Authors:
VANNOSTRAND JE
CAHILL DG
PETROV I
GREENE JE
Citation: Je. Vannostrand et al., MORPHOLOGY AND MICROSTRUCTURE OF TENSILE-STRAINED SIGE(001) THIN EPITAXIAL-FILMS, Journal of applied physics, 83(2), 1998, pp. 1096-1102
Citation: Dg. Cahill et al., THERMAL-CONDUCTIVITY OF KAPPA-AL2O3 AND ALPHA-AL2O3 WEAR-RESISTANT COATINGS, Journal of applied physics, 83(11), 1998, pp. 5783-5786
Citation: Dg. Cahill, HEAT-TRANSPORT IN DIELECTRIC THIN-FILMS AND AT SOLID-SOLID INTERFACES, Microscale thermophysical engineering, 1(2), 1997, pp. 85-109
Citation: Sm. Lee et Dg. Cahill, INFLUENCE OF INTERFACE THERMAL CONDUCTANCE ON THE APPARENT THERMAL-CONDUCTIVITY OF THIN-FILMS, Microscale thermophysical engineering, 1(1), 1997, pp. 47-52
Authors:
THEISBROHL K
RITLEY KA
FLYNN CP
VANNOSTRAND JE
CAHILL DG
HAMACHER K
KAISER H
RHYNE JJ
Citation: K. Theisbrohl et al., COEXISTENCE OF DIFFERENT MAGNETIC PHASES IN DY Y SUPERLATTICES CAUSEDBY GROWTH INDUCED NANOSTRUCTURES/, Journal of magnetism and magnetic materials, 166(1-2), 1997, pp. 27-37
Authors:
KARR BW
PETROV I
DESJARDINS P
CAHILL DG
GREENE JE
Citation: Bw. Karr et al., IN-SITU SCANNING-TUNNELING-MICROSCOPY STUDIES OF THE EVOLUTION OF SURFACE-MORPHOLOGY AND MICROSTRUCTURE IN EPITAXIAL TIN(001) GROWN BY ULTRA-HIGH-VACUUM REACTIVE MAGNETRON SPUTTERING, Surface & coatings technology, 94-5(1-3), 1997, pp. 403-408
Citation: Sj. Chey et Dg. Cahill, SURFACE-DEFECTS CREATED BY LOW-ENERGY (20-LESS-THAN-E-LESS-THAN-240 EV) ION-BOMBARDMENT OF GE(001), Surface science, 380(2-3), 1997, pp. 377-384
Authors:
CORTEZ R
ZAGHLOUL HH
STEPHENSON LD
SMITH ED
WOOD JW
CAHILL DG
Citation: R. Cortez et al., LABORATORY-SCALE THERMAL PLASMA-ARC VITRIFICATION STUDIES OF HEAVY METAL-LADEN WASTE, Journal of the Air & Waste Management Association [1995], 46(11), 1996, pp. 1075-1080
Citation: Ka. Topp et Dg. Cahill, ELASTIC PROPERTIES OF SEVERAL AMORPHOUS SOLIDS AND DISORDERED CRYSTALS BELOW 100 K, Zeitschrift fur Physik. B, Condensed matter, 101(2), 1996, pp. 235-245
Citation: Jw. Wood et al., UV SPECTROSCOPY OF METAL VOLATILIZATION DURING THERMAL PLASMA PROCESSING OF WASTE GLASS MELTS, Plasma chemistry and plasma processing, 16(3), 1996, pp. 449-460
Citation: Ne. Lee et al., SURFACE ROUGHENING DURING LOW-TEMPERATURE SI EPITAXIAL-GROWTH ON SINGULAR VS VICINAL SI(001) SUBSTRATES, Physical review. B, Condensed matter, 53(12), 1996, pp. 7876-7879
Authors:
VANNOSTRAND JE
CHEY SJ
CAHILL DG
BOTCHKAREV AE
MORKOC H
Citation: Je. Vannostrand et al., SURFACE-MORPHOLOGY OF GAAS(001) GROWN BY SOLID-SOURCE AND GAS-SOURCE MOLECULAR-BEAM EPITAXY, Surface science, 346(1-3), 1996, pp. 136-144
Citation: Ne. Lee et al., EVOLUTION OF SURFACE-ROUGHNESS IN EPITAXIAL SI0.7GE0.3(001) AS A FUNCTION OF GROWTH TEMPERATURE (200-600-DEGREES-C) AND SI(001) SUBSTRATE MISCUT, Journal of applied physics, 80(4), 1996, pp. 2199-2210
Authors:
KARR BW
KIM YW
PETROV I
BERGSTROM DB
CAHILL DG
GREENE JE
MADSEN LD
SUNDGREN JE
Citation: Bw. Karr et al., MORPHOLOGY AND MICROSTRUCTURE OF EPITAXIAL CU(001) FILMS GROWN BY PRIMARY ION DEPOSITION ON SI AND GE SUBSTRATES, Journal of applied physics, 80(12), 1996, pp. 6699-6705
Citation: Je. Vannostrand et al., SURFACE-ROUGHNESS AND PATTERN-FORMATION DURING HOMOEPITAXIAL GROWTH OF GE(001) AT LOW-TEMPERATURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1816-1819
Citation: Dg. Cahill et al., HEAT-TRANSPORT IN MICRON THICK A-SI-H FILMS, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 71(4), 1995, pp. 677-682
Citation: Sj. Chey et al., SURFACE-MORPHOLOGY OF GE(001) DURING ETCHING BY LOW-ENERGY IONS, Physical review. B, Condensed matter, 52(23), 1995, pp. 16696-16701