Authors:
FAN JC
TSAI CM
CHEN KY
WANG SY
LIN G
LEE CP
Citation: Jc. Fan et al., LOW-RESISTANCE VERTICAL CONDUCTION ACROSS EPITAXIALLY LIFTED-OFF N-GAAS FILM AND PD GE/PD COATED SI SUBSTRATE/, Journal of electronic materials, 27(3), 1998, pp. 110-113
Citation: T. Berdinskikh et al., A KINETIC-STUDY OF STRUCTURED SURFACE-RELIEF PATTERNING OF GAP((1)OVER-BAR(1)OVER-BAR(1)OVER-BAR), Journal of electronic materials, 27(3), 1998, pp. 114-121
Citation: Js. Yeo et al., GROWTH OF CSLIB6O10 THIN-FILMS ON SI SUBSTRATE BY PULSED-LASER DEPOSITION USING SIO2 AND CAF2 AS BUFFER LAYERS, Journal of electronic materials, 27(3), 1998, pp. 127-131
Authors:
HONG J
LAMBERS ES
ABERNATHY CR
PEARTON SJ
SHUL RJ
HOBSON WS
Citation: J. Hong et al., INDUCTIVELY-COUPLED PLASMA-ETCHING OF INGAP, ALINP, AND ALGAP IN CL-2AND BCL3 CHEMISTRIES, Journal of electronic materials, 27(3), 1998, pp. 132-137
Authors:
BELTRAN NH
BALOCCHI C
ERRAZU X
AVILA RE
PIDERIT G
Citation: Nh. Beltran et al., RAPID THERMAL ANNEALING OF ZIRCONIA FILMS DEPOSITED BY SPRAY-PYROLYSIS, Journal of electronic materials, 27(2), 1998, pp. 9-11
Citation: B. Li et al., STRUCTURE INVESTIGATION ON HG1-XCDXTE LIQUID-PHASE EPITAXIAL-FILMS GROWN BY THE MELTETCH TECHNIQUE, Journal of electronic materials, 27(2), 1998, pp. 51-54
Citation: Z. Shi et al., THICK CRACK-FREE CAF2 EPITAXIAL LAYER ON GAAS(100) SUBSTRATE BY MOLECULAR-BEAM EPITAXY, Journal of electronic materials, 27(2), 1998, pp. 55-58
Citation: Zq. Fang et al., CHARACTERIZATION OF DEEP CENTERS IN UNDOPED SEMIINSULATING GAAS SUBSTRATES BY NORMALIZED THERMALLY STIMULATED CURRENT SPECTROSCOPY - COMPARISON OF 100 AND 150 MM WAFERS, Journal of electronic materials, 27(2), 1998, pp. 62-68
Authors:
KOPF RF
HAMM RA
MALIK RJ
RYAN RW
GEVA M
BURM J
TATE A
Citation: Rf. Kopf et al., ECR PLASMA ETCH FABRICATION OF C-DOPED BASE INGAAS INP DHBT STRUCTURES - A COMPARISON OF CH4/H-2/AR VS BCL3/N-2 PLASMA ETCH CHEMISTRIES/, Journal of electronic materials, 27(2), 1998, pp. 69-72
Authors:
KRESTNIKOV IL
IVANOV SV
KOPEV PS
LEDENTSOV NN
MAXIMOV MV
SAKHAROV AV
SOROKIN SV
TORRES CMS
BIMBERG D
ALFEROV ZI
Citation: Il. Krestnikov et al., RT LASING VIA NANOSCALE CDSE ISLANDS IN A (ZN,MG)(S,SE) MATRIX, Journal of electronic materials, 27(2), 1998, pp. 73-76
Authors:
HAN BK
LI L
KAPPERS MJ
HICKS RF
YOON H
GOORSKY MS
HIGA KT
Citation: Bk. Han et al., CHARACTERIZATION OF INGAAS GAAS(001) FILMS GROWN BY METALORGANIC VAPOR-PHASE EPITAXY USING ALTERNATIVE SOURCES/, Journal of electronic materials, 27(2), 1998, pp. 81-84
Authors:
LIANG S
GORLA CR
EMANETOGLU N
LIU Y
MAYO WE
LU Y
Citation: S. Liang et al., EPITAXIAL-GROWTH OF (1 1 (2)OVER-BAR 0) ZNO ON (0 1 (1)OVER-BAR 2) AL2O3 BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of electronic materials, 27(11), 1998, pp. 72-76
Citation: Yz. Wang et Oo. Awadelkarim, THE EFFECTS OF GLASS-SUBSTRATES SURFACE-TREATMENT ON THE CHARACTERISTICS OF N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Journal of electronic materials, 27(11), 1998, pp. 77-80
Citation: G. Ghosh et al., SPECIAL ISSUE ON INTERFACIAL REACTIONS, SOLID-STATE TRANSFORMATIONS AND THERMAL MANAGEMENT - FOREWORD, Journal of electronic materials, 27(11), 1998, pp. 1137-1137
Citation: S. Jin et H. Mavoori, PROCESSING AND PROPERTIES OF CVD DIAMOND FOR THERMAL MANAGEMENT, Journal of electronic materials, 27(11), 1998, pp. 1148-1153
Citation: G. Ghosh, DIFFUSION AND PHASE-TRANSFORMATIONS DURING INTERFACIAL REACTION BETWEEN LEAD-TIN SOLDERS AND PALLADIUM, Journal of electronic materials, 27(11), 1998, pp. 1154-1160
Citation: Hm. Lee et al., THERMODYNAMIC PREDICTION OF INTERFACE PHASES AT CU SOLDER JOINTS/, Journal of electronic materials, 27(11), 1998, pp. 1161-1166