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Results:
1-14
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Results: 14
Authors:
Remy, M
Alnot, P
Citation: M. Remy et P. Alnot, Untitled, VIDE, 56(300), 2001, pp. 199-200
Authors:
Pigeat, P
Benedic, F
Bonasso, N
Rouxel, D
Belmahi, M
Easwarakhanthan, T
Alnot, P
Weber, B
Citation: P. Pigeat et al., Synthesis of diamond films: Control in situ by emission interferometry, VIDE, 56(300), 2001, pp. 346
Authors:
Kruger, JK
Baller, J
le Coutre, A
Manglkammer, W
Britz, T
Hartmann, U
Alnot, P
Remy, M
Henkel, M
Citation: Jk. Kruger et al., A versatile method to characterize the mechanical and opticla properties of nano-and micro-structured CVD-diamond : Brillouin microscopy, VIDE, 56(300), 2001, pp. 375
Authors:
Assouar, MB
Benedic, F
Elmazria, O
Belmahi, M
Rioboo, RJ
Alnot, P
Citation: Mb. Assouar et al., MPACVD diamond films for surface acoustic wave filters, DIAM RELAT, 10(3-7), 2001, pp. 681-685
Authors:
Benedic, F
Belmahi, H
Easwarakhanthan, T
Alnot, P
Citation: F. Benedic et al., In situ optical characterization during MPACVD diamond film growth on silicon substrates using a bichromatic infrared pyrometer under oblique incidence, J PHYS D, 34(7), 2001, pp. 1048-1058
Authors:
de Poucques, L
Bougdira, J
Hugon, R
Henrion, G
Alnot, P
Citation: L. De Poucques et al., Time-resolved plasma diagnostics for a better understanding of the improvement of pulsed MWPACVD of diamond, J PHYS D, 34(6), 2001, pp. 896-904
Authors:
Kruger, JK
Embs, JP
Lukas, S
Hartmann, U
Brierley, CJ
Beck, CM
Jimenez, R
Alnot, P
Citation: Jk. Kruger et al., Hypersonic properties of nano- and microstructured CVD diamond, DIAM RELAT, 9(2), 2000, pp. 123-128
Authors:
Assouar, MB
Elmazria, O
Rioboo, RJ
Sarry, F
Alnot, P
Citation: Mb. Assouar et al., Modelling of SAW filter based on ZnO/diamond/Si layered structure including velocity dispersion, APPL SURF S, 164, 2000, pp. 200-204
Authors:
Elmazria, O
Bougdira, J
Chatei, H
De Pouques, L
Remy, M
Alnot, P
Citation: O. Elmazria et al., Influence of nitrogen incorporation on the electrical properties of MPCVD diamond films growth in CH4-CO2-N-2 and CH4-H-2-N-2 gas mixtures, THIN SOL FI, 374(1), 2000, pp. 27-33
Authors:
Kruger, JK
Embs, JP
Lukas, S
Hartmann, U
Brierley, CJ
Beck, CM
Jimenez, R
Alnot, P
Durand, O
Citation: Jk. Kruger et al., Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy, J APPL PHYS, 87(1), 2000, pp. 74-77
Authors:
Easwarakhanthan, T
Alnot, P
Citation: T. Easwarakhanthan et P. Alnot, Simultaneous measurement of film and substrate optical parameters from multiple sample single wavelength ellipsometric data, EPJ-APPL PH, 6(3), 1999, pp. 285-292
Authors:
Chatei, H
Bougdira, J
Remy, M
Alnot, P
Citation: H. Chatei et al., Optical emission diagnostics of permanent and pulsed microwave discharges in H-2-CH4-N-2 for diamond deposition, SURF COAT, 119, 1999, pp. 1233-1237
Authors:
Rioboo, RJJ
Calzada, ML
Kruger, JK
Alnot, P
Citation: Rjj. Rioboo et al., Elastic properties by Brillouin spectroscopy of sol-gel (Pb,Ca)TiO3 films, J APPL PHYS, 85(10), 1999, pp. 7349-7354
Authors:
Easwarakhanthan, T
Alnot, P
Citation: T. Easwarakhanthan et P. Alnot, Measurement of the interface layer thickness in SiO2/Si structures by single-wavelength null ellipsometry, SURF INT AN, 26(13), 1998, pp. 1008-1015
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1-14
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