AAAAAA
Results:
1-18
|
Results: 18
Authors:
Baik, KH
Grant, PS
Citation: Kh. Baik et Ps. Grant, Chemical interaction between sigma 1140+SiC fibre and Ti-6Al-4V, SCR MATER, 44(4), 2001, pp. 607-612
Authors:
Baik, KH
Park, PY
Gila, BP
Shin, JH
Abernathy, CR
Norasetthekul, S
Luo, B
Ren, F
Lambers, ES
Pearton, SJ
Citation: Kh. Baik et al., Comparison of plasma etch chemistries for MgO, APPL SURF S, 183(1-2), 2001, pp. 26-32
Authors:
Baik, KH
Kim, IG
Citation: Kh. Baik et Ig. Kim, Optimal punishment when individuals may learn deviant values, INT REV LAW, 21(3), 2001, pp. 271-285
Authors:
Baik, KH
Lee, S
Citation: Kh. Baik et S. Lee, Strategic groups and rent dissipation, ECON INQ, 39(4), 2001, pp. 672-684
Authors:
Baik, KH
Kim, IG
Na, SY
Citation: Kh. Baik et al., Bidding for a group-specific public-good prize, J PUBLIC EC, 82(3), 2001, pp. 415-429
Authors:
Baik, KH
Park, PY
Luo, B
Lee, KP
Shin, JH
Abernathy, CR
Hobson, WS
Pearton, SJ
Ren, F
Citation: Kh. Baik et al., Effect of PECVD of SiO2 passivation layers on GaN and InGaP, SOL ST ELEC, 45(12), 2001, pp. 2093-2096
Authors:
Luo, B
Johnson, JW
Ren, F
Baik, KH
Pearton, SJ
Citation: B. Luo et al., Electrical effects of plasma enhanced chemical vapor deposition of SiNx onGaAs Schottky rectifiers, J APPL PHYS, 90(9), 2001, pp. 4800-4804
Authors:
Kim, SM
Kim, SJ
Bang, CJ
Ham, YM
Baik, KH
Citation: Sm. Kim et al., Optimization of dipole off-axis illumination by 1st-order efficiency method for sub-120 nm node with KrF lithography, JPN J A P 1, 39(12B), 2000, pp. 6777-6780
Authors:
Jung, MH
Hong, SE
Jung, JC
Lee, G
Baik, KH
Citation: Mh. Jung et al., Novel organic bottom antireflective coating materials for 193 nm lithography, JPN J A P 1, 39(12B), 2000, pp. 6961-6965
Authors:
Baik, KH
Lee, S
Citation: Kh. Baik et S. Lee, Two-stage rent-seeking contests with carryovers, PUBL CHOICE, 103(3-4), 2000, pp. 285-296
Authors:
Kim, HS
Kim, HG
Kim, MS
Baik, KH
Citation: Hs. Kim et al., Effects of resist thickness and substrate reflectance on critical dimension bias of isolated-dense pattern, JPN J A P 1, 38(2A), 1999, pp. 724-728
Authors:
Kim, CK
Hur, C
Kim, YS
Baik, KH
Choi, IH
Citation: Ck. Kim et al., Highly accurate cell projection mask for applications to sub-130 nm patterning, J VAC SCI B, 17(6), 1999, pp. 3149-3153
Authors:
Baik, KH
Grant, PS
Citation: Kh. Baik et Ps. Grant, Microstructural evaluation of monolithic and continuous fibre reinforced Al-12wt.%Si produced by low pressure plasma spraying, MAT SCI E A, 265(1-2), 1999, pp. 77-86
Authors:
Baik, KH
Citation: Kh. Baik, Rent-seeking firms, consumer groups, and the social costs of monopoly, ECON INQ, 37(3), 1999, pp. 541-553
Authors:
Baik, KH
Cherry, TL
Kroll, S
Shogren, JF
Citation: Kh. Baik et al., Endogenous timing in a gaming tournament, THEOR DECIS, 47(1), 1999, pp. 1-21
Authors:
Ham, YM
Baik, KH
Lee, WG
Chung, TD
Chun, K
Citation: Ym. Ham et al., Application of a new empirical model to the electron beam lithography process with chemically amplified resists, JPN J A P 1, 37(12B), 1998, pp. 6761-6766
Authors:
Kim, JS
Choi, CI
Kim, MS
Bok, CK
Kim, HS
Baik, KH
Citation: Js. Kim et al., Implementation of sub-150 nm contact hole pattern by resist flow process, JPN J A P 1, 37(12B), 1998, pp. 6863-6868
Authors:
Jung, MH
Jung, JC
Lee, G
Baik, KH
Citation: Mh. Jung et al., Synthesis and characterization of alicyclic polymers with hydrophilic groups for 193 nm single-layer resist, JPN J A P 1, 37(12B), 1998, pp. 6888-6893
Risultati:
1-18
|