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Table of contents of journal: *Journal of electronic materials

Results: 176-200/1514

Authors: FAN JC TSAI CM CHEN KY WANG SY LIN G LEE CP
Citation: Jc. Fan et al., LOW-RESISTANCE VERTICAL CONDUCTION ACROSS EPITAXIALLY LIFTED-OFF N-GAAS FILM AND PD GE/PD COATED SI SUBSTRATE/, Journal of electronic materials, 27(3), 1998, pp. 110-113

Authors: BERDINSKIKH T RUDA HE MEI XY BUCHANAN M
Citation: T. Berdinskikh et al., A KINETIC-STUDY OF STRUCTURED SURFACE-RELIEF PATTERNING OF GAP((1)OVER-BAR(1)OVER-BAR(1)OVER-BAR), Journal of electronic materials, 27(3), 1998, pp. 114-121

Authors: WIRTH R GENG C SCHOLZ F HANGLEITER A
Citation: R. Wirth et al., DETERMINATION OF ORDERING INDUCED BIREFRINGENCE IN (AL)GAINP, Journal of electronic materials, 27(3), 1998, pp. 122-126

Authors: YEO JS AKELLA A HUANG TF HESSELINK L
Citation: Js. Yeo et al., GROWTH OF CSLIB6O10 THIN-FILMS ON SI SUBSTRATE BY PULSED-LASER DEPOSITION USING SIO2 AND CAF2 AS BUFFER LAYERS, Journal of electronic materials, 27(3), 1998, pp. 127-131

Authors: HONG J LAMBERS ES ABERNATHY CR PEARTON SJ SHUL RJ HOBSON WS
Citation: J. Hong et al., INDUCTIVELY-COUPLED PLASMA-ETCHING OF INGAP, ALINP, AND ALGAP IN CL-2AND BCL3 CHEMISTRIES, Journal of electronic materials, 27(3), 1998, pp. 132-137

Authors: LAPASIN R PRICL S SIRTORI V CASATI D
Citation: R. Lapasin et al., VISCOELASTIC PROPERTIES OF SOLDER PASTES, Journal of electronic materials, 27(3), 1998, pp. 138-148

Authors: KORHONEN TM KIVILAHTI JK
Citation: Tm. Korhonen et Jk. Kivilahti, THERMODYNAMICS OF THE SN-IN-AG SOLDER SYSTEM, Journal of electronic materials, 27(3), 1998, pp. 149-158

Authors: BELTRAN NH BALOCCHI C ERRAZU X AVILA RE PIDERIT G
Citation: Nh. Beltran et al., RAPID THERMAL ANNEALING OF ZIRCONIA FILMS DEPOSITED BY SPRAY-PYROLYSIS, Journal of electronic materials, 27(2), 1998, pp. 9-11

Authors: LI B GUI YS ZHU JQ CHU JH
Citation: B. Li et al., STRUCTURE INVESTIGATION ON HG1-XCDXTE LIQUID-PHASE EPITAXIAL-FILMS GROWN BY THE MELTETCH TECHNIQUE, Journal of electronic materials, 27(2), 1998, pp. 51-54

Authors: SHI Z ZOGG H KELLER U
Citation: Z. Shi et al., THICK CRACK-FREE CAF2 EPITAXIAL LAYER ON GAAS(100) SUBSTRATE BY MOLECULAR-BEAM EPITAXY, Journal of electronic materials, 27(2), 1998, pp. 55-58

Authors: WANG ZM FENG SL LU ZD ZHAO Q YANG XP CHEN ZG XU ZY ZHENG HZ
Citation: Zm. Wang et al., ANNEALING BEHAVIOR OF INAS GAAS QUANTUM-DOT STRUCTURES/, Journal of electronic materials, 27(2), 1998, pp. 59-61

Authors: FANG ZQ LOOK DC MIER MG
Citation: Zq. Fang et al., CHARACTERIZATION OF DEEP CENTERS IN UNDOPED SEMIINSULATING GAAS SUBSTRATES BY NORMALIZED THERMALLY STIMULATED CURRENT SPECTROSCOPY - COMPARISON OF 100 AND 150 MM WAFERS, Journal of electronic materials, 27(2), 1998, pp. 62-68

Authors: KOPF RF HAMM RA MALIK RJ RYAN RW GEVA M BURM J TATE A
Citation: Rf. Kopf et al., ECR PLASMA ETCH FABRICATION OF C-DOPED BASE INGAAS INP DHBT STRUCTURES - A COMPARISON OF CH4/H-2/AR VS BCL3/N-2 PLASMA ETCH CHEMISTRIES/, Journal of electronic materials, 27(2), 1998, pp. 69-72

Authors: KRESTNIKOV IL IVANOV SV KOPEV PS LEDENTSOV NN MAXIMOV MV SAKHAROV AV SOROKIN SV TORRES CMS BIMBERG D ALFEROV ZI
Citation: Il. Krestnikov et al., RT LASING VIA NANOSCALE CDSE ISLANDS IN A (ZN,MG)(S,SE) MATRIX, Journal of electronic materials, 27(2), 1998, pp. 73-76

Authors: FELIX CL BEWLEY WW AIFER EH VURGAFTMAN I MEYER JR LIN CH ZHANG D MURRY SJ YANG RQ PEI SS
Citation: Cl. Felix et al., LOW-THRESHOLD 3 MU-M INTERBAND CASCADE W-LASER, Journal of electronic materials, 27(2), 1998, pp. 77-80

Authors: HAN BK LI L KAPPERS MJ HICKS RF YOON H GOORSKY MS HIGA KT
Citation: Bk. Han et al., CHARACTERIZATION OF INGAAS GAAS(001) FILMS GROWN BY METALORGANIC VAPOR-PHASE EPITAXY USING ALTERNATIVE SOURCES/, Journal of electronic materials, 27(2), 1998, pp. 81-84

Authors: CHO MW KOH KW BAGNALL DM ZHU Z YAO T
Citation: Mw. Cho et al., ZNSE HETEROEPITAXY ON GAAS(110) SUBSTRATE, Journal of electronic materials, 27(2), 1998, pp. 85-88

Authors: IVEY DG LUO J INGREY S MOORE R WOODS I
Citation: Dg. Ivey et al., GALVANIC CORROSION EFFECTS IN INP-BASED LASER RIDGE STRUCTURES, Journal of electronic materials, 27(2), 1998, pp. 89-95

Authors: LIANG S GORLA CR EMANETOGLU N LIU Y MAYO WE LU Y
Citation: S. Liang et al., EPITAXIAL-GROWTH OF (1 1 (2)OVER-BAR 0) ZNO ON (0 1 (1)OVER-BAR 2) AL2O3 BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of electronic materials, 27(11), 1998, pp. 72-76

Authors: WANG YZ AWADELKARIM OO
Citation: Yz. Wang et Oo. Awadelkarim, THE EFFECTS OF GLASS-SUBSTRATES SURFACE-TREATMENT ON THE CHARACTERISTICS OF N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Journal of electronic materials, 27(11), 1998, pp. 77-80

Authors: GHOSH G KANG S MURTY KL NOTIS M
Citation: G. Ghosh et al., SPECIAL ISSUE ON INTERFACIAL REACTIONS, SOLID-STATE TRANSFORMATIONS AND THERMAL MANAGEMENT - FOREWORD, Journal of electronic materials, 27(11), 1998, pp. 1137-1137

Authors: DHEURLE FM
Citation: Fm. Dheurle, SILICIDE INTERFACES IN SILICON TECHNOLOGY, Journal of electronic materials, 27(11), 1998, pp. 1138-1147

Authors: JIN S MAVOORI H
Citation: S. Jin et H. Mavoori, PROCESSING AND PROPERTIES OF CVD DIAMOND FOR THERMAL MANAGEMENT, Journal of electronic materials, 27(11), 1998, pp. 1148-1153

Authors: GHOSH G
Citation: G. Ghosh, DIFFUSION AND PHASE-TRANSFORMATIONS DURING INTERFACIAL REACTION BETWEEN LEAD-TIN SOLDERS AND PALLADIUM, Journal of electronic materials, 27(11), 1998, pp. 1154-1160

Authors: LEE HM YOON SW LEE BJ
Citation: Hm. Lee et al., THERMODYNAMIC PREDICTION OF INTERFACE PHASES AT CU SOLDER JOINTS/, Journal of electronic materials, 27(11), 1998, pp. 1161-1166
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