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Citation: Vwl. Chin et al., BIAS AND THICKNESS DEPENDENCE OF THE INFRARED PTSI P-SI SCHOTTKY DIODE STUDIED BY INTERNAL PHOTOEMISSION/, Solid-state electronics, 39(2), 1996, pp. 277-280
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Authors:
CHIN VWL
EGAN RJ
OSOTCHAN T
VAUGHAN MR
ANDERSON SC
Citation: Vwl. Chin et al., NONCONTACT THICKNESS AND COMPOSITION ASSESSMENT OF A STRAINED ALGAAS ALAS/INGAAS DOUBLE-BARRIER MULTIPLE-QUANTUM-WELL STRUCTURE/, Journal of applied physics, 80(4), 1996, pp. 2521-2523
Authors:
OSOTCHAN T
CHIN VWL
TANSLEY TL
USHER BF
CLARK A
Citation: T. Osotchan et al., MBE AND MOCVD GROWTH OF ALGAAS-ALAS-GAAS DOUBLE-BARRIER MULTIPLE-QUANTUM-WELL INFRARED DETECTOR, Materials science & engineering. B, Solid-state materials for advanced technology, 35(1-3), 1995, pp. 176-179
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Citation: Vwl. Chin, REASSESSMENT OF THE PIEZOELECTRIC CONSTANT IN GAAS BY STUDYING THE ELECTRON-TRANSPORT OF HIGH-PURITY MBE-GROWN GAAS, Solid-state electronics, 37(7), 1994, pp. 1345-1347
Citation: Em. Goldys et al., PHOTOLUMINESCENCE EXCITATION INTERPRETED BY PHOTON RECYCLING IN GAAS GAALAS MULTIPLE-QUANTUM-WELL STRUCTURE/, Journal of applied physics, 75(8), 1994, pp. 4194-4200
Authors:
CHIN VWL
OSOTCHAN T
VAUGHAN MR
TANSLEY TL
GRIFFITHS GJ
KACHWALLA Z
Citation: Vwl. Chin et al., HALL AND DRIFT MOBILITIES IN MOLECULAR-BEAM EPITAXIAL GROWN GAAS, Journal of electronic materials, 22(11), 1993, pp. 1317-1321
Authors:
BUTCHER KSA
ALEXIEV D
CHIN VWL
TANSLEY TL
EGAN RJ
KEANE M
Citation: Ksa. Butcher et al., SCHOTTKY-BARRIER HEIGHT MODIFICATION ON HIGH-PURITY LPE GAAS FOLLOWING A SULFUR-BASED ETCH, Semiconductor science and technology, 8(7), 1993, pp. 1451-1458
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