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Results:
1-8
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Results: 8
Authors:
ROUSSEAU PM
CROWDER SW
GRIFFIN PB
PLUMMER JD
Citation: Pm. Rousseau et al., ARSENIC DEACTIVATION ENHANCED DIFFUSION AND THE REVERSE SHORT-CHANNELEFFECT, IEEE electron device letters, 18(2), 1997, pp. 42-44
Authors:
CHAO HS
CROWDER SW
GRIFFIN PB
PLUMMER JD
Citation: Hs. Chao et al., SPECIES AND DOSE DEPENDENCE OF ION-IMPLANTATION DAMAGE-INDUCED TRANSIENT ENHANCED DIFFUSION, Journal of applied physics, 79(5), 1996, pp. 2352-2363
Authors:
CROWDER SW
JAFFEY LH
Citation: Sw. Crowder et Lh. Jaffey, SARCOIDOSIS PRESENTING AS ACHILLES TENDINITIS, Journal of the Royal Society of Medicine, 88(6), 1995, pp. 335-336
Authors:
KANE BJ
STORMENT CW
CROWDER SW
TANELIAN DL
KOVACS GTA
Citation: Bj. Kane et al., FORCE-SENSING MICROPROBE FOR PRECISE STIMULATION OF MECHANOSENSITIVE TISSUES, IEEE transactions on biomedical engineering, 42(8), 1995, pp. 745-750
Authors:
GRIFFIN PB
CROWDER SW
KNIGHT JM
Citation: Pb. Griffin et al., DOSE LOSS IN PHOSPHORUS IMPLANTS DUE TO TRANSIENT DIFFUSION AND INTERFACE SEGREGATION, Applied physics letters, 67(4), 1995, pp. 482-484
Authors:
CROWDER SW
HSIEH CJ
GRIFFIN PB
PLUMMER JD
Citation: Sw. Crowder et al., EFFECT OF BURIED SI-SIO2 INTERFACES ON OXIDATION AND IMPLANT-ENHANCEDDOPANT DIFFUSION IN THIN SILICON-ON-INSULATOR FILMS, Journal of applied physics, 76(5), 1994, pp. 2756-2764
Authors:
CROWDER SW
GRIFFIN PB
PLUMMER JD
Citation: Sw. Crowder et al., CHARACTERIZATION OF INTERFACE TOPOGRAPHY OF THE BURIED SI-SIO2 INTERFACE IN SILICON-ON-INSULATOR MATERIAL BY ATOMIC-FORCE MICROSCOPY, Applied physics letters, 65(13), 1994, pp. 1698-1699
Authors:
CROWDER SW
GRIFFIN PB
HSIEH CJ
WEI GY
PLUMMER JD
ALLEN LP
Citation: Sw. Crowder et al., OXIDATION ENHANCED DOPANT DIFFUSION IN SEPARATION BY IMPLANTATION BY OXYGEN SILICON-ON-INSULATOR MATERIAL, Applied physics letters, 64(24), 1994, pp. 3264-3266
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