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Results:
1-16
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Results: 16
Authors:
Gusev, EP
Cartier, E
Buchanan, DA
Gribelyuk, M
Copel, M
Okorn-Schmidt, H
D'Emic, C
Citation: Ep. Gusev et al., Ultrathin high-K metal oxides on silicon: processing, characterization andintegration issues, MICROEL ENG, 59(1-4), 2001, pp. 341-349
Comment on "Atomic transport and chemical stability during annealing of ultrathin Al2O3 films on Si"
Authors:
Copel, M
Citation: M. Copel, Comment on "Atomic transport and chemical stability during annealing of ultrathin Al2O3 films on Si", PHYS REV L, 86(20), 2001, pp. 4713-4713
Authors:
Schrott, AG
Misewich, JA
Copel, M
Abraham, DW
Zhang, Y
Citation: Ag. Schrott et al., A-site surface termination in strontium titanate single crystals, APPL PHYS L, 79(12), 2001, pp. 1786-1788
Authors:
Ragnarsson, LA
Guha, S
Copel, M
Cartier, E
Bojarczuk, NA
Karasinski, J
Citation: La. Ragnarsson et al., Molecular-beam-deposited yttrium-oxide dielectrics in aluminum-gated metal-oxide-semiconductor field-effect transistors: Effective electron mobility, APPL PHYS L, 78(26), 2001, pp. 4169-4171
Authors:
Copel, M
Cartier, E
Gusev, EP
Guha, S
Bojarczuk, N
Poppeller, M
Citation: M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001) (vol 78, pg 2670, 2001), APPL PHYS L, 78(26), 2001, pp. 4199-4199
Authors:
Copel, M
Cartier, E
Gusev, EP
Guha, S
Bojarczuk, N
Poppeller, M
Citation: M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001), APPL PHYS L, 78(18), 2001, pp. 2670-2672
Authors:
Copel, M
Cartier, E
Ross, FM
Citation: M. Copel et al., Formation of a stratified lanthanum silicate dielectric by reaction with Si(001), APPL PHYS L, 78(11), 2001, pp. 1607-1609
Authors:
Copel, M
Citation: M. Copel, Medium-energy ion scattering for analysis of microelectronic materials, IBM J RES, 44(4), 2000, pp. 571-582
Authors:
Smith, RC
Hoilien, N
Taylor, CJ
Ma, TZ
Campbell, SA
Roberts, JT
Copel, M
Buchanan, DA
Gribelyuk, M
Gladfelter, WL
Citation: Rc. Smith et al., Low temperature chemical vapor deposition of ZrO2 on Si(100) using anhydrous zirconium(IV) nitrate, J ELCHEM SO, 147(9), 2000, pp. 3472-3476
Authors:
Copel, M
Gribelyuk, M
Gusev, E
Citation: M. Copel et al., Structure and stability of ultrathin zirconium oxide layers on Si(001), APPL PHYS L, 76(4), 2000, pp. 436-438
Authors:
Gusev, EP
Copel, M
Cartier, E
Baumvol, IJR
Krug, C
Gribelyuk, MA
Citation: Ep. Gusev et al., High-resolution depth profiling in ultrathin Al2O3 films on Si, APPL PHYS L, 76(2), 2000, pp. 176-178
Authors:
Gusev, EP
Buchanan, DA
Jamison, P
Zabel, TH
Copel, M
Citation: Ep. Gusev et al., Ultrathin nitrided gate dielectrics by plasma-assisted processing, MICROEL ENG, 48(1-4), 1999, pp. 67-70
Authors:
Copel, M
Citation: M. Copel, Dance for export: Cultural diplomacy and the Cold War, DANCE RES J, 31(1), 1999, pp. 108-110
Authors:
Copel, M
Varekamp, PR
Kisker, DW
McFeely, FR
Litz, KE
Holl, MMB
Citation: M. Copel et al., Nucleation of chemical vapor deposited silicon nitride on silicon dioxide, APPL PHYS L, 74(13), 1999, pp. 1830-1832
Authors:
Zu Heringdorf, FJM
Kahler, D
Horn-Von Hoegen, M
Schmidt, T
Bauer, E
Copel, M
Minoda, H
Citation: Fjm. Zu Heringdorf et al., Giant faceting of vicinal Si(001) induced by Au adsorption, SURF REV L, 5(6), 1998, pp. 1167-1178
Authors:
Tromp, RM
Mankos, M
Reuter, MC
Ellis, AW
Copel, M
Citation: Rm. Tromp et al., A new low energy electron microscope, SURF REV L, 5(6), 1998, pp. 1189-1197
Risultati:
1-16
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