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Results: 1-25 | 26-32
Results: 1-25/32
FLUENCE AND CURRENT-DENSITY DEPENDENCE OF SILVER NANOCLUSTER DIMENSIONS IN ION-IMPLANTED FUSED-SILICA
Authors: ANTONELLO M ARNOLD GW BATTAGLIN G BERTONCELLO R CATTARUZZA E COLOMBO P MATTEI G MAZZOLDI P TRIVILLIN F
Citation: M. Antonello et al., FLUENCE AND CURRENT-DENSITY DEPENDENCE OF SILVER NANOCLUSTER DIMENSIONS IN ION-IMPLANTED FUSED-SILICA, Journal of materials chemistry, 8(2), 1998, pp. 457-461
SILVER NANOCLUSTER FORMATION IN SILICA COATINGS BY THE SOL-GEL ROUTE
Authors: ARMELAO L BERTONCELLO R DEDOMINICIS M
Citation: L. Armelao et al., SILVER NANOCLUSTER FORMATION IN SILICA COATINGS BY THE SOL-GEL ROUTE, Advanced materials, 9(9), 1997, pp. 736-741
SURFACE AND BULK CHARACTERIZATION OF RH ZRO2 PREPARED BY ABSORPTION OF RH-4(CO)(12) CLUSTERS ON ZRO2 POWDER/
Authors: DEPERO LE BERTONCELLO R BONI T LEVRANGI P SORA IN TEMPESTI E PARMIGIANI F
Citation: Le. Depero et al., SURFACE AND BULK CHARACTERIZATION OF RH ZRO2 PREPARED BY ABSORPTION OF RH-4(CO)(12) CLUSTERS ON ZRO2 POWDER/, Journal of materials research, 12(5), 1997, pp. 1376-1384
PARAMAGNETIC DEFECTS INDUCED BY ION-IMPLANTATION IN OXIDE GLASSES
Authors: BOGOMOLOVA LD JACHKIN VA PRUSHINSKY SA DIMITRIEV SA STEFANOVSKY SV TEPLYAKOV YG CACCAVALE F CATTARUZZA E BERTONCELLO R TRIVILLIN F
Citation: Ld. Bogomolova et al., PARAMAGNETIC DEFECTS INDUCED BY ION-IMPLANTATION IN OXIDE GLASSES, Journal of non-crystalline solids, 210(2-3), 1997, pp. 101-118
AN EXPERIMENTAL AND THEORETICAL-STUDY OF THE ELECTRONIC-STRUCTURE OF ZINC THIOPHENOLATE-CAPPED CLUSTERS
Authors: BERTONCELLO R BETTINELLI M CASARIN M MACCATO C PANDOLFO L VITTADINI A
Citation: R. Bertoncello et al., AN EXPERIMENTAL AND THEORETICAL-STUDY OF THE ELECTRONIC-STRUCTURE OF ZINC THIOPHENOLATE-CAPPED CLUSTERS, Inorganic chemistry, 36(21), 1997, pp. 4707-4716
CHROMIUM IMPLANTATION IN SILICA GLASS
Authors: CATTARUZZA E BERTONCELLO R TRIVILLIN F MAZZOLDI P BATTAGLIN G MIRENGHI L ROTOLO P
Citation: E. Cattaruzza et al., CHROMIUM IMPLANTATION IN SILICA GLASS, Journal of materials research, 11(1), 1996, pp. 229-235
THE WALL CONDITIONING TECHNIQUES IN RFX
Authors: SONATO P BAKER WR FLORENTIN P MARCHIORI G ZACCARIA P ZOLLINO G ANTONI V BAGATIN M DESIDERI D SERIANNI G TRAMONTIN L BERTONCELLO R
Citation: P. Sonato et al., THE WALL CONDITIONING TECHNIQUES IN RFX, Vacuum, 47(6-8), 1996, pp. 977-980
XRD, XPS AND SIMS INVESTIGATIONS ON ELECTRODEPOSITED NICKEL-PHOSPHORUS ALLOY COATINGS
Authors: HASEEB ASMA CHAKRABORTY P AHMED I CACCAVALE F BERTONCELLO R
Citation: Asma. Haseeb et al., XRD, XPS AND SIMS INVESTIGATIONS ON ELECTRODEPOSITED NICKEL-PHOSPHORUS ALLOY COATINGS, Thin solid films, 283(1-2), 1996, pp. 140-144
CHEMICAL-VAPOR-DEPOSITION AND CHARACTERIZATION OF GALLIUM OXIDE THIN-FILMS
Authors: BATTISTON GA GERBASI R PORCHIA M BERTONCELLO R CACCAVALE F
Citation: Ga. Battiston et al., CHEMICAL-VAPOR-DEPOSITION AND CHARACTERIZATION OF GALLIUM OXIDE THIN-FILMS, Thin solid films, 279(1-2), 1996, pp. 115-118
BORONIZATION WITH TRIMETHYLBORON IN THE REVERSED-FIELD PINCH RFX
Authors: SONATO P ANTONI V BAKER WR BERTONCELLO R BUFFA A CARRARO L COSTA S DELLAMEA G MARRELLI L MURARI A PUIATTI ME RIGATO V SCARIN P TRAMONTIN L VALISA M ZANDOLIN S
Citation: P. Sonato et al., BORONIZATION WITH TRIMETHYLBORON IN THE REVERSED-FIELD PINCH RFX, Journal of nuclear materials, 227(3), 1996, pp. 259-265
INTERACTION OF HIGH-POWER LASER-LIGHT WITH SILVER NANOCLUSTER COMPOSITE GLASSES
Authors: GONELLA F MATTEI G MAZZOLDI P CATTARUZZA E ARNOLD GW BATTAGLIN G CALVELLI P POLLONI R BERTONCELLO R HAGLUND RF
Citation: F. Gonella et al., INTERACTION OF HIGH-POWER LASER-LIGHT WITH SILVER NANOCLUSTER COMPOSITE GLASSES, Applied physics letters, 69(20), 1996, pp. 3101-3103
CATHODIC DEPOSITION OF TERNARY IN-X(AS+SB ALLOYS AND FORMATION OF INASXSB1)
Authors: CATTARIN S MUSIANI MM CASELLATO U GUERRIERO P BERTONCELLO R
Citation: S. Cattarin et al., CATHODIC DEPOSITION OF TERNARY IN-X(AS+SB ALLOYS AND FORMATION OF INASXSB1), Journal of electroanalytical chemistry [1992], 380(1-2), 1995, pp. 209-218
XPS AND UV-VIS STUDY OF HIGH-PURITY FE2O3 THIN-FILMS OBTAINED USING THE SOL-GEL TECHNIQUE
Authors: ARMELAO L BERTONCELLO R CROCIANI L DEPAOLI G GRANOZZI G TONDELLO E BETTINELLI M
Citation: L. Armelao et al., XPS AND UV-VIS STUDY OF HIGH-PURITY FE2O3 THIN-FILMS OBTAINED USING THE SOL-GEL TECHNIQUE, Journal of materials chemistry, 5(1), 1995, pp. 79-83
AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SURFACE-COMPOSITION OF COXFE80-XSI10B10 METALLIC GLASSES
Authors: GLISENTI A BERTONCELLO R CASARIN M MARCOLIN D GRANOZZI G BARICCO M ANGELINI E
Citation: A. Glisenti et al., AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SURFACE-COMPOSITION OF COXFE80-XSI10B10 METALLIC GLASSES, Journal of alloys and compounds, 226(1-2), 1995, pp. 213-221
X-RAY PHOTOELECTRON-SPECTROSCOPY INVESTIGATION OF PUMICE-SUPPORTED NICKEL-CATALYSTS
Authors: VENEZIA AM BERTONCELLO R DEGANELLO G
Citation: Am. Venezia et al., X-RAY PHOTOELECTRON-SPECTROSCOPY INVESTIGATION OF PUMICE-SUPPORTED NICKEL-CATALYSTS, Surface and interface analysis, 23(4), 1995, pp. 239-247
THE BINDING-ENERGIES OF VARIOUS COMPONENTS IN A BISMUTH-BASED CUPRATESUPERCONDUCTOR
Authors: CHAKRABORTY P CACCAVALE F LORUSSO S BERTONCELLO R
Citation: P. Chakraborty et al., THE BINDING-ENERGIES OF VARIOUS COMPONENTS IN A BISMUTH-BASED CUPRATESUPERCONDUCTOR, Journal of non-crystalline solids, 193, 1995, pp. 170-174
CHEMICAL ASPECTS IN COPPER-IMPLANTED FUSED-SILICA AND SODA-LIME GLASSES
Authors: BERTONCELLO R TRIVILLIN F CATTARUZZA E MAZZOLDI P ARNOLD GW BATTAGLIN G CATALANO M
Citation: R. Bertoncello et al., CHEMICAL ASPECTS IN COPPER-IMPLANTED FUSED-SILICA AND SODA-LIME GLASSES, Journal of applied physics, 77(3), 1995, pp. 1294-1300
STUDIES OF BINDING-ENERGIES OF VARIOUS COMPONENTS IN BISMUTH-BASED CUPRATE SUPERCONDUCTORS THROUGH SECONDARY-ION MASS-SPECTROMETRY AND X-RAY PHOTOELECTRON-SPECTROSCOPY
Authors: RAJASEKAR P RAY N DEY SD BANDYOPADHYAY SK BARAT P SEN PT CHAKRABORTY P CACCAVALE F BERTONCELLO R
Citation: P. Rajasekar et al., STUDIES OF BINDING-ENERGIES OF VARIOUS COMPONENTS IN BISMUTH-BASED CUPRATE SUPERCONDUCTORS THROUGH SECONDARY-ION MASS-SPECTROMETRY AND X-RAY PHOTOELECTRON-SPECTROSCOPY, Journal of applied physics, 77(1), 1995, pp. 343-349
SURFACE CHARACTERIZATION OF CULNS(2) WITH LAMELLAR MORPHOLOGY
Authors: CATTARIN S PAGURA C ARMELAO L BERTONCELLO R DIETZ N
Citation: S. Cattarin et al., SURFACE CHARACTERIZATION OF CULNS(2) WITH LAMELLAR MORPHOLOGY, Journal of the Electrochemical Society, 142(8), 1995, pp. 2818-2823
GROWTH OF 2-LAYER AND COPOLYMER POLYOXYPHENYLENE COATINGS - AN ELECTROCHEMICAL AND XPS INVESTIGATION
Authors: BERTONCELLO R FURLANETTO F GLISENTI A MUSIANI MM
Citation: R. Bertoncello et al., GROWTH OF 2-LAYER AND COPOLYMER POLYOXYPHENYLENE COATINGS - AN ELECTROCHEMICAL AND XPS INVESTIGATION, Journal of the Electrochemical Society, 142(2), 1995, pp. 410-416
FORMATION OF AMORPHOUS SILICIDE NANOCLUSTERS IN CHROMIUM-IMPLANTED AND TITANIUM-IMPLANTED SILICA
Authors: CATTARUZZA E MATTEI G MAZZOLDI P BERTONCELLO R BATTAGLIN G MIRENGHI L
Citation: E. Cattaruzza et al., FORMATION OF AMORPHOUS SILICIDE NANOCLUSTERS IN CHROMIUM-IMPLANTED AND TITANIUM-IMPLANTED SILICA, Applied physics letters, 67(19), 1995, pp. 2884-2886
ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY CONTRIBUTION TO ELUCIDATION OF THE MECHANISM OF CATHODIC DEPOSITION OF AS-SB ALLOYS
Authors: BERTONCELLO R GLISENTI A GRANOZZI G MUSIANI MM
Citation: R. Bertoncello et al., ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY CONTRIBUTION TO ELUCIDATION OF THE MECHANISM OF CATHODIC DEPOSITION OF AS-SB ALLOYS, Journal of electroanalytical chemistry [1992], 374(1-2), 1994, pp. 37-43
HIGH-PURITY WO3 SOL-GEL COATINGS - SYNTHESIS AND CHARACTERIZATION
Authors: ARMELAO L BERTONCELLO R GRANOZZI G DEPAOLI G TONDELLO E BATTAGLIN G
Citation: L. Armelao et al., HIGH-PURITY WO3 SOL-GEL COATINGS - SYNTHESIS AND CHARACTERIZATION, Journal of materials chemistry, 4(3), 1994, pp. 407-411
QUANTITATIVE ARXPS DEPTH PROFILING CHARACTERIZATION OF NATIVE OXIDES GROWN ON IN0.53GA0.47AS(100) SINGLE-CRYSTALS
Authors: DALCOLLE M BERTONCELLO R TONDELLO E
Citation: M. Dalcolle et al., QUANTITATIVE ARXPS DEPTH PROFILING CHARACTERIZATION OF NATIVE OXIDES GROWN ON IN0.53GA0.47AS(100) SINGLE-CRYSTALS, Journal of electron spectroscopy and related phenomena, 70(2), 1994, pp. 129-143
A STUDY OF SPUTTERED FE-AL MULTILAYERS AND THEIR STABILITY AT 400-K IN AN OXIDIZING ATMOSPHERE
Authors: CARBUCICCHIO M PALOMBARINI G BERTONCELLO R GLISENTI A TONDELLO E SBERVEGLIERI G GROPPELLI S
Citation: M. Carbucicchio et al., A STUDY OF SPUTTERED FE-AL MULTILAYERS AND THEIR STABILITY AT 400-K IN AN OXIDIZING ATMOSPHERE, Journal of magnetism and magnetic materials, 133(1-3), 1994, pp. 504-507
Risultati: 1-25 | 26-32