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Results: 1-17 |
Results: 17
NANOSCALED INTERDIGITATED ELECTRODE ARRAYS FOR BIOCHEMICAL SENSORS
Authors: VANGERWEN P LAUREYN W LAUREYS W HUYBERECHTS G DEBEECK MO BAERT K SULS J SANSEN W JACOBS P HERMANS L MERTENS R
Citation: P. Vangerwen et al., NANOSCALED INTERDIGITATED ELECTRODE ARRAYS FOR BIOCHEMICAL SENSORS, Sensors and actuators. B, Chemical, 49(1-2), 1998, pp. 73-80
COMPUTATIONAL COMPARISONS BETWEEN THE CONVENTIONAL MULTISLICE METHOD AND THE 3RD-ORDER MULTISLICE METHOD FOR CALCULATING HIGH-ENERGY ELECTRON-DIFFRACTION AND IMAGING
Authors: CHEN JH VANDYCK D DEBEECK MO VANLANDUYT J
Citation: Jh. Chen et al., COMPUTATIONAL COMPARISONS BETWEEN THE CONVENTIONAL MULTISLICE METHOD AND THE 3RD-ORDER MULTISLICE METHOD FOR CALCULATING HIGH-ENERGY ELECTRON-DIFFRACTION AND IMAGING, Ultramicroscopy, 69(4), 1997, pp. 219-240
DYNAMICS OF COARSE-GRAINED VARIABLES IN SPATIALLY EXTENDED SYSTEMS
Authors: NICOLIS G DEBEECK MO NICOLIS C
Citation: G. Nicolis et al., DYNAMICS OF COARSE-GRAINED VARIABLES IN SPATIALLY EXTENDED SYSTEMS, Physica. D, 103(1-4), 1997, pp. 73-85
THE CHIRALITY OF CARBON NANOTUBULES DETERMINED BY DARK-FIELD ELECTRON-MICROSCOPY
Authors: BERNAERTS D DEBEECK MO AMELINCKX S VANLANDUYT J VANTENDELOO G
Citation: D. Bernaerts et al., THE CHIRALITY OF CARBON NANOTUBULES DETERMINED BY DARK-FIELD ELECTRON-MICROSCOPY, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 74(3), 1996, pp. 723-740
CAN THE MULTISLICE METHOD BE USED TO CALCULATE HOLZ REFLECTIONS IN HIGH-ENERGY ELECTRON-DIFFRACTION AND IMAGING
Authors: CHEN JH DEBEECK MO VANDYCK D
Citation: Jh. Chen et al., CAN THE MULTISLICE METHOD BE USED TO CALCULATE HOLZ REFLECTIONS IN HIGH-ENERGY ELECTRON-DIFFRACTION AND IMAGING, Microscopy microanalysis microstructures, 7(1), 1996, pp. 27-47
A SIMPLE INTUITIVE THEORY FOR ELECTRON-DIFFRACTION
Authors: VANDYCK D DEBEECK MO
Citation: D. Vandyck et Mo. Debeeck, A SIMPLE INTUITIVE THEORY FOR ELECTRON-DIFFRACTION, Ultramicroscopy, 64(1-4), 1996, pp. 99-107
DIRECT STRUCTURE RECONSTRUCTION IN HRTEM
Authors: DEBEECK MO VANDYCK D
Citation: Mo. Debeeck et D. Vandyck, DIRECT STRUCTURE RECONSTRUCTION IN HRTEM, Ultramicroscopy, 64(1-4), 1996, pp. 153-165
WAVE-FUNCTION RECONSTRUCTION IN HRTEM - THE PARABOLA METHOD
Authors: DEBEECK MO VANDYCK D COENE W
Citation: Mo. Debeeck et al., WAVE-FUNCTION RECONSTRUCTION IN HRTEM - THE PARABOLA METHOD, Ultramicroscopy, 64(1-4), 1996, pp. 167-183
FOCAL-SERIES RECONSTRUCTION IN HRTEM - SIMULATION STUDIES ON NONPERIODIC OBJECTS
Authors: THUST A COENE WMJ DEBEECK MO VANDYCK D
Citation: A. Thust et al., FOCAL-SERIES RECONSTRUCTION IN HRTEM - SIMULATION STUDIES ON NONPERIODIC OBJECTS, Ultramicroscopy, 64(1-4), 1996, pp. 211-230
FINE-TUNING OF THE FOCAL RESIDUE IN EXIT-WAVE RECONSTRUCTION
Authors: TANG D ZANDBERGEN HW JANSEN J DEBEECK MO VANDYCK D
Citation: D. Tang et al., FINE-TUNING OF THE FOCAL RESIDUE IN EXIT-WAVE RECONSTRUCTION, Ultramicroscopy, 64(1-4), 1996, pp. 265-276
A USEFUL APPROXIMATION OF THE EXIT WAVE-FUNCTION IN COHERENT STEM
Authors: BROECKX J DEBEECK MO VANDYCK D
Citation: J. Broeckx et al., A USEFUL APPROXIMATION OF THE EXIT WAVE-FUNCTION IN COHERENT STEM, Ultramicroscopy, 60(1), 1995, pp. 71-80
DUV LITHOGRAPHY FOR 0.35-MU-M CMOS PROCESSING
Authors: VANDRIESSCHE V GOETHALS AM DEBEECK MO RONSE K VANDENHOVE L
Citation: V. Vandriessche et al., DUV LITHOGRAPHY FOR 0.35-MU-M CMOS PROCESSING, Microelectronic engineering, 27(1-4), 1995, pp. 243-246
AN ANALYTICAL APPROACH FOR THE FAST CALCULATION OF DYNAMICAL SCATTERING IN HRTEM
Authors: DEBEECK MO VANDYCK D
Citation: Mo. Debeeck et D. Vandyck, AN ANALYTICAL APPROACH FOR THE FAST CALCULATION OF DYNAMICAL SCATTERING IN HRTEM, Physica status solidi. a, Applied research, 150(2), 1995, pp. 587-602
FUNDAMENTAL PRINCIPLES OF PHASE-SHIFTING MASKS BY FOURIER OPTICS - THEORY AND EXPERIMENTAL-VERIFICATION
Authors: RONSE K DEBEECK MO VANDENHOVE L
Citation: K. Ronse et al., FUNDAMENTAL PRINCIPLES OF PHASE-SHIFTING MASKS BY FOURIER OPTICS - THEORY AND EXPERIMENTAL-VERIFICATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 589-600
TOPOGRAPHICAL MASKS - A NEW APPROACH TO INCREASE THE DOF ON TOPOGRAPHICAL SUBSTRATES
Authors: DEBEECK MO HISASUE A TOKUI A KUSUNOSE H KAMON K MORIMOTO H
Citation: Mo. Debeeck et al., TOPOGRAPHICAL MASKS - A NEW APPROACH TO INCREASE THE DOF ON TOPOGRAPHICAL SUBSTRATES, Microelectronic engineering, 21(1-4), 1993, pp. 19-24
A NEW APPROACH TO OBJECT WAVE-FUNCTION RECONSTRUCTION IN ELECTRON-MICROSCOPY
Authors: VANDYCK D DEBEECK MO COENE W
Citation: D. Vandyck et al., A NEW APPROACH TO OBJECT WAVE-FUNCTION RECONSTRUCTION IN ELECTRON-MICROSCOPY, Optik, 93(3), 1993, pp. 103-107
CARBON NANO-TUBES - THEIR FORMATION PROCESS AND OBSERVATION BY ELECTRON-MICROSCOPY
Authors: ZHANG XF ZHANG XB VANTENDELOO G AMELINCKX S DEBEECK MO VANLANDUYT J
Citation: Xf. Zhang et al., CARBON NANO-TUBES - THEIR FORMATION PROCESS AND OBSERVATION BY ELECTRON-MICROSCOPY, Journal of crystal growth, 130(3-4), 1993, pp. 368-382
Risultati: 1-17 |