N
Citation: Mm. Castineira et al., Development of a procedure for the multi-element determination of trace elements in wine by ICP-MS, FRESEN J AN, 370(5), 2001, pp. 553-558
Authors:
Sures, B
Zimmermann, S
Messerschmidt, J
von Bohlen, A
Alt, F
Citation: B. Sures et al., First report on the uptake of automobile catalyst emitted palladium by European eels (Anguilla anguilla) following experimental exposure to road dust, ENVIR POLLU, 113(3), 2001, pp. 341-345
Authors:
Klockenkamper, R
Alt, F
Brandt, R
Jakubowski, N
Messerschmidt, J
von Bohlen, A
Citation: R. Klockenkamper et al., Results of proficiency testing with regard to sediment analysis by FAAS, ICP-MS and TXRF, J ANAL ATOM, 16(6), 2001, pp. 658-663
Authors:
von Bohlen, A
Lietz, E
Brink-Kloke, H
Poniecki, C
Citation: A. Von Bohlen et al., Microanalytical characterisation of Germanic non-iron metal finds at Dortmund-Oespel, J TR MICROP, 18(2), 2000, pp. 275-285
Authors:
Varga, I
von Bohlen, A
Zaray, G
Klockenkamper, R
Citation: I. Varga et al., Chemical speciation of metals and sulphur in air dust by sequential leaching and total reflection X-ray fluorescence analysis, J TR MICROP, 18(2), 2000, pp. 293-302
Authors:
Spanke, J
von Bohlen, A
Klockenkamper, R
Quentmeier, A
Klockow, D
Citation: J. Spanke et al., Total reflection X-ray fluorescence analysis of laser-deposited solid sample material, J ANAL ATOM, 15(6), 2000, pp. 673-679
Authors:
Klockenkamper, R
von Bohlen, A
Moens, L
Citation: R. Klockenkamper et al., Analysis of pigments and inks on oil paintings and historical manuscripts using total reflection x-ray fluorescence spectrometry, X-RAY SPECT, 29(1), 2000, pp. 119-129
Authors:
Varga, I
von Bohlen, A
Klockenkamper, R
Zaray, G
Citation: I. Varga et al., Solid state speciation of elements in urban dust by sequential leaching and total reflection X-Ray fluorescence spectrometry, MICROCHEM J, 67(1-3), 2000, pp. 265-269
Authors:
Staat, H
Seifert, L
von Bohlen, A
Citation: H. Staat et al., Detection of casting material on historical violins by infrared spectroscopy and total reflection X-ray fluorescence spectrometry, ANAL LETTER, 33(5), 2000, pp. 953-962
Authors:
Vandenabeele, P
von Bohlen, A
Moens, L
Klockenkamper, R
Joukes, F
Dewispelaere, G
Citation: P. Vandenabeele et al., Spectroscopic examination of two Egyptian masks: A combined method approach, ANAL LETTER, 33(15), 2000, pp. 3315-3332
Authors:
Messerschmidt, J
von Bohlen, A
Alt, F
Klockenkamper, R
Citation: J. Messerschmidt et al., Separation and enrichment of palladium and gold in biological and environmental samples, adapted to the determination by total reflection X-ray fluorescence, ANALYST, 125(3), 2000, pp. 397-399
Authors:
Klockenkamper, R
von Bohlen, A
Citation: R. Klockenkamper et A. Von Bohlen, Depth profiling of a Co-implanted silicon wafer by total-reflection X-ray fluorescence analysis after repeated oxidation and HF-etching, ANAL COMMUN, 36(2), 1999, pp. 27-29
Authors:
von Bohlen, A
Citation: A. Von Bohlen, Multielement microanalysis and pattern characterisation of historical violin varnishes, J TR MICROP, 17(2), 1999, pp. 177-187
Authors:
Klockenkamper, R
von Bohlen, A
Citation: R. Klockenkamper et A. Von Bohlen, A new method for depth-profiling of shallow layers in silicon wafers by repeated chemical etching and total-reflection X-ray fluorescence analysis, SPECT ACT B, 54(10), 1999, pp. 1385-1392
Authors:
Klockenkamper, R
von Bohlen, A
Citation: R. Klockenkamper et A. Von Bohlen, Survey of sampling techniques for solids suitable for microanalysis by total-reflection X-ray fluorescence spectrometry, J ANAL ATOM, 14(4), 1999, pp. 571-576
Authors:
Klockenkamper, R
von Bohlen, A
Becker, HW
Palmetshofer, L
Citation: R. Klockenkamper et al., Comparison of shallow depth profiles of cobalt-implanted Si wafers determined by total reflection x-ray fluorescence analysis after repeated stratified etching and by Rutherford backscattering spectrometry, SURF INT AN, 27(11), 1999, pp. 1003-1008
Authors:
Vilhunen, JK
von Bohlen, A
Schmeling, M
Rantanen, L
Mikkonen, S
Klockenkamper, R
Klockow, D
Citation: Jk. Vilhunen et al., Trace element determination in diesel particulates by total-reflection X-ray fluorescence analysis, MIKROCH ACT, 131(3-4), 1999, pp. 219-223
Authors:
Wehling, B
Vandenabeele, P
Moens, L
Klockenkamper, R
von Bohlen, A
Van Hooydonk, G
de Reu, M
Citation: B. Wehling et al., Investigation of pigments in medieval manuscripts by micro Raman spectroscopy and total reflection X-ray fluorescence spectrometry, MIKROCH ACT, 130(4), 1999, pp. 253-260
Authors:
Vandenabeele, P
Wehling, B
Moens, L
Dekeyzer, B
Cardon, B
von Bohlen, A
Klockenkamper, R
Citation: P. Vandenabeele et al., Pigment investigation of a late-medieval manuscript with total reflection X-ray fluorescence and micro-Raman spectroscopy, ANALYST, 124(2), 1999, pp. 169-172
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