Citation: Sf. Cui et al., STATIC DEBYE-WALLER FACTOR-ANALYSIS OF HYDROGEN PRECIPITATES IN SILICON, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 75(1), 1997, pp. 137-151
Authors:
CUI SF
LUO GM
LI M
MAI ZH
CUI Q
ZHOU JM
JIANG XM
ZHANG WL
Citation: Sf. Cui et al., THE INTERFACE ROUGHNESS EXPONENT IN GEXSI1-X SI SUPERLATTICES/, Journal of physics. Condensed matter, 9(14), 1997, pp. 2891-2902
Authors:
LI M
RESS H
GERHARD T
LANDWEHR G
CUI SF
MAI ZH
Citation: M. Li et al., A SEMI-KINEMATIC APPROACH TO X-RAY-DIFFRACTION OF REAL CRYSTALS WITH SMALL DEFECTS, Journal of applied physics, 81(5), 1997, pp. 2143-2147
Citation: M. Li et al., INVESTIGATION OF MOSAICITY OF EPITAXIAL MULTILAYERS BY THE STATISTICAL-THEORY OF X-RAY DYNAMICAL DIFFRACTION, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 350-353
Authors:
LI M
CUI Q
CUI SF
ZHANG L
ZHOU JM
MAI ZH
DONG C
CHEN H
WU F
Citation: M. Li et al., X-RAY REFLECTIVITY STUDIES OF THE EFFECT OF SURFACTANT ON THE GROWTH OF GESI SUPERLATTICES, Journal of applied physics, 78(3), 1995, pp. 1681-1684
Citation: L. Ming et al., STUDY OF THERMAL-BEHAVIOR OF OXYGEN IN SILICON-CRYSTALS BY ANALYSIS OF X-RAY PENDELLOSUNG FRINGES, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 725-730
Authors:
LI M
MAI ZH
CUI SF
LI JH
GU YS
WANG YT
ZHUANG Y
Citation: M. Li et al., X-RAY-SCATTERING FROM A ROUGH-SURFACE AND DAMAGED LAYER OF POLISHED WAFERS, Journal of physics. D, Applied physics, 27(9), 1994, pp. 1929-1932
Authors:
CUI SF
LI JH
LI M
LI CR
GU YS
MAI ZH
WANG YT
ZHUANG Y
Citation: Sf. Cui et al., DETERMINATION OF SURFACE-ROUGHNESS OF INP (001) WAFERS BY X-RAY-SCATTERING, Journal of applied physics, 76(7), 1994, pp. 4154-4158
Citation: Jh. Li et al., INTERFERENCE EFFECTS IN X-RAY DOUBLE-CRYSTAL ROCKING CURVES OF GEXSI1-X SI SUPERLATTICES/, Journal of applied physics, 76(2), 1994, pp. 1320-1322
Citation: Jh. Li et al., X-RAY AND TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF IMPERFECT GEXSI1-X SI STRAINED-LAYER SUPERLATTICES/, Journal of materials science letters, 12(19), 1993, pp. 1511-1513
Citation: Sf. Cui et al., STRUCTURE OF INXGA1-XAS GAAS STRAINED-LAYER SUPERLATTICES/, Physical review. B, Condensed matter, 48(12), 1993, pp. 8797-8800
Citation: Jh. Li et al., CHARACTERIZATION OF ALXGA1-XAS ALYGA1-YAS/GAAS STEP MULTIQUANTUM WELLS ON (001) GAAS BY X-RAY DOUBLE-CRYSTAL DIFFRACTION/, Journal of crystal growth, 129(3-4), 1993, pp. 532-536
Citation: Jh. Li et al., X-RAY-DIFFRACTION OF NONUNIFORM GEXSI1-XSI STRAINED-LAYER SUPERLATTICES, Journal of applied physics, 73(11), 1993, pp. 7955-7956
Citation: Jh. Li et al., X-RAY CHARACTERIZATION OF STRAIN RELAXATION IN INGAAS GAAS STRAINED-LAYER SUPERLATTICES/, Applied physics letters, 63(24), 1993, pp. 3327-3329