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Debray, P
Perrin, R
Elhamri, S
Mitchel, WC
Elsass, CR
Smorchkova, IP
Heying, B
Haus, E
Fini, P
Ibbetson, JP
Keller, S
Petroff, PM
DenBaars, SP
Mishra, UK
Speck, JS
Citation: A. Saxler et al., Characterization of an AlGaN/GaN two-dimensional electron gas structure, J APPL PHYS, 87(1), 2000, pp. 369-374
Authors:
Elsass, CR
Mates, T
Heying, B
Poblenz, C
Fini, P
Petroff, PM
DenBaars, SP
Speck, JS
Citation: Cr. Elsass et al., Effects of growth conditions on the incorporation of oxygen in AlGaN layers grown by plasma assisted molecular beam epitaxy, APPL PHYS L, 77(20), 2000, pp. 3167-3169
Citation: Jp. Ibbetson et al., Polarization effects, surface states, and the source of electrons in AlGaN/GaN heterostructure field effect transistors, APPL PHYS L, 77(2), 2000, pp. 250-252
Authors:
Stonas, AR
Kozodoy, P
Marchand, H
Fini, P
DenBaars, SP
Mishra, UK
Hu, EL
Citation: Ar. Stonas et al., Backside-illuminated photoelectrochemical etching for the fabrication of deeply undercut GaN structures, APPL PHYS L, 77(16), 2000, pp. 2610-2612
Authors:
Ozgur, U
Bergmann, MJ
Casey, HC
Everitt, HO
Abare, AC
Keller, S
DenBaars, SP
Citation: U. Ozgur et al., Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells, APPL PHYS L, 77(1), 2000, pp. 109-111
Authors:
Hansen, M
Fini, P
Zhao, L
Abare, AC
Coldren, LA
Speck, JS
DenBaars, SP
Citation: M. Hansen et al., Improved characteristics of InGaN multiple-quantum-well laser diodes grownon laterally epitaxially overgrown GaN on sapphire, APPL PHYS L, 76(5), 2000, pp. 529-531
Authors:
Fini, P
Munkholm, A
Thompson, C
Stephenson, GB
Eastman, JA
Murty, MVR
Auciello, O
Zhao, L
DenBaars, SP
Speck, JS
Citation: P. Fini et al., In situ, real-time measurement of wing tilt during lateral epitaxial overgrowth of GaN, APPL PHYS L, 76(26), 2000, pp. 3893-3895
Authors:
Hierro, A
Kwon, D
Ringel, SA
Hansen, M
Speck, JS
Mishra, UK
DenBaars, SP
Citation: A. Hierro et al., Optically and thermally detected deep levels in n-type Schottky and p(+)-nGaN diodes, APPL PHYS L, 76(21), 2000, pp. 3064-3066
Authors:
Limb, JB
Xing, H
Moran, B
McCarthy, L
DenBaars, SP
Mishra, UK
Citation: Jb. Limb et al., High voltage operation (> 80 V) of GaN bipolar junction transistors with low leakage, APPL PHYS L, 76(17), 2000, pp. 2457-2459
Citation: Sp. Denbaars, Basics physics & materials technology of GaN LEDs and LDs, INTRODUCTION TO NITRIDE SEMICONDUCTOR BLUE LASERS AND LIGHT EMITTING DIODES, 2000, pp. 1-27
Authors:
Abraham, P
Piprek, J
DenBaars, SP
Bowers, JE
Citation: P. Abraham et al., Improvement of internal quantum efficiency in 1.55 mu m laser diodes with InGaP electron stopper layer, JPN J A P 1, 38(2B), 1999, pp. 1239-1242
Authors:
Chichibu, SF
Abare, AC
Mack, MP
Minsky, MS
Deguchi, T
Cohen, D
Kozodoy, P
Fleischer, SB
Keller, S
Speck, JS
Bowers, JE
Hu, E
Mishra, UK
Coldren, LA
DenBaars, SP
Wada, K
Sota, T
Nakamura, S
Citation: Sf. Chichibu et al., Optical properties of InGaN quantum wells, MAT SCI E B, 59(1-3), 1999, pp. 298-306
Authors:
Stephenson, GB
Eastman, JA
Auciello, O
Munkholm, A
Thompson, C
Fuoss, PH
Fini, P
DenBaars, SP
Speck, JS
Citation: Gb. Stephenson et al., Real-time X-ray scattering studies of surface structure during metalorganic: Chemical vapor deposition of GaN, MRS BULL, 24(1), 1999, pp. 21-25