Authors:
Rout, B
Kamila, J
Ghose, SK
Mahapatra, DP
Dev, BN
Citation: B. Rout et al., Characterization of microstructures formed on MeV ion-irradiated silver films on Si(111) surfaces, NUCL INST B, 181, 2001, pp. 268-273
Authors:
Ghose, SK
Goswami, DK
Rout, B
Dev, BN
Kuri, G
Materlik, G
Citation: Sk. Ghose et al., Ion-irradiation-induced mixing, interface broadening and period dilation in Pt/C multilayers, APPL PHYS L, 79(4), 2001, pp. 467-469
Authors:
Das, AK
Kamila, J
Dev, BN
Sundaravel, B
Kuri, G
Citation: Ak. Das et al., Response to "Comment on 'Self-assembled Ge nanostructures on polymer-coated silicon: Growth and characterization' " [Appl. Phys. Lett. 78, 3550 (2001)], APPL PHYS L, 78(22), 2001, pp. 3552-3553
Authors:
Dev, BN
Das, AK
Dev, S
Schubert, DW
Stamm, M
Materlik, G
Citation: Bn. Dev et al., Resonance enhancement of x rays in layered materials: Application to surface enrichment in polymer blends, PHYS REV B, 61(12), 2000, pp. 8462-8468
Authors:
Das, AK
Ghose, SK
Dev, BN
Kuri, G
Yang, TR
Citation: Ak. Das et al., Spontaneous nanostructural island formation and layer-to-island mass transport in Ge layers on Si(111) surfaces, APPL SURF S, 165(4), 2000, pp. 260-270
Citation: Bn. Dev, Aspects of surface and interface characterizations by X-rays: The researchprogramme at IOP, Bhubaneswar, CURRENT SCI, 78(12), 2000, pp. 1511-1514
Authors:
Das, AK
Kamila, J
Dev, BN
Sundaravel, B
Kuri, G
Citation: Ak. Das et al., Self-assembled Ge nanostructures on polymer-coated silicon: Growth and characterization, APPL PHYS L, 77(7), 2000, pp. 951-953
Citation: G. Kuri et al., High energy high dose Si implantation into Ge and the effect of subsequentthermal annealing, RADIAT EFF, 147(3), 1999, pp. 133-149
Authors:
Sundaravel, B
Das, AK
Ghose, SK
Sekar, K
Dev, BN
Citation: B. Sundaravel et al., Epitaxial growth of silver on Br-passivated Si(111) substrates under high vacuum, APPL SURF S, 137(1-4), 1999, pp. 11-19
Authors:
Sundaravel, B
Sekar, K
Kuri, G
Satyam, PV
Dev, BN
Bera, S
Narasimhan, SV
Chakraborty, P
Caccavale, F
Citation: B. Sundaravel et al., XPS and SIMS analysis of gold silicide grown on a bromine passivated Si(111) substrate, APPL SURF S, 137(1-4), 1999, pp. 103-112
Authors:
Ghose, SK
Kuri, G
Das, AK
Rout, B
Mahapatra, DP
Dev, BN
Citation: Sk. Ghose et al., Radiation damage and surface modification of GaAs(001) by MeV C+ and C-2(+) co-implantation with Ga2+, NUCL INST B, 156(1-4), 1999, pp. 125-129
Authors:
Sundaravel, B
Das, AK
Ghose, SK
Rout, B
Dev, BN
Citation: B. Sundaravel et al., Improvement of Ag(111) epitaxy on Si(111) by MeV Si+ irradiation and ion microbeam analysis of thermally induced morphology, NUCL INST B, 156(1-4), 1999, pp. 130-134
Citation: Bn. Dev, Materials modifications in heavy ion interactions with single crystals andtheir ion beam characterization, NUCL INST B, 156(1-4), 1999, pp. 258-264