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Results:
1-10
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Results: 10
Authors:
Protopapa, ML
De Tomasi, F
Perrone, MR
Piegari, A
Masetti, E
Ristau, D
Quesnel, E
Duparre, A
Citation: Ml. Protopapa et al., Laser damage studies on MgF2 thin films, J VAC SCI A, 19(2), 2001, pp. 681-688
Authors:
Duparre, A
Kozhevnikov, I
Gliech, S
Steinert, J
Notni, G
Citation: A. Duparre et al., Surface characterization of optical components for the DUV, VUV and EUV, MICROEL ENG, 57-8, 2001, pp. 65-70
Authors:
Tikhonravov, AV
Trubetskov, MK
Krasilnikova, AV
Masetti, E
Duparre, A
Quesnel, E
Ristau, D
Citation: Av. Tikhonravov et al., Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry, THIN SOL FI, 397(1-2), 2001, pp. 229-237
Authors:
Ferre-Borrull, J
Duparre, A
Quesnel, E
Citation: J. Ferre-borrull et al., Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings, APPL OPTICS, 40(13), 2001, pp. 2190-2199
Authors:
Ferre-Borrull, J
Duparre, A
Quesnel, E
Citation: J. Ferre-borrull et al., Roughness and light scattering of ion-beam-sputtered fluoride coatings for193 nm, APPL OPTICS, 39(31), 2000, pp. 5854-5864
Authors:
Kadkhoda, P
Muller, A
Ristau, D
Duparre, A
Gliech, S
Lauth, H
Schuhmann, U
Reng, N
Tilsch, M
Schuhmann, R
Amra, C
Deumie, C
Jolie, C
Kessler, H
Lindstrom, T
Ribbing, CG
Bennett, JM
Citation: P. Kadkhoda et al., International round-robin experiment to test the International Organization for Standardization total-scattering draft standard, APPL OPTICS, 39(19), 2000, pp. 3321-3332
Authors:
Duparre, A
Notni, G
Recknagel, RJ
Feigl, T
Gliech, S
Citation: A. Duparre et al., High resolution topometry in conjunction with macro structures, TEC MES, 66(11), 1999, pp. 437-446
Authors:
Jakobs, S
Duparre, A
Huter, M
Pulker, HK
Citation: S. Jakobs et al., Surface roughness characterization of smooth optical films deposited by ion plating, THIN SOL FI, 351(1-2), 1999, pp. 141-145
Authors:
Asadchikov, VE
Duparre, A
Jakobs, S
Karabekov, AY
Kozhevnikov, IV
Krivonosov, YS
Citation: Ve. Asadchikov et al., Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy, APPL OPTICS, 38(4), 1999, pp. 684-691
Authors:
Niederwald, H
Laux, S
Kennedy, M
Schallenberg, U
Duparre, A
Mertin, M
Kaiser, N
Ristau, D
Citation: H. Niederwald et al., Ion-assisted deposition of oxide materials at room temperature by use of different ion sources, APPL OPTICS, 38(16), 1999, pp. 3610-3613
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