AAAAAA
Results:
1-18
|
Results: 18
Authors:
DILHAIRE S
PHAN T
SCHAUB E
CLAEYS W
Citation: S. Dilhaire et al., LASER PROBES AND METHODOLOGY FOR THERMAL- ANALYSIS AT MICROMETRIC SCALE - APPLICATION TO MICROELECTRONICS, Revue generale de thermique, 37(1), 1998, pp. 49-59
Authors:
DILHAIRE S
CORNET A
SCHAUB E
RAUZAN C
CLAEYS W
Citation: S. Dilhaire et al., MEASUREMENT OF THE THERMOMECHANICAL BEHAVIOR OF THE SOLDER-LEAD INTERFACE IN SOLDER JOINTS BY LASER PROBING - A NEW METHOD FOR MEASURING THE BOND QUALITY, Microelectronics and reliability, 38(6-8), 1998, pp. 1293-1296
Authors:
NASSIM K
JOANNES L
CORNET A
DILHAIRE S
SCHAUB E
CLAEYS W
Citation: K. Nassim et al., THERMOMECHANICAL DEFORMATION IMAGING OF POWER DEVICES BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI), Microelectronics and reliability, 38(6-8), 1998, pp. 1341-1345
Authors:
DILHAIRE S
PHAN T
SCHAUB E
CLAEYS W
Citation: S. Dilhaire et al., THERMOMECHANICAL EFFECTS IN METAL LINES ON INTEGRATED-CIRCUITS ANALYZED WITH A DIFFERENTIAL POLARIMETRIC INTERFEROMETER, Microelectronics and reliability, 38(10), 1998, pp. 1591-1597
Authors:
LEWIS D
DILHAIRE S
PHAN T
QUINTARD V
HORNUNG V
CLAEYS W
Citation: D. Lewis et al., MODELING AND EXPERIMENTAL-STUDY OF HEAT DEPOSITION AND TRANSPORT IN ASEMICONDUCTOR-LASER DIODE, Microelectronics, 29(4-5), 1998, pp. 171-179
Authors:
PHAN T
DILHAIRE S
QUINTARD V
CLAEYS W
BATSALE JC
Citation: T. Phan et al., THERMOREFLECTANCE MEASUREMENTS OF TRANSIENT TEMPERATURE UPON INTEGRATED-CIRCUITS - APPLICATION TO THERMAL-CONDUCTIVITY IDENTIFICATION, Microelectronics, 29(4-5), 1998, pp. 181-190
Authors:
ALTET J
RUBIO A
DILHAIRE S
SCHAUB E
CLAEYS W
Citation: J. Altet et al., BICMOS THERMAL SENSOR CIRCUIT FOR BUILT-IN-TEST PURPOSES, Electronics Letters, 34(13), 1998, pp. 1307-1309
Authors:
PHAN T
DILHAIRE S
QUINTARD V
LEWIS D
CLAEYS W
Citation: T. Phan et al., THE METHOD OF DYNAMIC SEPARATION AND ITS APPLICATION TO QUANTITATIVE THERMAL-ANALYSIS OF MICROELECTRONIC DEVICES BY LASER INTERFEROMETRY AND REFLECTOMETRY, Measurement science & technology, 8(3), 1997, pp. 303-316
Authors:
DILHAIRE S
PHAN T
SCHAUB E
CLAEYS W
Citation: S. Dilhaire et al., HIGH-SENSITIVITY AND HIGH-RESOLUTION DIFFERENTIAL INTERFEROMETER - MICROMETRIC POLARISCOPE FOR THERMOMECHANICAL STUDIES IN MICROELECTRONICS, Microelectronics and reliability, 37(10-11), 1997, pp. 1587-1590
Authors:
PHAN T
DILHAIRE S
QUINTARD V
LEWIS D
CLAEYS W
Citation: T. Phan et al., THERMOMECHANICAL STUDY OF ALCU BASED INTERCONNECT UNDER PULSED THERMOELECTRIC EXCITATION, Journal of applied physics, 81(3), 1997, pp. 1157-1168
Authors:
QUINTARD V
PARMENTIER B
PHAN T
LEWIS D
DILHAIRE S
CLAEYS W
Citation: V. Quintard et al., LASER PROBE MEASUREMENTS OF QUALITY EVOLUTION OF SOLDER JOINTS DURINGTHERMAL CYCLING AGING TESTS, Quality and reliability engineering international, 12(6), 1996, pp. 447-452
Authors:
LAFFON E
DILHAIRE S
LEVEQUE JL
CORCUFF P
Citation: E. Laffon et al., AN IMPROVED TECHNIQUE FOR OPTICAL INTERFEROMETRIC IMAGING OF ISOLATEDCELLS, Cytometry, 24(1), 1996, pp. 93-96
Authors:
QUINTARD V
DEBOY G
DILHAIRE S
LEWIS D
PHAN T
CLAEYS W
Citation: V. Quintard et al., LASER-BEAM THERMOGRAPHY OF CIRCUITS IN THE PARTICULAR CASE OF PASSIVATED SEMICONDUCTORS, Microelectronic engineering, 31(1-4), 1996, pp. 291-298
Authors:
CLAEYS W
DILHAIRE S
LEWIS D
QUINTARD V
PHAN T
AUCOUTURIER JL
Citation: W. Claeys et al., OPTICAL AMMETER FOR INTEGRATED-CIRCUIT CHARACTERIZATION AND FAILURE ANALYSIS, Quality and reliability engineering international, 11(4), 1995, pp. 247-251
Authors:
LAFFON E
DILHAIRE S
AUROUSSEAU C
DULON D
CLAEYS W
Citation: E. Laffon et al., ORGANIC MATERIAL CONCENTRATION IN AUDITORY OUTER HAIR-CELLS MEASURED BY LASER INTERFEROMETRY (VOL 20, PG 1, 1995), Cytometry, 20(3), 1995, pp. 272-272
Authors:
LAFFON E
DULON D
AUROUSSEAU C
DILHAIRE S
CLAEYS W
Citation: E. Laffon et al., ORGANIC MATERIAL CONCENTRATION IN AUDITORY OUTER HAIR-CELLS MEASURED BY LASER INTERFEROMETRY, Cytometry, 20(1), 1995, pp. 1-6
Authors:
CLAEYS W
DILHAIRE S
QUINTARD V
LEWIS D
PHAN T
AUCOUTURIER JL
Citation: W. Claeys et al., INTERFERENCES OF PELTIER THERMAL WAVES PRODUCED IN OHMIC CONTACTS UPON INTEGRATED-CIRCUITS, Journal de physique. IV, 4(C7), 1994, pp. 195-198
Authors:
CLAEYS W
DILHAIRE S
QUINTARD V
Citation: W. Claeys et al., LASER PROBING OF THERMAL-BEHAVIOR OF ELECTRONIC COMPONENTS AND ITS APPLICATION IN QUALITY AND RELIABILITY TESTING, Microelectronic engineering, 24(1-4), 1994, pp. 411-420
Risultati:
1-18
|