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Results: 1-23 |
Results: 23

Authors: Carchon, G Vaesen, K Brebels, S De Raedt, W Beyne, E Nauwelaers, B
Citation: G. Carchon et al., Multilayer thin-film MCM-D for the integration of high-performance RF and microwave circuits, IEEE T COMP, 24(3), 2001, pp. 510-519

Authors: Iacopi, F Devroede, O Pins, R Van Hoof, R Honore, M Zhukov, V Van Lancker, L Van Doninck, W Beyne, E
Citation: F. Iacopi et al., An optimized process for the production of advanced planar wire grid plates as detectors for high energy physics experiments, SENS ACTU-A, 93(1), 2001, pp. 76-83

Authors: Carchon, G Nauwelaers, B Pieters, P Vaesen, K De Raedt, W Beyne, E
Citation: G. Carchon et al., Multi-layer thin-film MCM-D for the integration of high performance wireless front-end systems, MICROWAVE J, 44(2), 2001, pp. 96

Authors: Driessens, E Van Dooren, S Vandevelde, B Degryse, D Beyne, E Heerman, M Van Puymbroeck, J
Citation: E. Driessens et al., Parametric compact models for the 72-pins polymer stud grid array (TM), MICROELEC J, 32(10-11), 2001, pp. 839-846

Authors: Pieters, P Vaesen, K Brebels, S Mahmoud, SF De Raedt, W Beyne, E Mertens, RP
Citation: P. Pieters et al., Accurate modeling of high-Q spiral inductors in thin-film multilayer technology for wireless telecommunication applications, IEEE MICR T, 49(4), 2001, pp. 589-599

Authors: Leseduarte, S Marco, S Beyne, E Van Hoof, R Marty, A Pinel, S Vendier, O Coello-Vera, A
Citation: S. Leseduarte et al., Residual thermomechanical stresses in thinned-chip assemblies, IEEE T COMP, 23(4), 2000, pp. 673-679

Authors: Van Dooren, S Vandevelde, B Beyne, E Christiaens, F Corlatan, D
Citation: S. Van Dooren et al., Parametric compact models for flip chip assemblies, IEEE T COMP, 23(3), 2000, pp. 555-561

Authors: Vandevelde, B Beyne, E
Citation: B. Vandevelde et E. Beyne, Improved thermal fatigue reliability for flip chip assemblies using redistribution techniques, IEEE T AD P, 23(2), 2000, pp. 239-246

Authors: Soliman, EA Vandenbosch, GAE Beyne, E
Citation: Ea. Soliman et al., Galerkin versus razor-blade testing in the method of moments formulation for multiconductor transmission lines, INT J RF MI, 10(2), 2000, pp. 132-138

Authors: Tilmans, HAC Van de Peer, MDJ Beyne, E
Citation: Hac. Tilmans et al., The indent reflow sealing (IRS) technique - A method for the fabrication of sealed cavities for MEMS devices, J MICROEL S, 9(2), 2000, pp. 206-217

Authors: Ruythooren, W Attenborough, K Beerten, S Merken, P Fransaer, J Beyne, E Van Hoof, C De Boeck, J Celis, JP
Citation: W. Ruythooren et al., Electrodeposition for the synthesis of microsystems, J MICROM M, 10(2), 2000, pp. 101-107

Authors: Soliman, EA Brebels, S Vandenbosch, GAE Beyne, E
Citation: Ea. Soliman et al., Antenna arrays in MCM-D technology fed by coplanar CPW networks, IEEE MICR T, 48(6), 2000, pp. 1065-1068

Authors: Donnay, S Pieters, P Vaesen, K Diels, W Wambacq, P De Raedt, W Beyne, E Engels, M Bolsens, I
Citation: S. Donnay et al., Chip-package codesign of a low-power 5-GHz RF front end, P IEEE, 88(10), 2000, pp. 1583-1597

Authors: Soliman, EA Brebels, S Beyne, E Vandenbosch, GAE
Citation: Ea. Soliman et al., 2 x 2 and 4 x 4 arrays of annular slot antennas in MCM-D technology fed bycoplanar CPW networks, IEE P-MIC A, 146(5), 1999, pp. 335-338

Authors: Soliman, EA Brebels, S Beyne, E Vandenbosch, GAE
Citation: Ea. Soliman et al., CPW-fed cusp antenna, MICROW OPT, 22(4), 1999, pp. 288-290

Authors: Van Olmen, J Manca, JV De Ceuninck, W De Schepper, L D'Haeger, V Witvrouw, A Maex, K Vandevelde, B Beyne, E Tielemans, L
Citation: J. Van Olmen et al., The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique, MICROEL REL, 39(11), 1999, pp. 1657-1665

Authors: Becks, KH Beyne, E Ehrmann, O Gerlach, P Gregor, IM Pieters, P Topper, M Truzzi, C Wolf, J
Citation: Kh. Becks et al., A MCM-D-type module for the ATLAS pixel detector, IEEE NUCL S, 46(6), 1999, pp. 1861-1864

Authors: Soliman, EA Pieters, P Beyne, E Vandenbosch, GAE
Citation: Ea. Soliman et al., Numerically efficient spatial-domain moment method for multislot transmission lines in layered media - Application to multislot lines in MCM-D technology, IEEE MICR T, 47(9), 1999, pp. 1782-1787

Authors: Pieters, P Brebels, S Beyne, E Mertens, RP
Citation: P. Pieters et al., Generalized analysis of coupled lines in multilayer microwave MCM-D technology - Application integrated coplanar Lange couplers, IEEE MICR T, 47(9), 1999, pp. 1863-1872

Authors: Soliman, EA Brebels, S Delmotte, P Vandenbosch, GAE Beyne, E
Citation: Ea. Soliman et al., Bow-tie slot antenna fed by CPW, ELECTR LETT, 35(7), 1999, pp. 514-515

Authors: Soliman, EA Brebels, S Beyne, E Vandenbosch, GAE
Citation: Ea. Soliman et al., Circularly polarised aperture antenna fed by CPW and built in MCM-D technology, ELECTR LETT, 35(4), 1999, pp. 250-251

Authors: Christiaens, F Vandevelde, B Beyne, E Mertens, R Berghmans, J
Citation: F. Christiaens et al., A generic methodology for deriving compact dynamic thermal models, appliedto the PSGA package, IEEE COM A, 21(4), 1998, pp. 565-576

Authors: Soliman, EA Pieter, P Beyne, E Vandenbosch, GAE
Citation: Ea. Soliman et al., Suppression of the parasitic modes in CPW discontinuities using MCM-D technology - Application to a novel 3-dB power splitter, IEEE MICR T, 46(12), 1998, pp. 2426-2430
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