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Authors: BARNA PB ADAMIK M KAISER U LAUX S BANGERT H PULLIAINEN M PISCHOW KA
Citation: Pb. Barna et al., STRUCTURE RELATED OPTICAL AND MECHANICAL-PROPERTIES OF OXYGEN DOPED AL FILMS, Surface & coatings technology, 101(1-3), 1998, pp. 72-75

Authors: HARRY E PAULEAU Y ADAMIK M BARNA PB SULYOK A MENYHARD M
Citation: E. Harry et al., GROWTH-CHARACTERISTICS OF TUNGSTEN-CARBON FILMS DEPOSITED BY MAGNETRON SPUTTERING, Surface & coatings technology, 101(1-3), 1998, pp. 291-294

Authors: ADAMIK M BARNA PB TOMOV I
Citation: M. Adamik et al., ULTRASHARP TEXTURES IN AL TI LAYERED STRUCTURES/, Surface & coatings technology, 101(1-3), 1998, pp. 338-340

Authors: TOMOV I ADAMIK M BARNA PB YAMAKOV V
Citation: I. Tomov et al., TEXTURE AND SECONDARY EXTINCTION MEASUREMENTS IN AL TI STRATIFIED FILMS BY X-RAY-DIFFRACTION/, Vacuum, 50(3-4), 1998, pp. 497-502

Authors: BARNA PB ADAMIK M
Citation: Pb. Barna et M. Adamik, FUNDAMENTAL STRUCTURE FORMING PHENOMENA OF POLYCRYSTALLINE FILMS AND THE STRUCTURE ZONE MODELS, Thin solid films, 317(1-2), 1998, pp. 27-33

Authors: ADAMIK M BARNA PB TOMOV I
Citation: M. Adamik et al., COLUMNAR STRUCTURES IN POLYCRYSTALLINE THIN-FILMS DEVELOPED BY COMPETITIVE GROWTH, Thin solid films, 317(1-2), 1998, pp. 64-68

Authors: CZIGANY Z ADAMIK M KAISER N
Citation: Z. Czigany et al., 248NM LASER INTERACTION STUDIES ON LAF3 MGF2 OPTICAL COATINGS BY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY/, Thin solid films, 312(1-2), 1998, pp. 176-181

Authors: LABAR JL ADAMIK M DODONY I
Citation: Jl. Labar et al., CONTAMINATION IN ANALYTICAL ELECTRON-MICROSCOPY AND IN ALCHEMI, Mikrochimica acta (1966), 1998, pp. 65-71

Authors: BARNA PB ADAMIK M KAISER U HOBERT H
Citation: Pb. Barna et al., PREPARATION OF POLYCRYSTALLINE AND MICROCRYSTALLINE GERMANIUM COMPOSITE FILMS BY CODEPOSITION OF ACTIVE ADDITIVES, Journal of non-crystalline solids, 230, 1998, pp. 1063-1068

Authors: TISSERAND S FLORY F GATTO A ROUX L ADAMIK M KOVACS I
Citation: S. Tisserand et al., TITANIUM IMPLANTATION IN BULK AND THIN-FILM AMORPHOUS SILICA, Journal of applied physics, 83(10), 1998, pp. 5150-5153

Authors: KAISER U BROWN PD JINSCHEK J ADAMIK M HUMPHREYS CJ KARMANN S FISSEL A PFENNIGHAUS K RICHTER W
Citation: U. Kaiser et al., MICROSTRUCTURAL INVESTIGATIONS OF SILICON-CARBIDE AND ALUMINUM NITRIDE MBE LAYERS ON SILICON SUBSTRATES, European journal of cell biology, 74, 1997, pp. 120-120

Authors: MOUNIER E BERTIN F ADAMIK M PAULEAU Y BARNA PB
Citation: E. Mounier et al., EFFECT OF THE SUBSTRATE-TEMPERATURE ON THE PHYSICAL CHARACTERISTICS OF AMORPHOUS-CARBON FILMS DEPOSITED BY DC MAGNETRON SPUTTERING, DIAMOND AND RELATED MATERIALS, 5(12), 1996, pp. 1509-1515

Authors: PISCHOW KA KOSKINEN J ADAMIK M BARNA PB
Citation: Ka. Pischow et al., CROSS-SECTIONAL SCANNING FORCE MICROSCOPY ANALYSIS OF ARC-DISCHARGE-DEPOSITED DIAMOND-LIKE CARBON-FILMS, Ceramics international, 22(1), 1996, pp. 49-52

Authors: ADAMIK M BARNA PB
Citation: M. Adamik et Pb. Barna, ROLE OF UNDERLAYERS IN THE DEVELOPMENT OF EVOLUTIONARY TEXTURE IN POLYCRYSTALLINE THIN-FILMS, Surface & coatings technology, 80(1-2), 1996, pp. 109-112

Authors: KOVER L BARNA PB SANJINES R KOVACS Z MARGARITONDO G ADAMIK M RADI Z
Citation: L. Kover et al., CHEMICAL-STATE ANALYSIS OF SURFACE AND INTERFACE SEGREGATES IN COEVAPORATED AL-SN-O SYSTEMS, Thin solid films, 282(1-2), 1996, pp. 90-93

Authors: KAISER U ADAMIK M SAFRAN G BARNA PB LAUX S RICHTER W
Citation: U. Kaiser et al., GROWTH-STRUCTURE INVESTIGATION OF MGF2 AND NDF3 FILMS GROWN BY MOLECULAR-BEAM DEPOSITION ON CAF2(111) SUBSTRATES, Thin solid films, 280(1-2), 1996, pp. 5-15

Authors: HASHIMOTO M QIU H OHBUCHI T ADAMIK M NAKAI H BARNA A BARNA PB
Citation: M. Hashimoto et al., CHARACTERIZATION OF COBALT FILMS GROWN ON MGO(001) BY DC-BIASED-SPUTTER DEPOSITION, Journal of crystal growth, 166(1-4), 1996, pp. 792-797

Authors: MANAILA R BIRO D BARNA PB ADAMIK M ZAVALICHE F CRACIUN S DEVENYI A
Citation: R. Manaila et al., TI NITRIDE PHASES IN THIN-FILMS DEPOSITED BY DC MAGNETRON SPUTTERING, Applied surface science, 91(1-4), 1995, pp. 295-302

Authors: NAKAI H QIU H ADAMIK M SAFRAN G BARNA PB HASHIMOTO M
Citation: H. Nakai et al., RES AND XHRTEM CHARACTERIZATION OF EPITAXIAL NI FILMS PREPARED BY BIASED DC SPUTTER-DEPOSITION ON MGO(001), Thin solid films, 263(2), 1995, pp. 159-161

Authors: DUPARRE A RUPPE C PISCHOW KA ADAMIK M BARNA PB
Citation: A. Duparre et al., ATOMIC-FORCE MICROSCOPY ON CROSS-SECTIONS OF OPTICAL COATINGS - A NEWMETHOD, Thin solid films, 261(1-2), 1995, pp. 70-75

Authors: PISCHOW KA ADAMIK M BARNA PB KORHONEN AS
Citation: Ka. Pischow et al., CROSS-SECTION X-SCANNING FORCE MICROSCOPY ANALYSIS OF DIFFERENT HARD COATINGS AND THIN-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1716-1721

Authors: QIU H NAKAI H HASHIMOTO M SAFRAHN G ADAMIK M BARNA PB YAGI E
Citation: H. Qiu et al., EPITAXIAL-GROWTH AND CHARACTERIZATION OF NI FILMS GROWN ON MGO(001) BY BIASED DIRECT-CURRENT SPUTTER-DEPOSITION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(5), 1994, pp. 2855-2856

Authors: PISCHOW KA KORHONEN AS ADAMIK M BARNA PB
Citation: Ka. Pischow et al., ION-BEAM ETCHING TECHNIQUE IN THE PREPARATION OF SAMPLES FOR CROSS-SECTIONAL MICROSCOPY STUDIES OF THIN-FILMS AND HARD COATINGS, Surface & coatings technology, 67(1-2), 1994, pp. 95-104

Authors: KOVER L NEMETHY A BARNA PB ADAMIK M
Citation: L. Kover et al., SURFACE-STRUCTURE OF AL-SN LAYERED SYSTEMS CODEPOSITED IN THE PRESENCE OF OXYGEN, Surface and interface analysis, 22(1-12), 1994, pp. 314-317

Authors: QIU H KOSUGE A MARUYAMA H ADAMIK M SAFRAN G BARNA PB HASHIMOTO M
Citation: H. Qiu et al., EPITAXIAL-GROWTH, STRUCTURE AND PROPERTIES OF NI FILMS GROWN ON MGO(100) BY DC BIAS SPUTTER-DEPOSITION, Thin solid films, 241(1-2), 1994, pp. 9-11
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