Authors:
ARISTOV VV
GVOSDOVER RS
GOSTEV AV
RAU EI
SAVIN VO
Citation: Vv. Aristov et al., MODULATED MICROTOMOGRAPHY METHODS IN SEM - DEVELOPMENT AND NEW APPLICATIONS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 61(10), 1997, pp. 1959-1965
Citation: Vv. Aristov et al., CHARACTERISTICS AND EXAMPLES OF APPLICATI ONS OF TOROIDAL ENERGY ANALYZER IN RASTER ELECTRON-MICROSCOPY, Zurnal tehniceskoj fiziki, 66(10), 1996, pp. 172-181
Authors:
ARISTOV VV
DUBONOS SV
DYACHENKO RY
GAIFULLIN BN
MATVEEV VN
RAITH H
SVINTSOV AA
ZAITSEV SI
Citation: Vv. Aristov et al., 3-DIMENSIONAL DESIGN IN ELECTRON-BEAM LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2526-2528
Authors:
KUDRYASHOV VA
BORZENKO TB
KRASNOV VV
ARISTOV VV
Citation: Va. Kudryashov et al., NEW MICROLITHOGRAPHY TECHNOLOGIES BASED ON RESIST IRRADIATION BY LOW-ENERGY ELECTRONS, Microelectronic engineering, 23(1-4), 1994, pp. 307-310
Citation: Vv. Aristov et al., POSSIBILITIES AND FUTURE-TRENDS OF SCANNI NG SENSOR PROBE MULTISCAN, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(8), 1993, pp. 2-8
Authors:
ARISTOV VV
GOUREEV TE
NIKULIN AY
PETRASHEN PV
SNIGIREV AA
Citation: Vv. Aristov et al., POSSIBILITIES OF X-RAY INTERFERENCE DIFFRACTOMETRY FOR THE RECONSTRUCTION OF 2-DIMENSIONAL LATTICE DEFORMATION PROFILES IN CRYSTALS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 29-31