AAAAAA

   
Results: 1-12 |
Results: 12
PZT thin film bi-layer devices for phase controlled actuation in MEMS
Authors: Jenkins, DFL Clegg, WW Cattan, E Remiens, D
Citation: Dfl. Jenkins et al., PZT thin film bi-layer devices for phase controlled actuation in MEMS, J ELECTROCE, 7(1), 2001, pp. 5-11
(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films
Authors: Soyer, C Haccart, T Cattan, E Remiens, D
Citation: C. Soyer et al., (Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films, INTEGR FERR, 35(1-4), 2001, pp. 1959-1968
Ferroelectric and piezoelectric properties of Nb doped PZT films
Authors: Haccart, T Cattan, E Remiens, D Hiboux, S Muralt, P
Citation: T. Haccart et al., Ferroelectric and piezoelectric properties of Nb doped PZT films, INTEGR FERR, 35(1-4), 2001, pp. 1969-1978
Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering
Authors: Haccart, T Cattan, E Remiens, D
Citation: T. Haccart et al., Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering, EPJ-APPL PH, 11(2), 2000, pp. 103-106
Lamb wave and plate mode in ZnO/silicon and AlN/silicon membrane - Application to sensors able to operate in contact with liquid
Authors: Laurent, T Bastien, FO Pommier, JC Cachard, A Remiens, D Cattan, E
Citation: T. Laurent et al., Lamb wave and plate mode in ZnO/silicon and AlN/silicon membrane - Application to sensors able to operate in contact with liquid, SENS ACTU-A, 87(1-2), 2000, pp. 26-37
X-ray diffraction from perfect silicon crystals distorted by surface acoustic waves
Authors: Tucoulou, R Pascal, R Brunel, M Mathon, O Roshchupkin, DV Schelokov, IA Cattan, E Remiens, D
Citation: R. Tucoulou et al., X-ray diffraction from perfect silicon crystals distorted by surface acoustic waves, J APPL CRYS, 33, 2000, pp. 1019-1022
Evaluation of niobium effects on the longitudinal piezoelectric coefficients of Pb(Zr, Ti)O-3 thin films
Authors: Haccart, T Cattan, E Remiens, D Hiboux, S Muralt, P
Citation: T. Haccart et al., Evaluation of niobium effects on the longitudinal piezoelectric coefficients of Pb(Zr, Ti)O-3 thin films, APPL PHYS L, 76(22), 2000, pp. 3292-3294
Piezoelectric properties of PZT films for microcantilever
Authors: Cattan, E Haccart, T Velu, G Remiens, D Bergaud, C Nicu, L
Citation: E. Cattan et al., Piezoelectric properties of PZT films for microcantilever, SENS ACTU-A, 74(1-3), 1999, pp. 60-64
e(31) piezoelectric constant measurement of lead zirconate titanate thin films
Authors: Cattan, E Haccart, T Remiens, D
Citation: E. Cattan et al., e(31) piezoelectric constant measurement of lead zirconate titanate thin films, J APPL PHYS, 86(12), 1999, pp. 7017-7023
The characterisation of PZT films of differing orientations for MEMS applications
Authors: Jenkins, DFL Clegg, WW Velu, G Cattan, E Remiens, D
Citation: Dfl. Jenkins et al., The characterisation of PZT films of differing orientations for MEMS applications, FERROELECTR, 224(1-4), 1999, pp. 687-694
Remanent piezoelectric constant of PZT thin films
Authors: Cattan, E Manceau, JF Haccart, T Biwersi, S Velu, G Remiens, D Bastien, F
Citation: E. Cattan et al., Remanent piezoelectric constant of PZT thin films, FERROELECTR, 224(1-4), 1999, pp. 735-742
Effect of poling treatment on e(31) piezoelectric constant of sputtered PZT thin films
Authors: Cattan, E Mollier, A Velu, G Remiens, D
Citation: E. Cattan et al., Effect of poling treatment on e(31) piezoelectric constant of sputtered PZT thin films, J PHYS IV, 8(P9), 1998, pp. 229-232
Risultati: 1-12 |