Authors:
Alexandrova, S
Dimitrov, K
Saboni, A
Boyadzhiev, L
Citation: S. Alexandrova et al., Selective recovery of silver from dilute polymetal solutions by rotating film pertraction, SEP PURIF T, 22-3(1-3), 2001, pp. 567-570
Citation: S. Kaschieva et S. Alexandrova, High energy electron irradiation of ion implanted MOS structures with different oxide thickness, NUCL INST B, 174(3), 2001, pp. 324-328
Citation: A. Szekeres et al., Study of thin SiO2 and its interface formed by thermal oxidation of rf hydrogen plasma-cleaned silicon, VACUUM, 61(2-4), 2001, pp. 263-268
Citation: S. Alexandrova, The changes in the centers of world power in the 1990s and their effects on Bulgarian culture (the USA and the USSR), BULG HIST, (1-2), 2000, pp. 173-177
Citation: A. Szekeres et al., Spectroscopic ellipsometry of oxides and interfaces thermally formed on (100)Si and (111)Si, SURF SCI, 454, 2000, pp. 402-406
Authors:
Salman, H
Bergman, M
Bessler, H
Alexandrova, S
Djaldetti, M
Citation: H. Salman et al., Ultrastructure and phagocytic activity of rat peritoneal macrophages exposed to low temperatures in vitro, CRYOBIOLOGY, 41(1), 2000, pp. 66-71
Authors:
Balland, L
Mouhab, N
Alexandrova, S
Cosmao, JM
Estel, L
Citation: L. Balland et al., Determination of kinetic and energetic parameters of chemical reactions ina heterogeneous liquid/liquid system, CHEM ENG TE, 22(4), 1999, pp. 321-329
Citation: A. Szekeres et al., Spectroscopic ellipsometry characterization of strained interface region in thermally oxidized Si(111), THIN SOL FI, 344, 1999, pp. 385-388
Citation: S. Alexandrova et A. Szekeres, Charged defects in wet SiO2/Si structure modified by RF oxygen plasma treatment, PHYS ST S-A, 171(2), 1999, pp. 487-493