Authors:
Claeys, W
Dilhaire, S
Jorez, S
Patino-Lopez, LD
Citation: W. Claeys et al., Laser probes for the thermal and thermomechanical characterisation of microelectronic devices, MICROELEC J, 32(10-11), 2001, pp. 891-898
Authors:
Dilhaire, S
Jorez, S
Cornet, A
Lopez, LDP
Claeys, W
Citation: S. Dilhaire et al., Measurement of the thermomechanical strain of electronic devices by shearography, MICROEL REL, 40(8-10), 2000, pp. 1509-1514
Authors:
Dilhaire, S
Altet, J
Jorez, S
Schaub, E
Rubio, A
Claeys, W
Citation: S. Dilhaire et al., Fault localisation in ICs by goniometric laser probing of thermal induced surface waves, MICROEL REL, 39(6-7), 1999, pp. 919-923
Authors:
Dilhaire, S
Jorez, S
Cornet, A
Schaub, E
Claeys, W
Citation: S. Dilhaire et al., Optical method for the measurement of the thermomechanical behaviour of electronic devices, MICROEL REL, 39(6-7), 1999, pp. 981-985
Authors:
Nassim, K
Joannes, L
Cornet, A
Dilhaire, S
Schaub, E
Claeys, W
Citation: K. Nassim et al., High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor, MICROELEC J, 30(11), 1999, pp. 1125-1128
Authors:
Quintard, V
Dilhaire, S
Phan, T
Claeys, W
Citation: V. Quintard et al., Temperature measurements of metal lines under current stress by high-resolution laser probing, IEEE INSTR, 48(1), 1999, pp. 69-74
Citation: W. Claeys et al., Development of instruments and very-high-resolution laser methodologies for characterization of electronic components, ANN PHYSIQ, 23, 1998, pp. 65-72