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Results: 1-25 | 26-39 |
Results: 26-39/39
COMPREHENSIVE NEUROPSYCHOLOGICAL ANALYSIS OF EPILEPTIC CHILDREN WITH WISC-R, INCLUDING PROFILE ANALYSIS OF SUBTESTS
Authors: TAKAGI K MOROOKA K ARIMOTO K
Citation: K. Takagi et al., COMPREHENSIVE NEUROPSYCHOLOGICAL ANALYSIS OF EPILEPTIC CHILDREN WITH WISC-R, INCLUDING PROFILE ANALYSIS OF SUBTESTS, Epilepsia, 36, 1995, pp. 127-127
ADULT PATIENTS WITH EPILEPSY IN A PEDIATRIC OUTPATIENT-CLINIC
Authors: KANZAKI M ARIMOTO K MOROOKA K TAKAGI K HOSHINO K TADA H
Citation: M. Kanzaki et al., ADULT PATIENTS WITH EPILEPSY IN A PEDIATRIC OUTPATIENT-CLINIC, Epilepsia, 36, 1995, pp. 191-191
PROGNOSTIC-SIGNIFICANCE OF PROLONGED NEUROLOGICAL SYMPTOMS SUBSEQUENTTO FEBRILE SEIZURES
Authors: HOSHINO K MOROOKA K ARIMOTO K TAKAGI K KANZAKI M
Citation: K. Hoshino et al., PROGNOSTIC-SIGNIFICANCE OF PROLONGED NEUROLOGICAL SYMPTOMS SUBSEQUENTTO FEBRILE SEIZURES, Epilepsia, 36, 1995, pp. 223-223
COMPLEX PARTIAL STATUS EPILEPTICUS - CLINICAL CHARACTERISTICS INCLUDING ICTAL EEG
Authors: ARIMOTO K MOROOKA K TAKAGI K SEGAWA M HOSHINO K KANZAKI M
Citation: K. Arimoto et al., COMPLEX PARTIAL STATUS EPILEPTICUS - CLINICAL CHARACTERISTICS INCLUDING ICTAL EEG, Epilepsia, 36, 1995, pp. 225-226
A WELL-SYNCHRONIZED SENSING EQUALIZING METHOD FOR SUB-1.0-V OPERATINGADVANCED DRAMS
Authors: OOISHI T ASAKURA M TOMISHIMA S HIDAKA H ARIMOTO K FUJISHIMA K
Citation: T. Ooishi et al., A WELL-SYNCHRONIZED SENSING EQUALIZING METHOD FOR SUB-1.0-V OPERATINGADVANCED DRAMS, IEICE transactions on electronics, E77C(5), 1994, pp. 762-770
A WELL-SYNCHRONIZED SENSING EQUALIZING METHOD FOR SUB-1.0-V OPERATINGADVANCED DRAMS
Authors: OOISHI T ASAKURA M TOMISHIMA S HIDAKA H ARIMOTO K FUJISHIMA K
Citation: T. Ooishi et al., A WELL-SYNCHRONIZED SENSING EQUALIZING METHOD FOR SUB-1.0-V OPERATINGADVANCED DRAMS, IEEE journal of solid-state circuits, 29(4), 1994, pp. 432-440
AN EXPERIMENTAL 256-MB DRAM WITH BOOSTED SENSE-GROUND SCHEME
Authors: ASAKURA M OOISHI T TSUKUDE M TOMISHIMA S EIMORI T HIDAKA H OHNO Y ARIMOTO K FUJISHIMA K NISHIMURA T YOSHIHARA T
Citation: M. Asakura et al., AN EXPERIMENTAL 256-MB DRAM WITH BOOSTED SENSE-GROUND SCHEME, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1303-1309
AN EXPERIMENTAL 256-MB DRAM WITH BOOSTED SENSE-GROUND SCHEME
Authors: ASAKURA M OOISHI T TSUKUDE M TOMISHIMA S EIMORI T HIDAKA H OHNO Y ARIMOTO K FUJISHIMA K NISHIMURA T YOSHIHARA T
Citation: M. Asakura et al., AN EXPERIMENTAL 256-MB DRAM WITH BOOSTED SENSE-GROUND SCHEME, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1303-1309
AN SOI-DRAM WITH WIDE OPERATING VOLTAGE RANGE BY CMOS SIMOX TECHNOLOGY/
Authors: SUMA K TSURUDA T HIDAKA H EIMORI T OASHI T YAMAGUCHI Y IWAMATSU T HIROSE M MORISHITA F ARIMOTO K FUJISHIMA K INOUE Y NISHIMURA T YOSHIHARA T
Citation: K. Suma et al., AN SOI-DRAM WITH WIDE OPERATING VOLTAGE RANGE BY CMOS SIMOX TECHNOLOGY/, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1323-1329
AN SOI-DRAM WITH WIDE OPERATING VOLTAGE RANGE BY CMOS SIMOX TECHNOLOGY/
Authors: SUMA K TSURUDA T HIDAKA H EIMORI T OASHI T YAMAGUCHI Y IWAMATSU T HIROSE M MORISHITA F ARIMOTO K FUJISHIMA K INOUE Y NISHIMURA T YOSHIHARA T
Citation: K. Suma et al., AN SOI-DRAM WITH WIDE OPERATING VOLTAGE RANGE BY CMOS SIMOX TECHNOLOGY/, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1323-1329
A SMART DESIGN METHODOLOGY WITH DISTRIBUTED EXTRA GATE-ARRAYS FOR ADVANCED ULSI MEMORIES
Authors: TSUKUDE M ARIMOTO K ASAKURA M HIDAKA H FUJISHIMA K
Citation: M. Tsukude et al., A SMART DESIGN METHODOLOGY WITH DISTRIBUTED EXTRA GATE-ARRAYS FOR ADVANCED ULSI MEMORIES, IEICE transactions on electronics, E76C(11), 1993, pp. 1589-1594
A LINE-MODE TEST WITH DATA REGISTER FOR ULSI MEMORY ARCHITECTURE
Authors: OOISHI T TSUKUDE M ARIMOTO K MATSUDA Y FUJISHIMA K
Citation: T. Ooishi et al., A LINE-MODE TEST WITH DATA REGISTER FOR ULSI MEMORY ARCHITECTURE, IEICE transactions on electronics, E76C(11), 1993, pp. 1595-1603
HIGHLY RELIABLE TESTING OF ULSI MEMORIES WITH ON-CHIP VOLTAGE-DOWN CONVERTERS
Authors: TSUKUDE M ARIMOTO K HIDAKA H KONISHI Y HAYASHIKOSHI M SUMA K FUJISHIMA K
Citation: M. Tsukude et al., HIGHLY RELIABLE TESTING OF ULSI MEMORIES WITH ON-CHIP VOLTAGE-DOWN CONVERTERS, IEEE design & test of computers, 10(2), 1993, pp. 6-12
A NOTE OF THE SOLUBILITY OF CRYSTALLINE NEODYMIUM IODATE DIHYDRATE AND AMORPHOUS NEODYMIUM IODATE ANHYDRIDE IN WATER
Authors: MIYAMOTO H ARIMOTO K
Citation: H. Miyamoto et K. Arimoto, A NOTE OF THE SOLUBILITY OF CRYSTALLINE NEODYMIUM IODATE DIHYDRATE AND AMORPHOUS NEODYMIUM IODATE ANHYDRIDE IN WATER, Nippon kagaku kaishi, (5), 1993, pp. 623-627
Risultati: 1-25 | 26-39 |