Citation: Yq. Fu et Nka. Bryan, Experimental study of microcylindrical lenses fabricated using focused-ion-beam technology, J VAC SCI B, 19(4), 2001, pp. 1259-1263
Citation: Yq. Fu et al., Characterization of focused ion beam induced deposition process and parameters calibration, SENS ACTU-A, 88(1), 2001, pp. 58-66
Citation: Yq. Fu et al., Investigation of submicron linewidth direct deposition for high-density ICchip modification by focused ion beam, INT J ADV M, 17(11), 2001, pp. 835-839
Citation: Yq. Fu et Nka. Bryan, Hybrid microdiffractive-microrefractive lens with a continuous relief fabricated by use of focused-ion-beam milling for single-mode fiber coupling, APPL OPTICS, 40(32), 2001, pp. 5872-5876
Citation: Yq. Fu et al., Diffractive optical elements with continuous relief fabricated by focused ion beam for monomode fiber coupling, OPT EXPRESS, 7(3), 2000, pp. 141-147
Citation: Yq. Fu et al., Influence of the redeposition effect for focused ion beam 3D micromachining in silicon, INT J ADV M, 16(12), 2000, pp. 877-880
Citation: Yq. Fu et Nka. Bryan, Investigation of integrated diffractive/refractive microlens microfabricated by focused ion beam, REV SCI INS, 71(6), 2000, pp. 2263-2266
Citation: Yq. Fu et al., Calibration of etching uniformity for large aperture multilevel diffractive optical element by ion beam etching, REV SCI INS, 71(2), 2000, pp. 1009-1011