Citation: Cc. Ling et al., Defect study of Zn-doped p-type gallium antimonide using positron lifetimespectroscopy - art. no. 075201, PHYS REV B, 6407(7), 2001, pp. 5201
Authors:
Xu, XL
Liu, HT
Shi, CS
Zhao, YW
Fung, S
Beling, CD
Citation: Xl. Xu et al., Residual donors and compensation in metalorganic chemical vapor depositionas-grown n-GaN, J APPL PHYS, 90(12), 2001, pp. 6130-6134
Authors:
Ling, CC
Beling, CD
Gong, M
Chen, XD
Fung, S
Citation: Cc. Ling et al., Recent advances in defect characterization in 6H-SiC using Deep Level Transient Spectroscopy and Positron Annihilation Spectroscopy, DEFECT DIFF, 183-1, 2000, pp. 1-23
Authors:
Zou, X
Chan, YC
Webb, DP
Lam, YW
Hu, YF
Beling, CD
Fung, S
Weng, HM
Citation: X. Zou et al., Photoinduced dehydrogenation of defects in undoped a-Si : H using positronannihilation spectroscopy, PHYS REV L, 84(4), 2000, pp. 769-772
Authors:
Xu, XL
Beling, CD
Fung, S
Zhao, YW
Sun, NF
Sun, TN
Zhang, QL
Zhan, HH
Sun, BQ
Wang, JN
Ge, WK
Wong, PC
Citation: Xl. Xu et al., Formation mechanism of a degenerate thin layer at the interface of a GaN/sapphire system, APPL PHYS L, 76(2), 2000, pp. 152-154
Authors:
Beling, CD
Fung, S
Ming, L
Gong, M
Panda, K
Citation: Cd. Beling et al., A theoretical search for possible high efficiency semiconductor based field assisted positron moderators, APPL SURF S, 149(1-4), 1999, pp. 253-259
Authors:
Ling, CC
Shek, YF
Huang, AP
Fung, S
Beling, CD
Citation: Cc. Ling et al., Electric-field distribution in Au-semi-insulating GaAs contact investigated by positron-lifetime technique, PHYS REV B, 59(8), 1999, pp. 5751-5758
Authors:
Fleischer, S
Surya, C
Hu, YF
Beling, CD
Fung, S
Smith, TL
Moulding, KM
Missous, M
Citation: S. Fleischer et al., A study of the vacancy-defect distribution in a GaAs/AlxGa1-xAs multi-layer structure grown at low temperature, J CRYST GR, 196(1), 1999, pp. 53-61
Citation: M. Gong et al., A deep level transient spectroscopy study of electron irradiation induced deep levels in p-type 6H-SiC, J APPL PHYS, 85(10), 1999, pp. 7120-7122
Authors:
Beling, CD
LiMing, W
Shan, YY
Cheung, SH
Fung, S
Panda, BK
Seitsonen, AP
Citation: Cd. Beling et al., On the possible identification of defects using the autocorrelation function approach in double Doppler broadening of annihilation radiation spectroscopy, J PHYS-COND, 10(46), 1998, pp. 10475-10492