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Results: 1-17 |
Results: 17
Adsorption of n-pentanol from KPF6 aqueous solution on the (100) and (110)faces of Ag single crystal electrodes
Authors: Doubova, LM De Battisti, A Daolio, S Trasatti, S
Citation: Lm. Doubova et al., Adsorption of n-pentanol from KPF6 aqueous solution on the (100) and (110)faces of Ag single crystal electrodes, J ELEC CHEM, 500(1-2), 2001, pp. 134-146
Secondary ion mass spectrometric investigation of Au-based composites
Authors: Barison, S Piccirillo, C Fabrizio, M Daolio, S
Citation: S. Barison et al., Secondary ion mass spectrometric investigation of Au-based composites, RAP C MASS, 15(21), 2001, pp. 2014-2019
An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry
Authors: Barison, S Barreca, D Daolio, S Fabrizio, M Tondello, E
Citation: S. Barison et al., An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry, RAP C MASS, 15(17), 2001, pp. 1621-1624
Secondary ion mass spectrometry in the characterisation of boron-based ceramics
Authors: Daolio, S Fabrizio, M Piccirillo, C Muolo, ML Passerone, A Bellosi, A
Citation: S. Daolio et al., Secondary ion mass spectrometry in the characterisation of boron-based ceramics, RAP C MASS, 15(1), 2001, pp. 1-7
Composition and microstructure of cobalt oxide thin films obtained from a novel cobalt(II) precursor by chemical vapor deposition
Authors: Barreca, D Massignan, C Daolio, S Fabrizio, M Piccirillo, C Armelao, L Tondello, E
Citation: D. Barreca et al., Composition and microstructure of cobalt oxide thin films obtained from a novel cobalt(II) precursor by chemical vapor deposition, CHEM MATER, 13(2), 2001, pp. 588-593
Hyperthermal and low-energy Ne+ scattering from Au and Pt surfaces
Authors: Tolstogouzov, A Daolio, S Pagura, C
Citation: A. Tolstogouzov et al., Hyperthermal and low-energy Ne+ scattering from Au and Pt surfaces, NUCL INST B, 183(1-2), 2001, pp. 116-127
Ni-Zr alloys: relationship between surface characteristics and electrocatalytic behavior
Authors: Angelini, E Antonione, C Baricco, M Daolio, S Fabrizio, M Rosalbino, F
Citation: E. Angelini et al., Ni-Zr alloys: relationship between surface characteristics and electrocatalytic behavior, RAP C MASS, 14(9), 2000, pp. 800-807
Surface chemistry of RuO2/IrO2/TiO2 mixed-oxide electrodes: secondary ion mass spectrometric study of the changes induced by electrochemical treatment
Authors: Barison, S De Battisti, A Fabrizio, M Daolio, S Piccirillo, C
Citation: S. Barison et al., Surface chemistry of RuO2/IrO2/TiO2 mixed-oxide electrodes: secondary ion mass spectrometric study of the changes induced by electrochemical treatment, RAP C MASS, 14(23), 2000, pp. 2165-2169
Secondary ion mass spectrometric investigation on ruthenium oxide systems:a comparison between poly- and nanocrystalline deposits
Authors: Barison, S Barreca, D Daolio, S Fabrizio, M Piccirillo, C
Citation: S. Barison et al., Secondary ion mass spectrometric investigation on ruthenium oxide systems:a comparison between poly- and nanocrystalline deposits, RAP C MASS, 14(14), 2000, pp. 1179-1183
Characterization of dispersion-hardened electrodeposited gold composites. Part 1: SIMS and SEM study of powder inclusions
Authors: Barison, S Daolio, S Fabrizio, M Piccirillo, C Calliari, I Armelao, L
Citation: S. Barison et al., Characterization of dispersion-hardened electrodeposited gold composites. Part 1: SIMS and SEM study of powder inclusions, CHEM MATER, 12(10), 2000, pp. 2964-2970
Neutralization of low-energy Ne+ ions scattered from metal surfaces: studyby mass-resolved ion-scattering spectrometry
Authors: Tolstogouzov, A Daolio, S Pagura, C Greenwood, CL
Citation: A. Tolstogouzov et al., Neutralization of low-energy Ne+ ions scattered from metal surfaces: studyby mass-resolved ion-scattering spectrometry, SURF SCI, 466(1-3), 2000, pp. 127-136
Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions
Authors: Daolio, S Facchin, B Pagura, C Tolstogouzov, A Konenkov, N
Citation: S. Daolio et al., Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions, RAP C MASS, 13(9), 1999, pp. 782-785
Mutually reactive elements in a glass host matrix: Ag and S ion implantation in silica
Authors: Bertoncello, R Gross, S Trivillin, F Cattaruzza, E Mattei, G Caccavale, F Mazzoldi, P Battaglin, G Daolio, S
Citation: R. Bertoncello et al., Mutually reactive elements in a glass host matrix: Ag and S ion implantation in silica, J MATER RES, 14(6), 1999, pp. 2449-2457
Investigations on the formation of RuO2/ZrO2-based electrocatalytic thin films by surface analysis techniques
Authors: Kristof, J Daolio, S De Battisti, A Piccirillo, C Mihaly, J Horvath, E
Citation: J. Kristof et al., Investigations on the formation of RuO2/ZrO2-based electrocatalytic thin films by surface analysis techniques, LANGMUIR, 15(4), 1999, pp. 1498-1502
A Ru(II) eta(3)-allylic complex as a novel precursor for the CVD of Ru- and RuO2-nanostructured thin films
Authors: Barreca, D Buchberger, A Daolio, S Depero, LE Fabrizio, M Morandini, F Rizzi, GA Sangaletti, L Tondello, E
Citation: D. Barreca et al., A Ru(II) eta(3)-allylic complex as a novel precursor for the CVD of Ru- and RuO2-nanostructured thin films, LANGMUIR, 15(13), 1999, pp. 4537-4543
A SIMS and XPS study about ions influence on electrodeposited PbO2 films
Authors: Amadelli, R Armelao, L Tondello, E Daolio, S Fabrizio, M Pagura, C
Citation: R. Amadelli et al., A SIMS and XPS study about ions influence on electrodeposited PbO2 films, APPL SURF S, 142(1-4), 1999, pp. 200-203
Evaluation of inelastic energy losses for low-energy Ne+ ions scattered from aluminum and silicon surfaces
Authors: Tolstogouzov, A Daolio, S Pagura, C
Citation: A. Tolstogouzov et al., Evaluation of inelastic energy losses for low-energy Ne+ ions scattered from aluminum and silicon surfaces, SURF SCI, 441(1), 1999, pp. 213-222
Risultati: 1-17 |