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Results: 1-24 |
Results: 24
Spintronics: A spin-based electronics vision for the future
Authors: Wolf, SA Awschalom, DD Buhrman, RA Daughton, JM von Molnar, S Roukes, ML Chtchelkanova, AY Treger, DM
Citation: Sa. Wolf et al., Spintronics: A spin-based electronics vision for the future, SCIENCE, 294(5546), 2001, pp. 1488-1495
Ballistic current transport studies of ferromagnetic multilayer films and tunnel junctions (invited)
Authors: Rippard, WH Perrella, AC Buhrman, RA
Citation: Wh. Rippard et al., Ballistic current transport studies of ferromagnetic multilayer films and tunnel junctions (invited), J APPL PHYS, 89(11), 2001, pp. 6642-6646
Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy
Authors: Plisch, MJ Chang, JL Silcox, J Buhrman, RA
Citation: Mj. Plisch et al., Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy, APPL PHYS L, 79(3), 2001, pp. 391-393
Ballistic electron microscopy study of ultrathin oxidized aluminum barriers for magnetic tunnel junctions
Authors: Rippard, WH Perrella, AC Buhrman, RA
Citation: Wh. Rippard et al., Ballistic electron microscopy study of ultrathin oxidized aluminum barriers for magnetic tunnel junctions, APPL PHYS L, 78(11), 2001, pp. 1601-1603
Ballistic-electron-emission microscopy of conduction-electron surface states
Authors: Weilmeier, MK Rippard, WH Buhrman, RA
Citation: Mk. Weilmeier et al., Ballistic-electron-emission microscopy of conduction-electron surface states, PHYS REV B, 61(11), 2000, pp. 7161-7164
Spin-dependent hot electron transport in Co/Cu thin films
Authors: Rippard, WH Buhrman, RA
Citation: Wh. Rippard et Ra. Buhrman, Spin-dependent hot electron transport in Co/Cu thin films, PHYS REV L, 84(5), 2000, pp. 971-974
Current-driven magnetization reversal and spin-wave excitations in Co/Cu/Co pillars
Authors: Katine, JA Albert, FJ Buhrman, RA Myers, EB Ralph, DC
Citation: Ja. Katine et al., Current-driven magnetization reversal and spin-wave excitations in Co/Cu/Co pillars, PHYS REV L, 84(14), 2000, pp. 3149-3152
Ballistic electron magnetic microscopy studies of magnetization reversal in Co/Cu/Co trilayer films
Authors: Rippard, WH Buhrman, RA
Citation: Wh. Rippard et Ra. Buhrman, Ballistic electron magnetic microscopy studies of magnetization reversal in Co/Cu/Co trilayer films, J APPL PHYS, 87(9), 2000, pp. 6490-6492
Point-contact studies of current-controlled domain switching in magnetic multilayers
Authors: Myers, EB Ralph, DC Katine, JA Albert, FJ Buhrman, RA
Citation: Eb. Myers et al., Point-contact studies of current-controlled domain switching in magnetic multilayers, J APPL PHYS, 87(9), 2000, pp. 5502-5504
Observation of magnetization reversal of thin-film permalloy nanostructures using ballistic electron magnetic microscopy
Authors: Rippard, WH Perrella, AC Chalsani, P Albert, FJ Katine, JA Buhrman, RA
Citation: Wh. Rippard et al., Observation of magnetization reversal of thin-film permalloy nanostructures using ballistic electron magnetic microscopy, APPL PHYS L, 77(9), 2000, pp. 1357-1359
Spin-polarized current switching of a Co thin film nanomagnet
Authors: Albert, FJ Katine, JA Buhrman, RA Ralph, DC
Citation: Fj. Albert et al., Spin-polarized current switching of a Co thin film nanomagnet, APPL PHYS L, 77(23), 2000, pp. 3809-3811
Current-induced realignment of magnetic domains in nanostructured Cu/Co multilayer pillars
Authors: Katine, JA Albert, FJ Buhrman, RA
Citation: Ja. Katine et al., Current-induced realignment of magnetic domains in nanostructured Cu/Co multilayer pillars, APPL PHYS L, 76(3), 2000, pp. 354-356
Phosphorus diffusion in silicon oxide and oxynitride gate dielectrics
Authors: Ellis, KA Buhrman, RA
Citation: Ka. Ellis et Ra. Buhrman, Phosphorus diffusion in silicon oxide and oxynitride gate dielectrics, EL SOLID ST, 2(10), 1999, pp. 516-518
Effects of oxygen content on YBCO Josephson junction structures
Authors: Sydow, JP Berninger, M Buhrman, RA Moeckly, BH
Citation: Jp. Sydow et al., Effects of oxygen content on YBCO Josephson junction structures, IEEE APPL S, 9(2), 1999, pp. 2993-2996
Effect of ozone anneals on YBa2Cu3-xCoxOz thin films
Authors: Sydow, JP Buhrman, RA
Citation: Jp. Sydow et Ra. Buhrman, Effect of ozone anneals on YBa2Cu3-xCoxOz thin films, IEEE APPL S, 9(2), 1999, pp. 1994-1997
Scanning transmission electron microscopy studies of the microstructure and chemistry of the YBa2Cu3O7-delta/BaF2 interface
Authors: Lee, JL Weiss, CA Buhrman, RA Silcox, J
Citation: Jl. Lee et al., Scanning transmission electron microscopy studies of the microstructure and chemistry of the YBa2Cu3O7-delta/BaF2 interface, MICRON, 30(5), 1999, pp. 437-447
On the characteristic voltage of highly oxygenated YBCO grain boundary junctions
Authors: Sydow, JP Berninger, M Buhrman, RA Moeckly, BH
Citation: Jp. Sydow et al., On the characteristic voltage of highly oxygenated YBCO grain boundary junctions, SUPERCOND S, 12(11), 1999, pp. 723-725
Ballistic electron transport through Au(111)/Si(111) and Au(111)/Si(100) interfaces
Authors: Weilmeier, MK Rippard, WH Buhrman, RA
Citation: Mk. Weilmeier et al., Ballistic electron transport through Au(111)/Si(111) and Au(111)/Si(100) interfaces, PHYS REV B, 59(4), 1999, pp. R2521-R2524
Current-induced switching of domains in magnetic multilayer devices
Authors: Myers, EB Ralph, DC Katine, JA Louie, RN Buhrman, RA
Citation: Eb. Myers et al., Current-induced switching of domains in magnetic multilayer devices, SCIENCE, 285(5429), 1999, pp. 867-870
Nitrous oxide (N2O) processing for silicon oxynitride gate dielectrics
Authors: Ellis, KA Buhrman, RA
Citation: Ka. Ellis et Ra. Buhrman, Nitrous oxide (N2O) processing for silicon oxynitride gate dielectrics, IBM J RES, 43(3), 1999, pp. 287-300
Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution
Authors: Rippard, WH Buhrman, RA
Citation: Wh. Rippard et Ra. Buhrman, Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution, APPL PHYS L, 75(7), 1999, pp. 1001-1003
Time-dependent diffusivity of boron in silicon oxide and oxynitride
Authors: Ellis, KA Buhrman, RA
Citation: Ka. Ellis et Ra. Buhrman, Time-dependent diffusivity of boron in silicon oxide and oxynitride, APPL PHYS L, 74(7), 1999, pp. 967-969
Spin filtering by ultrathin ferromagnetic films
Authors: Upadhyay, SK Louie, RN Buhrman, RA
Citation: Sk. Upadhyay et al., Spin filtering by ultrathin ferromagnetic films, APPL PHYS L, 74(25), 1999, pp. 3881-3883
Width dependence of giant magnetoresistance in Cu/Co multilayer nanowires
Authors: Katine, JA Palanisami, A Buhrman, RA
Citation: Ja. Katine et al., Width dependence of giant magnetoresistance in Cu/Co multilayer nanowires, APPL PHYS L, 74(13), 1999, pp. 1883-1885
Risultati: 1-24 |