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Results:
1-14
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Results: 14
Authors:
MONTGOMERY NJ
MACMANUSDRISCOLL JL
MCPHAIL DS
CHATER RJ
MOECKLY B
CHAR K
Citation: Nj. Montgomery et al., HIGH-RESOLUTION SECONDARY-ION MASS-SPECTROMETRY DEPTH PROFILING OF SUPERCONDUCTING THIN-FILMS, Thin solid films, 317(1-2), 1998, pp. 237-240
Authors:
COCCIA LG
TYRRELL GC
KILNER JA
WALLER D
CHATER RJ
BOYD IW
Citation: Lg. Coccia et al., PULSED-LASER DEPOSITION OF NOVEL MATERIALS FOR THIN-FILM SOLID OXIDE FUEL-CELL APPLICATIONS - CE0.9GD0.1O1.95, LA0.7SR0.3COOY AND LA0.7SR0.3CO0.2FE0.8OY, Applied surface science, 96-8, 1996, pp. 795-801
Authors:
LI YP
KILNER JA
TATE TJ
CHATER RJ
JEYNES C
JAFRI ZH
Citation: Yp. Li et al., SIMS, RBS, AND ION CHANNELING STUDIES OF H-2(-18(+) IRRADIATED LAALO3, (100) SINGLE-CRYSTAL() OR O), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 133-138
Authors:
LI YP
MARSH CD
NEJIM A
CHATER RJ
KILNER JA
HEMMENT PLF
Citation: Yp. Li et al., SIMOX - PROCESSING, LAYER PARAMETERS DESIGN, AND DEFECTS CONTROL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 479-483
Authors:
LI YP
KILNER JA
TATE TJ
LEE MJ
CHATER RJ
FOX H
DESOUZA RA
QUINCEY PG
Citation: Yp. Li et al., SECONDARY-ION-MASS-SPECTROSCOPY STUDY OF OXYGEN TRACER DIFFUSION IN AC-AXIS-ORIENTED YBA(2)CU3O(7-DELTA) FILM, Physical review. B, Condensed matter, 51(13), 1995, pp. 8498-8502
Authors:
LI YP
KILNER JA
CHATER RJ
NEJIM A
HEMMENT PLF
MARSH CD
BOOKER GR
Citation: Yp. Li et al., OXYGEN ISOTOPIC EXCHANGE DURING THE ANNEALING OF LOW-ENERGY SIMOX LAYERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 236-242
Authors:
KILNER JA
BEYER GP
CHATER RJ
Citation: Ja. Kilner et al., O-18 STUDIES OF ALTERED LAYERS FORMED IN SI AND SIO2 BY ION-BOMBARDMENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 84(2), 1994, pp. 176-180
Authors:
NEJIM A
MARSH CD
GILES LF
HEMMENT PLF
LI Y
CHATER RJ
KILNER JA
BOOKER GR
Citation: A. Nejim et al., AN INVESTIGATION OF THE ROLE OF THE TIME-AVERAGED ION-BEAM CURRENT-DENSITY UPON THE DEFECT DENSITIES IN THIN-FILM SIMOX, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 84(2), 1994, pp. 248-253
Authors:
NEJIM A
LI Y
MARSH CD
HEMMENT PLF
CHATER RJ
KILNER JA
BOOKER GR
Citation: A. Nejim et al., DIRECT FORMATION OF DEVICE WORTHY THIN-FILM SIMOX STRUCTURES BY LOW-ENERGY OXYGEN IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 822-826
Authors:
LIN C
LI Y
KILNER JA
CHATER RJ
LI J
NEJIM A
ZHANG JP
HEMMENT PLF
Citation: C. Lin et al., INVESTIGATION OF BURIED ALN LAYERS FORMED BY NITROGEN IMPLANTATION INTO AL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 323-326
Authors:
LI Y
KILNER JA
CHATER RJ
NEJIM A
HEMMENT PLF
TATE TJ
Citation: Y. Li et al., AN INVESTIGATION OF AS-IMPLANTED MATERIAL FORMED BY HIGH-DOSE 40 KEV OXYGEN IMPLANTATION INTO SILICON AT 550-DEGREES-C, Journal of applied physics, 74(1), 1993, pp. 82-85
Authors:
LI Y
KILNER JA
CHATER RJ
HEMMENT PLF
NEJIM A
ROBINSON AK
REESON KJ
MARSH CD
BOOKER GR
Citation: Y. Li et al., THE EFFECTS OF DOSE AND TARGET TEMPERATURE ON LOW-ENERGY SIMOX LAYERS, Journal of the Electrochemical Society, 140(6), 1993, pp. 1780-1786
Authors:
LI YP
KILNER JA
CHATER RJ
NEJIM A
HEMMENT PLF
MARSH CD
BOOKER GR
Citation: Yp. Li et al., OXYGEN ISOTOPIC EXCHANGE BETWEEN AN O-18-TEMPERATURE ANNEALING( SI LAYER AND A NATURAL SIO2 CAPPING LAYER DURING HIGH), Applied physics letters, 63(20), 1993, pp. 2812-2814
Authors:
SCANLON PJ
HEMMENT PLF
REESON KJ
ROBINSON AK
KILNER JA
CHATER RJ
HARBEKE G
Citation: Pj. Scanlon et al., OXYGEN RICH SIMOX, Semiconductor science and technology, 6(8), 1991, pp. 730-734
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1-14
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