Authors:
Street, SC
Rar, A
Zhou, JN
Liu, WJ
Barnard, JA
Citation: Sc. Street et al., Unique structural and mechanical properties of ultrathin au films grown ondendrimer-mediated substrates, CHEM MATER, 13(10), 2001, pp. 3669-3677
Authors:
Wu, TW
Deline, V
Scharf, TW
Yen, BK
Barnard, JA
Citation: Tw. Wu et al., Wear of ultrathin carbon overcoat characterized by microwear scan and Auger electron spectroscopy, J VAC SCI A, 19(3), 2001, pp. 986-992
Authors:
Wei, G
Scharf, TW
Zhou, JN
Huang, F
Weaver, ML
Barnard, JA
Citation: G. Wei et al., Nanotribology studies of Cr, Cr2N and CrN thin films using constant and ramped load nanoscratch techniques, SURF COAT, 146, 2001, pp. 357-362
Authors:
Yan, SS
Barnard, JA
Xu, FT
Weston, JL
Zangari, G
Citation: Ss. Yan et al., Critical dimension of the transition from single switching to an exchange spring process in hard/soft exchange-coupled bilayers - art. no. 184403, PHYS REV B, 6418(18), 2001, pp. 4403
Authors:
Scharf, TW
Wu, TW
Yen, BK
Marchon, B
Barnard, JA
Citation: Tw. Scharf et al., Mechanical strength and wear resistance of 5 nm IBD carbon overcoats for magnetic disks, IEEE MAGNET, 37(4), 2001, pp. 1792-1794
Citation: Wj. Liu et al., X-ray reflectivity and nanotribological study of deposition-energy-dependent thin CNx overcoats on CoCr magnetic films, APPL PHYS L, 78(10), 2001, pp. 1427-1429
Citation: Tw. Scharf et Ja. Barnard, Coverage and mechanical wear assessment of 25-and 50-angstrom thick, dual ion-beam deposited, and magnetron-sputtered protective overcoats, J INF S P S, 2(3), 2000, pp. 185-192
Authors:
Byeon, SC
Rantschler, J
Alexander, C
Doyle, WD
Barnard, JA
Minor, K
Citation: Sc. Byeon et al., Dynamic measurement of the thermal stability of the magnetic anisotropy inFeTaN films, J APPL PHYS, 87(9), 2000, pp. 5849-5851