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Results:
1-21
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Results: 21
Authors:
CIOFI C
BRUFORD MW
Citation: C. Ciofi et Mw. Bruford, ISOLATION AND CHARACTERIZATION OF MICROSATELLITE LOCI IN THE KOMODO-DRAGON VARANUS-KOMODOENSIS, Molecular ecology, 7(1), 1998, pp. 134-136
Authors:
ABIS L
DELLAMICO DB
BUSETTO C
CALDERAZZO F
CAMINITI R
CIOFI C
GARBASSI F
MASCIARELLI M
Citation: L. Abis et al., N,N-DIALKYLCARBAMATO COMPLEXES AS PRECURSORS FOR THE CHEMICAL IMPLANTATION OF METAL-CATIONS ON A SILICA SUPPORT - PART 2 - PLATINUM(II) ANDITS FURTHER REDUCTION TO PLATINUM NANOPARTICLES, Journal of materials chemistry, 8(3), 1998, pp. 751-759
Authors:
CIOFI C
GIANNETTI R
DATTILO V
NERI B
Citation: C. Ciofi et al., ULTRA LOW-NOISE CURRENT SOURCES, IEEE transactions on instrumentation and measurement, 47(1), 1998, pp. 78-81
Authors:
IEMBO A
FUSO F
ARIMONDO E
CIOFI C
PENNELLI G
CURRO GM
NERI F
ALLEGRINI M
Citation: A. Iembo et al., PULSED-LASER DEPOSITION AND CHARACTERIZATION OF CONDUCTIVE RUO2 THIN-FILMS, Journal of materials research, 12(6), 1997, pp. 1433-1436
Authors:
BRUSCHI P
CIOFI C
DATTILO V
DILIGENTI A
NANNINI A
NERI B
Citation: P. Bruschi et al., COPPER METALLIZATIONS FOR INTEGRATED-CIRCUITS - TEM ANALYSIS AND ELECTRICAL CHARACTERIZATION, Journal of electronic materials, 26(8), 1997, pp. 17-20
Authors:
CIOFI C
SWINGLAND IR
Citation: C. Ciofi et Ir. Swingland, ENVIRONMENTAL SEX DETERMINATION IN REPTILES, Applied animal behaviour science, 51(3-4), 1997, pp. 251-265
Authors:
CIOFI C
FRANZESE M
NERI B
Citation: C. Ciofi et al., CHARACTERIZATION OF AL-SI-CU METAL LINES BY MEANS OF TEM ANALYSIS ANDTHE SARF TECHNIQUE, Microelectronics and reliability, 37(7), 1997, pp. 1079-1085
Authors:
CIOFI C
DATTILO V
NERI B
Citation: C. Ciofi et al., COMMENTS ON THE UTILIZATION OF NOISE MEASUREMENTS FOR THE CHARACTERIZATION OF ELECTROMIGRATION IN METAL LINES, Microelectronics and reliability, 37(10-11), 1997, pp. 1607-1610
Authors:
CIOFI C
DIPASCOLI S
Citation: C. Ciofi et S. Dipascoli, TEMPERATURE-COEFFICIENT OF RESISTANCE FLUCTUATIONS DURING ELECTROMIGRATION IN AL LINES, Microelectronics and reliability, 37(1), 1997, pp. 77-85
Authors:
BARACCHINO L
BASSO G
CIOFI C
NERI B
Citation: L. Baracchino et al., ULTRALOW-NOISE PROGRAMMABLE VOLTAGE-SOURCE, IEEE transactions on instrumentation and measurement, 46(6), 1997, pp. 1256-1261
Authors:
CIOFI C
DEMARINIS M
NERI B
Citation: C. Ciofi et al., ULTRALOW-NOISE PC-BASED MEASUREMENT SYSTEM FOR THE CHARACTERIZATION OF THE METALLIZATIONS OF INTEGRATED-CIRCUITS, IEEE transactions on instrumentation and measurement, 46(4), 1997, pp. 789-793
Authors:
NERI B
CIOFI C
DATTILO V
Citation: B. Neri et al., NOISE AND FLUCTUATIONS IN SUBMICROMETRIC AL-SI INTERCONNECT LINES, I.E.E.E. transactions on electron devices, 44(9), 1997, pp. 1454-1459
Authors:
ALLEGRINI M
CIOFI C
DILIGENTI A
FUSO F
NANNINI A
PELLEGRINI V
PENNELLI G
Citation: M. Allegrini et al., PHOTOLUMINESCENCE FROM ION-BEAM COSPUTTERED SI SIO2 THIN-FILMS/, Solid state communications, 100(6), 1996, pp. 403-406
Authors:
BAGNOLI PE
CIOFI C
NERI B
PENNELLI G
Citation: Pe. Bagnoli et al., ELECTROMIGRATION IN AL BASED STRIPES - LOW-FREQUENCY NOISE MEASUREMENTS AND MTF TESTS, Microelectronics and reliability, 36(7-8), 1996, pp. 1045-1050
Authors:
CIOFI C
DATTILO V
NERI B
Citation: C. Ciofi et al., COPPER INTERCONNECTION LINES - SARF CHARACTERIZATION AND LIFETIME TEST, Microelectronics and reliability, 36(11-12), 1996, pp. 1747-1750
Authors:
CIOFI C
DEMARINIS M
NERI B
Citation: C. Ciofi et al., WAFER LEVEL MEASUREMENT SYSTEM FOR SARF CHARACTERIZATION OF METAL LINES, Microelectronics and reliability, 36(11-12), 1996, pp. 1851-1854
Authors:
BAGNOLI PE
CIOFI C
DILIGENTI A
INNAMORATO A
NANNINI A
Citation: Pe. Bagnoli et al., CHARACTERIZATION OF YSZ FILMS BY MEANS OF C-V MEASUREMENTS AND TEM OBSERVATIONS, Thin solid films, 264(1), 1995, pp. 109-114
Authors:
CIOFI C
PLATT CE
EADES JA
AMANO J
HU R
Citation: C. Ciofi et al., STRUCTURAL COMPARISON OF BA1-XKXBIO3 SUPERCONDUCTING THIN-FILMS, Journal of materials research, 9(2), 1994, pp. 305-313
Authors:
CIOFI C
CHELAZZI G
Citation: C. Ciofi et G. Chelazzi, ANALYSIS OF HOMING PATTERN IN THE COLUBRID SNAKE COLUBER VIRIDIFLAVUS, Journal of herpetology, 28(4), 1994, pp. 477-484
Authors:
CHICCA S
CIOFI C
DILIGENTI A
NANNINI A
NERI B
Citation: S. Chicca et al., DEPENDENCE OF ELECTROMIGRATION NOISE ON GEOMETRICAL AND STRUCTURAL CHARACTERISTICS IN ALUMINUM-BASED RESISTORS, I.E.E.E. transactions on electron devices, 41(11), 1994, pp. 2173-2175
Authors:
CIOFI C
DILIGENTI A
GIACOMOZZI F
NANNINI A
NERI B
Citation: C. Ciofi et al., LOW-FREQUENCY ELECTROMIGRATION NOISE AND FILM MICROSTRUCTURE IN AL SISTRIPES - ELECTRICAL MEASUREMENTS AND TEM ANALYSIS/, Journal of electronic materials, 22(11), 1993, pp. 1323-1326
Risultati:
1-21
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